Professor Vihar Georgiev

  • Professor of Nanoelectronics (Electronic & Nanoscale Engineering)

telephone: +44 (0)0141 330 7659
email: Vihar.Georgiev@glasgow.ac.uk

Room 702, Level 7, Rankine Building, School of Engineering, G12 8LT

Import to contacts

ORCID iDhttps://orcid.org/0000-0001-6473-2508

Biography

I am a Professor of Nanoelectronics, the leader of DeepNano Group at University of Glasgow and an EPSRC UKRI Innovation Fellow. I am also a Visiting Professor at TU Vienna, Member of IET (MIET) and IEEE Senior Member (SMIEEE). From 2015 until January 2024 I was a co-Leader of the Device Modelling Group. DeepNano Group was founded on 1st of January 2024. My group is part of Glasgow Computational Engineering Centre (GCEC). The aim of the group is to continue the research in modeling and simulations areas of electronic devices by combining not only analytical and numerical approaches but also machine learning and artificial intelligence methods. The DeepNano Group research activities are focused on the modeling and simulation of nanoscale devices for advanced optoelectronics, biosensors and quantum applications. Our projects are in collaboration with leading experimental groups, such as IBM, STMicroelectronics, IMEC, Synopsys and Synopsys QuantumATK. Our group collaborates with academic groups not only in UK but also from USA, China, South Korea, India, Japan, Austria, Switzerland, Spain, France, Italy, Poland, Germany and Bulgaria. We are supporting open science practices and we are happy to collaborate with everyone interested in our work.

Videos

Idea Summit Video

 

Jumbo Radio Interview 

 

DeepNano Group Video

Track record

I have more than 10 years of experience of developing numerical solvers and machine learning methods that are used for modelling and simulations of various semiconductor devices, such as nanowire transistors, tunnelling FETs, molecular flash memories and bio-sensors not only on IV and III-V semiconductor but also molecules, carbon nanotubes and Josephson’s junctions. Until 2022, I participated in 12 European and UK projects in total. From 2018 until 2022 I had an EPSRC Industrial Fellowship called Quantum Simulator for Entangled Electronics (EP/S001131/1) and currently I am a co-PI of three more EPSRC projects (EP/T023244/1, EP/V032627/1 and EP/V048341/1). Moreover, I am a PI of two EU H2020 projects. The first one is a H2020-FetOPEN-2019 project called ElectroMed and the second one is a MSCA-ITN-2019 project called DESIGN-EID where I am also a project coordinator. Since my appointment as a Lecturer in 2015, I have secured funding of around £1.3M as a PI and around £5.0M as a co-PI. Apart from my academic achievements I was a Quantum Simulation and Business Development Adviser at Semiwise and VP Business Development and Quantum technology at Advanced Microelectronics Associates. At the moment I am a Chair of the Industry Advisory Board and Senior Adivisor of Study at School of Engineering. 

I am a member of the EPSRC College, member of the Royal Society grant committees and reviews proposals for the European Commission, the Czech Science Foundation (HRZZ), the Swiss National Science Foundation (SNSF), Science Foundation of Ireland, ETH, Israel Science Foundation and Bulgarian Academy of Science. I am a Senior Member of IEEE and a Fellow of Higher Education Academy (FHEA). I am an associate editor of the IET Electronic Letters journal (2018–), guest editor of the Journal of Computational Electronics (2022) and IEEE Access (2019). At University of Glasgow, I am Chair of Industry Advisory Board, Senior Adviser of Study, ENE representative at IT committee and from 2015-2022 I was PGR convener. 

I have contributed to research communities as a member of Technical Programme Committee (TPC) of the following conferences and workshops: TPC member SISPAD’25 (Grenoble, France); TPC member IWCN’25 (Utah, USA); TPC member EuroSOI-ULIS'25 (Warsaw, Poland); 2024: TPC member EuroSOI-ULIS'24 (Athens, Greece); 2023: DATE’23 (Antwerp, Belgium); TPC member SISPAD’23 (Kobe, Japan); 2022: 9th SiNANO Modelling and Simulation Summer School (Main Organiser and Program Chair, Glasgow, UK); Quantum Transport Methods and Algorithms: From Particle to Waves approaches (Co-Organiser and Program Chair, Zurich, Switzerland), E-MRS’22 Fall workshop “Group-IV semiconductor materials for nanoelectronics and cryogenic electronics” (Co-Organiser and Program Chair, Warsaw, Poland), Session chair DATE’22 (Antwerp, Belgium); 2021: NMDC’21 (Vancouver, Canada); IWCN’21 (online), DATE’21 (online), IEEE Nano 2020 (online); 2019: Session chair and TPC member IEDM’19 (San Francisco, USA), IEEE NMDC’19 (Nanjing, China), 2018: TPC member IEDM’18 (San Francisco, USA), IEEE NMDC’18 (Portland, USA). I have been an external examiner for multiple Ph.D. theses, including students at Imperial College London, University of Edinburgh, University of Lancaster, University of Granada and ETH Zürich.

POSITIONS

2023 –            Chair of Industrial Advisory Board at School of Engineering , University of Glasgow, UK

2022 –            Deputy Head of Electronics and Nanoscale Engineering (ENE) Division, University of Glasgow, UK

2022 –            Professor of Nanoelectronics, University of Glasgow, UK

2020 – 2024    Quantum Simulation and Business Development Adviser at SemiWise, UK

2019 – 2022    Senior Lecturer (Associate Professor), University of Glasgow, UK

2015 – 2019    Lecturer (Assistant Professor), University of Glasgow, UK

2012 – 2015    Postdoctoral Researcher, University of Glasgow, UK

EDUCATION

2017-19           Recognising Excellence in Teaching Fellowship, University of Glasgow, UK

2007-11           Ph.D. (DPhil) in Computational Chemistry, Linacre College, University of Oxford, UK

2005-06           MSc in Computational Chemistry, Sofia University, Bulgaria

2000-04           BSc in Chemistry, Sofia University, Bulgaria

 

Research interests

Research Interests

  • Transport in mesoscopic systems
  • Quantum chemistry
  • Molecular electronics and sensors
  • Transition-metal and organometallic chemistry
  • Material science 
  • Nano-bio sensor 
  • Machine learning and artificial intelligence

Expertise

  • Semiconductors
  • Semiconductor devices
  • Advanced CMOS technology, devices and design
  • Computational chemistry
  • Device modeling and Simulations
  • Material modeling 

Publications

Selected publications

Dam Vedel, Christian, Smidstrup, Søren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) First-principles investigation of polytypic defects in InP. Scientific Reports, 12, 19724. (doi: 10.1038/s41598-022-24239-w) (PMID:36385159) (PMCID:PMC9669039)

Lapham, Paul and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Computational study of oxide stoichiometry and variability in the Al/AlOx/Al tunnel junction. Nanotechnology, 33(26), 265201. (doi: 10.1088/1361-6528/ac5f2e) (PMID:35303731)

Dhar, Rakshita, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual Garcia, Cesar and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Assessing the effect of scaling high-aspect-ratio ISFET with physical model interface for nano-biosensing application. Solid-State Electronics, 195, 108374. (doi: 10.1016/j.sse.2022.108374)

Lapham, Paul, Vilà-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Influence of the contact geometry and counterions on the current flow and charge transfer in polyoxometalate molecular junctions: a density functional theory study. Journal of Physical Chemistry C, 125(6), pp. 3599-3610. (doi: 10.1021/acs.jpcc.0c11038) (PMID:33633816) (PMCID:PMC7899180)

Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Medina Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Badami, Oves, Adamu-Lema, Fikru, Thirunavukkarasu, Vasanthan, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Nano-electronic Simulation Software (NESS): a flexible nano-device simulation platform. Journal of Computational Electronics, 19, pp. 1031-1046. (doi: 10.1007/s10825-020-01519-0)

Carrillo-Nuñez, Hamilton, Medina-Bailón, Cristina, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Full-band quantum transport simulation in presence of hole-phonon interactions using a mode-space k·p approach. Nanotechnology, 32(2), 020001. (doi: 10.1088/1361-6528/abacf3) (PMID:32759487)

Carrillo-Nunez, Hamilton, Dimitrova, Nadezhda, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Machine learning approach for predicting the effect of statistical variability in Si junctionless nanowire transistors. IEEE Electron Device Letters, 40(9), pp. 1366-1369. (doi: 10.1109/LED.2019.2931839)

Carrillo-Nuñez, Hamilton, Mirza, Muhamad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2018) Impact of randomly distributed dopants on Ω-gate junctionless silicon nanowire transistors. IEEE Transactions on Electron Devices, 65(5), pp. 1692-1698. (doi: 10.1109/TED.2018.2817919)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 (2017) Experimental and simulation study of 1D silicon nanowire transistors using heavily doped channels. IEEE Transactions on Nanotechnology, 16(5), pp. 727-735. (doi: 10.1109/TNANO.2017.2665691)

Liang, J. et al. (2017) A Physics-based Investigation of Pt-salt Doped Carbon Nanotubes for Local Interconnects. In: 2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 02-06 Dec 2017, 35.5.1-35.5.4. ISBN 9781538635599 (doi: 10.1109/IEDM.2017.8268502)

Busche, C. et al. (2014) Design and fabrication of memory devices based on nanoscale polyoxometalate clusters. Nature, 515(7528), pp. 545-549. (doi: 10.1038/nature13951) (PMID:25409147)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, E.A. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Impact of precisely positioned dopants on the performance of an ultimate silicon nanowire transistor: a full three-dimensional NEGF simulation study. IEEE Transactions on Electron Devices, 60(3), pp. 965-971. (doi: 10.1109/TED.2013.2238944)

All publications

List by: Type | Date

Jump to: 2025 | 2024 | 2023 | 2022 | 2021 | 2020 | 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2004
Number of items: 172.

2025

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit, Kumar, Prateek, Ansari, Md. Hasan Raza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, Cesar Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Optimizing peptide detection using FET-based sensors: integrating non-linearities of surface functionalization. Solid-State Electronics, 229, 109161. (doi: 10.1016/j.sse.2025.109161)

Acharya, Pranav ORCID logoORCID: https://orcid.org/0000-0002-4701-5037 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Interface roughness in Resonant Tunnelling Diodes for physically unclonable functions. Solid-State Electronics, 228, 109131. (doi: 10.1016/j.sse.2025.109131)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ghosh, Ramesh ORCID logoORCID: https://orcid.org/0000-0001-9586-8061, JACOBS, JAKE, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Nanowire behavior under the influence of polyoxometalates: a comparative study of depletion and enhancement modes. Solid-State Electronics, 228, 109145. (doi: 10.1016/j.sse.2025.109145)

Patel, Jyoti, Satwik, Bathula, Bagga, Navjeet, Bais, Ishani, Arora, Chirag, Kumar, Vivek, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Dasgupta, S. (2025) Machine learning augmented TCAD assessment of corner radii in nanosheet FET. Solid-State Electronics, 227, 109114. (doi: 10.1016/j.sse.2025.109114)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ansari, Hasan Raaza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics. Solid-State Electronics, (doi: 10.1016/j.sse.2025.109159) (Early Online Publication)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Generative process variation modeling and analysis for advanced technology based on variational autoencoder. IEEE Transactions on Electron Devices, (Accepted for Publication)

Iadanza, S., Rihani, M., Martinez, C.O., Scherrer, M.A., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Schmid, H. and Moselund, K.E. (2025) Ultra-Low Temperature Characterization of Fully-Integrated III-V Photodetectors for Quantum Networks. In: 2024 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 07-11 December 2024, pp. 1-4. ISBN 9798350365436 (doi: 10.1109/iedm50854.2024.10873440)

2024

Acharya, Pranav ORCID logoORCID: https://orcid.org/0000-0002-4701-5037, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Sengupta, Amretashis ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Maciazek, Patryk, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Analysis of random discrete dopants embedded nanowire resonant tunnelling diodes for generation of physically unclonable functions. IEEE Transactions on Nanotechnology, (doi: 10.1109/TNANO.2024.3504963) (Early Online Publication)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733257)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Understanding the dynamic perturbative behaviour of Electrolyte-Gated FET Based Biosensors with Immobilised Nanoparticles. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733212)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Liu, Bo ORCID logoORCID: https://orcid.org/0000-0002-3093-4571 (2024) Machine learning-assisted device circuit co-optimization: A case study on inverter. IEEE Transactions on Electron Devices, 71(12), pp. 7256-7262. (doi: 10.1109/TED.2024.3476231)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Xeni, Nikolas, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2024) Predictive Simulation of Nanosheet Transistors including the Impact of Access Resistance. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 25-27 Sept 2024, (Accepted for Publication)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 5-8. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628880)

Jacobs, Jake, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Atomistic modeling of [W18O54(SeO3)2]4- polyoxometalates (POM) molecules in the presence of counter-cations. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 141-145. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628858)

Martinez-Oliver, Cristina, Scherrer, Markus, Iadanza, Simone, Schmid, Heinz, Moselund, Kirsten and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Simulation and fabrication of monolithic III-V photodetectors on Si: the role of growth facets and localization of heterojunctions. IEEE Transactions on Electron Devices, (doi: 10.1109/TED.2024.3437333) (Early Online Publication)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Gao, Yingjia, Macdonald, Craig ORCID logoORCID: https://orcid.org/0000-0003-3143-279X, García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Combinations of analytical and machine learning methods in a single simulation framework for amphoteric molecules detection. IEEE Sensors Letters, 8(7), 1501004. (doi: 10.1109/LSENS.2024.3408101)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Steep-subthreshold bilayer tunnel field effect transistor based efficient pH sensing: performance characterisation and optimization. IEEE Sensors Letters, (doi: 10.1109/LSENS.2024.3419581) (Early Online Publication)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Sensitivity and Reliability Assessment of a Strained Silicon Junctionless FinFET-based Hydrogen Gas Sensor. In: 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 08-10 May 2024, ISBN 9798350361292 (doi: 10.1109/laedc61552.2024.10555835)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam, El Maiss, Janwa, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and García, César Pascual (2024) Discovery of amphoteric fingerprints of amino acids with field-effect transistors. IEEE Access, (doi: 10.1109/ACCESS.2024.3411168) (Early Online Publication)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Low-voltage feedback field effect transistor based ion-sensing: a novel and detailed investigation for energy-efficient pH sensor. IEEE Sensors Letters, 8(6), 2000604. (doi: 10.1109/LSENS.2024.3403052)

Shashank, Mishra, Liu, Fengyuan, Shakthivel, Dhayalan, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Molecular dynamics simulation based study to analyse the properties of entrapped water between gold and graphene 2D interface. Nanoscale Advances, 6(9), pp. 2371-2379. (doi: 10.1039/D3NA00878A) (PMID:38694470) (PMCID:PMC11059550)

Shukla, R. P. et al. (2024) Rational design of a planar junctionless field-effect transistor for sensing biomolecular interactions. Proceedings, 97(1), 121. (doi: 10.3390/proceedings2024097121)

Brugnolotto, Enrico, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Sousa, Marilyne and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Machine learning inspired nanowire classification method based on nanowire array scanning electron microscope images. Open Research Europe, 4, 43. (doi: 10.12688/openreseurope.16696.1)

Mishra, Shashank ORCID logoORCID: https://orcid.org/0000-0002-0538-7174, Nair, Nitheesh M. ORCID logoORCID: https://orcid.org/0000-0003-2249-6863, Khandelwal, Gaurav ORCID logoORCID: https://orcid.org/0000-0002-7698-4494, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Capacitive-triboelectric based hybrid sensor system for human-like tactile perception. IEEE Sensors Letters, 8(2), 5500404. (doi: 10.1109/LSENS.2024.3351692)

2023

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Pascual García, César and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for Memory and Sensing Applications. In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), Paestum, Italy, 22-25 October 2023, pp. 617-620. ISBN 9798350335460 (doi: 10.1109/nmdc57951.2023.10343913)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual García, César, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Charge dynamics of amino acids fingerprints and the effect of density on FinFET-based electrolyte-gated sensor. Solid-State Electronics, 210, 108789. (doi: 10.1016/j.sse.2023.108789)

Gandhi, Navneet, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Kondekar, P. N., Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2023) Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. In: 2023 IEEE SENSORS, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10324885)

Mishra, Shashank ORCID logoORCID: https://orcid.org/0000-0002-0538-7174, John, Dina Anna, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Human-Inspired Stretch and Joint-Bend Sensing System Based on Flexible Sensors. In: IEEE Sensors 2023, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10325250)

Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Green’s Function Simulations. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 169-172. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319587)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Electrolyte-Gated FET-based Sensing of Immobilized Amphoteric Molecules Including the Variability in Affinity of the Reactive Sites. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 377-380. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319578)

Li, Weihao, Wolff, Niklas, Samuel, Arun Kumar, Wang, Yuanshen, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Kienle, Lorenz and Ganin, Alexey ORCID logoORCID: https://orcid.org/0000-0002-3754-5819 (2023) Unlocking high-performance supercapacitor behavior and sustained chemical stability of 2D metallic CrSe2 by optimal electrolyte selection. ChemElectroChem, 10(21), e202300428. (doi: 10.1002/celc.202300428)

Brugnolotto, Enrico, Schmid, Heinz, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne (2023) In-plane III-V nanowires on Si (1 1 0) with quantum wells by selective epitaxy in templates. Crystal Growth and Design, 23(11), pp. 8034-8042. (doi: 10.1021/acs.cgd.3c00806)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Novel Detection Methodology of Milk-Oligopeptides Fingerprints using Ion-Sensitive BioFET. In: 2023 IEEE BioSensors Conference (BioSensors), London, UK, 30 July - 1 August 2023, ISBN 9798350346046 (doi: 10.1109/BioSensors58001.2023.10281172)

Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Xeni, Nikolas, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Convolutional machine learning method for accelerating non-equilibrium Green’s function simulations in nanosheet transistor. IEEE Transactions on Electron Devices, 70(10), pp. 5448-5453. (doi: 10.1109/TED.2023.3306319)

Dam Vedel, Christian, Gunst, Tue, Smidstrup, Søren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Shockley-Read-Hall recombination and trap levels in In 0.53Ga 0.47As point defects from first principles. Physical Review B, 108, 094113. (doi: 10.1103/PhysRevB.108.094113)

Medina Bailon, Cristina, Nedjalkov, Mihail, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2023) Comprehensive mobility study of silicon nanowire transistors using multi-subband models. Nano Express, 4, 025005. (doi: 10.1088/2632-959X/acdb8a)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Pascual Garcia, Cesar and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) A novel computational framework for simulations of bio-field effect transistors. ECS Transactions, 111(1), pp. 249-260. (doi: 10.1149/11101.0249ecst)

Brugnolotto, Enrico, Scherrer, Markus, Schmid, Heinz, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne (2023) Growth of type I superlattice III-V heterostructure in horizontal nanowires enclosed in a silicon oxide template. Journal of Crystal Growth, 603, 127015. (doi: 10.1016/j.jcrysgro.2022.127015)

Dhar, Rakshita, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Garcia, Cesar Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Deriving a novel methodology for nano-BioFETs and analysing the effect of high-k oxides on the amino-acids sensing application. Solid-State Electronics, 200, 108525. (doi: 10.1016/j.sse.2022.108525)

Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2023) Hierarchical simulation of nanosheet field effect transistor: NESS flow. Solid-State Electronics, 199, 108489. (doi: 10.1016/j.sse.2022.108489)

2022

Dam Vedel, Christian, Smidstrup, Søren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) First-principles investigation of polytypic defects in InP. Scientific Reports, 12, 19724. (doi: 10.1038/s41598-022-24239-w) (PMID:36385159) (PMCID:PMC9669039)

Guan, Yunhe, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Liang, Feng and Chen, Haifeng (2022) Impact of the Figures of Merit (FoMs) definitions on the variability in nanowire TFET: NEGF simulation study. IEEE Transactions on Electron Devices, 69(11), pp. 6394-6399. (doi: 10.1109/TED.2022.3204596)

Lapham, Paul and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Theoretically probing the relationship between barrier length and resistance in Al/AlOx/Al tunnel junctions. Solid-State Electronics, 197, 108442. (doi: 10.1016/j.sse.2022.108442)

Dhar, Rakshita, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual Garcia, Cesar and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Assessing the effect of scaling high-aspect-ratio ISFET with physical model interface for nano-biosensing application. Solid-State Electronics, 195, 108374. (doi: 10.1016/j.sse.2022.108374)

Gauhar, Ghulam Ali, Chenchety, Abhishek, Yenugula, Hashish, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Badami, Oves (2022) Study of gate current in advanced MOS architectures. Solid-State Electronics, 194, 108345. (doi: 10.1016/j.sse.2022.108345)

Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Maciazek, Patryk, Sengupta, Amretashis ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Statistical device simulations of III-V nanowire resonant tunneling diodes as physical unclonable functions source. Solid-State Electronics, 194, 108339. (doi: 10.1016/j.sse.2022.108339)

Shukla, Rajendra P., Bomer, J. G., Wijnperle, Daniel, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Singh, Aruna Chandra, Krishnamoorthy, Sivashankar, García, César Pascual, Pud, Sergii and Olthuis, Wouter (2022) Planar junctionless field-effect transistor for detecting biomolecular interactions. Sensors, 22(15), 5783. (doi: 10.3390/s22155783)

Tok, Kean H., Mehedi, Mehzabeen, Zhang, Jian F., Brown, James, Ye, Zengliang, Ji, Zhigang, Zhang, Weidong, Marsland, John S., Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) An integral methodology for predicting long-term RTN. IEEE Transactions on Electron Devices, 69(7), pp. 3869-3875. (doi: 10.1109/TED.2022.3176585)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Discovery of Amino Acid fingerprints transducing their amphoteric signatures by field-effect transistors. ChemRxiv, (doi: 10.26434/chemrxiv-2022-bm062-v2)

Lapham, Paul and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Computational study of oxide stoichiometry and variability in the Al/AlOx/Al tunnel junction. Nanotechnology, 33(26), 265201. (doi: 10.1088/1361-6528/ac5f2e) (PMID:35303731)

Chen, R. et al. (2022) Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part I: CNFET transistor optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 432-439. (doi: 10.1109/TVLSI.2022.3146125)

Chen, R. et al. (2022) Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part II: CNT interconnect optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 440-448. (doi: 10.1109/TVLSI.2022.3146064)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Xeni, Nikolas, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2022) Density Gradient Based Quantum-Corrected 3D Drift-Diffusion Simulator for Nanoscale MOSFETs. In: 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), Vancouver, Canada, 12-15 Dec 2021, ISBN 9781665418928 (doi: 10.1109/NMDC50713.2021.9677480)

2021

Dhar, Rakshita Pritam Singh, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Medina-Bailon, Cristina, Garcia, Cesar Pascual and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) TCAD Simulations of High-Aspect-Ratio Nano-biosensor for Label-Free Sensing Application. In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455 (doi: 10.1109/EuroSOI-ULIS53016.2021.9560701)

Vedel, Christian Dam, Brugnolotto, Enrico, Smidstrup, Soren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Impact of Different Types of Planar Defects on Current Transport in Indium Phosphide (InP). In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455 (doi: 10.1109/EuroSOI-ULIS53016.2021.9560698)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) Stability and Vmin analysis of ferroelectric negative capacitance FinFET based SRAM in the presence of variability. Solid-State Electronics, 184, 108100. (doi: 10.1016/j.sse.2021.108100)

Martinez-Oliver, Cristina, Moselund, Kirsten E. and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Evaluation of Material Profiles for III-V Nanowire Photodetectors. In: 2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 13-17 Sep 2021, pp. 39-40. ISBN 9781665412766 (doi: 10.1109/NUSOD52207.2021.9541533)

Medina-Bailon, Cristina, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Todorova, Ilina, Lenoble, Damien, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Pascual García, César (2021) Comprehensive analytical modelling of an absolute pH sensor. Sensors, 21(15), 5190. (doi: 10.3390/s21155190)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) Simulation and modeling of novel electronic device architectures with NESS (Nano-Electronic Simulation Software): a modular nano TCAD simulation framework. Micromachines, 12(6), 680. (doi: 10.3390/mi12060680)

Medina-Bailon, Cristina, Padilla, José Luis, Sampedro, Carlos, Donetti, Luca, Gergiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) Self-consistent enhanced S/D tunneling implementation in a 2D MS-EMC nanodevice simulator. Micromachines, 12(6), 601. (doi: 10.3390/mi12060601)

Guan, Yunhe, Carrillo-Nuñez, Hamilton, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Liang, Feng, Li, Zunchao and Chen, Haifeng (2021) Quantum simulation investigation of work-function variation in nanowire tunnel FETs. Nanotechnology, 32(15), 150001. (doi: 10.1088/1361-6528/abd125) (PMID:33285530)

Lapham, Paul, Vilà-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Influence of the contact geometry and counterions on the current flow and charge transfer in polyoxometalate molecular junctions: a density functional theory study. Journal of Physical Chemistry C, 125(6), pp. 3599-3610. (doi: 10.1021/acs.jpcc.0c11038) (PMID:33633816) (PMCID:PMC7899180)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Xeni, Nikolas, Abourrig, Yassine, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) TCAD Simulation of Novel Semiconductor Devices. In: International Conference on ASIC (ASICON) 2021, Kunming, China, 26-29 October 2021, ISBN 9781665438674 (doi: 10.1109/ASICON52560.2021.9620465)

2020

Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Nano-electronic simulation software (NESS): a novel open-source TCAD simulation environment. Journal of Microelectronic Manufacturing, 3(4), 20030407. (doi: 10.33079/jomm.20030407)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Sengupta, A. ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Maciazek, P., Badami, O., Medina-Bailon, C., Dutta, T. ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Simulation of Gated GaAs-AlGaAs Resonant Tunneling Diodes for Tunable Terahertz Communication Applications. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 241-244. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241677)

Lapham, P., Badami, Ov., Medina-Bailon, C., Adamu-Lema, F., Dutta, T. ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Nagy, D. ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) A Combined First Principles and Kinetic Monte Carlo study of Polyoxometalate based Molecular Memory Devices. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 273-276. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241606)

McGhee, Joseph and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2020) First Principle Simulations of Electronic and Optical Properties of a Hydrogen Terminated Diamond Doped by a Molybdenum Oxide Molecule. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 31-34. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241630)

Medina Bailon, Cristina, Badami, Oves, Carrillo-Nunez, Hamilton, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS). In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 293-296. ISBN 9781728173542 (doi: 10.23919/SISPAD49475.2020.9241594)

McGhee, Joseph and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2020) Electronic and Optical Properties of Hydrogen-Terminated Diamond Doped by Molybdenum Oxide: A Density Functional Theory Study. In: 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), Turin, Italy, 14-18 Sep 2020, ISBN 9781728160863 (doi: 10.1109/NUSOD49422.2020.9217662)

Xeni, Nikolas, Ghannam, Rami ORCID logoORCID: https://orcid.org/0000-0001-6910-9280, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Badami, Oves and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) The Use of TCAD Simulations in Semiconductor Devices Teaching. Transnational Engineering Education Using Technology Workshop (TREET 2020), Glasgow, UK, 31 Jul 2020. ISBN 9781728188515 (doi: 10.1109/TREET50959.2020.9189752)

Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Medina Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Badami, Oves, Adamu-Lema, Fikru, Thirunavukkarasu, Vasanthan, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Nano-electronic Simulation Software (NESS): a flexible nano-device simulation platform. Journal of Computational Electronics, 19, pp. 1031-1046. (doi: 10.1007/s10825-020-01519-0)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Vmin Prediction for Negative Capacitance MOSFET based SRAM. In: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 01-30 Sep 2020, ISBN 9781728187655 (doi: 10.1109/EUROSOI-ULIS49407.2020.9365282)

Badami, Oves, Sadi, Toufik, Adamu-Lema, Fikru, Lapham, Paul, Mu, Dejiang, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Ding, Jie and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) A Kinetic Monte Carlo study of retention time in a POM molecule-based flash memory. IEEE Transactions on Nanotechnology, 19, pp. 704-710. (doi: 10.1109/TNANO.2020.3016182)

Carrillo-Nuñez, Hamilton, Medina-Bailón, Cristina, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Full-band quantum transport simulation in presence of hole-phonon interactions using a mode-space k·p approach. Nanotechnology, 32(2), 020001. (doi: 10.1088/1361-6528/abacf3) (PMID:32759487)

Adamu-Lema, F., Monzio Compagnoni, C., Badami, O., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: a simulation study. In: Grasser, Tibor (ed.) Noise in Nanoscale Semiconductor Devices. Springer: Cham, pp. 441-466. ISBN 9783030374990 (doi: 10.1007/978-3-030-37500-3_13)

McGhee, Joseph and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2020) Simulation study of surface transfer doping of hydrogenated diamond by MoO₃ and V₂O₅ metal oxides. Micromachines, 11(4), 433. (doi: 10.3390/mi11040433)

Medina-Bailon, Christina, Carrillo-Nunez, Hamilton, Lee, Jaehyun, Sampedro, Carlos, Padilla, Jose Luis, Donetti, Luca, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Quantum enhancement of a S/D tunneling model in a 2D MS-EMC nanodevice simulator: NEGF comparison and impact of effective mass variation. Micromachines, 11(2), 204. (doi: 10.3390/mi11020204)

2019

Xeni, Nikolas, Ghannam, Rami ORCID logoORCID: https://orcid.org/0000-0001-6910-9280, Udama, Fikru, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Semiconductor Device Visualization using TCAD Software: Case Study for Biomedical Applications. IEEE UKCAS 2019, London, UK, 06 Dec 2019. (Accepted for Publication)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Ding, Jie and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Physical Insights into the Transport Properties of RRAMs Based on Transition Metal Oxides. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870391)

Thirunavukkarasu, V. et al. (2019) Efficient Coupled-mode space based Non-Equilibrium Green’s Function Approach for Modeling Quantum Transport and Variability in Vertically Stacked SiNW FETs. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870400)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Klüpfel, Sylvain, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Scaling-aware TCAD Parameter Extraction Methodology for Mobility Prediction in Tri-gate Nanowire Transistors. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870556)

Medina-Bailon, Cristina, Sadi, Toufik, Nedjalkov, Mihail, Carrillo-Nuñez, Hamilton, Lee, Jaehyun, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Mobility of circular and elliptical si nanowire transistors using a multi-subband 1d formalism. IEEE Electron Device Letters, 40(10), pp. 1571-1574. (doi: 10.1109/LED.2019.2934349)

Carrillo-Nunez, Hamilton, Dimitrova, Nadezhda, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Machine learning approach for predicting the effect of statistical variability in Si junctionless nanowire transistors. IEEE Electron Device Letters, 40(9), pp. 1366-1369. (doi: 10.1109/LED.2019.2931839)

Guan, Yunhe, Li, Zunchao, Carrillo-Nunez, Hamilton, Zhang, Yefei, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Liang, Feng (2019) An accurate analytical model for tunnel FET output characteristics. IEEE Electron Device Letters, 40(6), pp. 1001-1004. (doi: 10.1109/LED.2019.2914014)

Badami, Oves, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Lee, Jaeyhun, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Comprehensive study of cross-section dependent effective masses for silicon based gate-all-around transistors. Applied Sciences, 9(9), 1895. (doi: 10.3390/app9091895)

Liang, J. et al. (2019) Investigation of Pt-salt-doped-standalone-multiwall carbon nanotubes for on-chip interconnect applications. IEEE Transactions on Electron Devices, 66(5), pp. 2346-2352. (doi: 10.1109/TED.2019.2901658)

Medina Bailon, Cristina, Padilla, Jose L., Sadi, Toufik, Sampedro, Carlos, Godoy, Andres, Donetti, Luca, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Multisubband ensemble Monte Carlo analysis of tunneling leakage mechanisms in ultrascaled FDSOI, DGSOI, and FinFET devices. IEEE Transactions on Electron Devices, 66(3), pp. 1145-1152. (doi: 10.1109/TED.2019.2890985)

Sadi, Toufik, Medina Bailon, Cristina, Nedjalkov, Mihail, Lee, Jaehyun, Badami, Oves, Berrada, Salim, Carrillo-Nunez, Hamilton, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Simulation of the impact of ionized impurity scattering on the total mobility in Si nanowire transistors. Materials, 12(1), 124. (doi: 10.3390/ma12010124)

Duan, M. ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Navarro, C., Cheng, B., Adamu-Lema, F., Wang, X., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F., Millar, C. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Thorough understanding of retention time of Z2FET memory operation. IEEE Transactions on Electron Devices, 66(1), pp. 383-388. (doi: 10.1109/TED.2018.2877977)

Carrillo-Nunez, Hamilton, Wang, Chen, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Young, Robert and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Simulation of Si Nanowire Quantum-Dot Devices for Authentication. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041864)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Carrillo-Nunez, Hamilton, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Schrödinger Equation Based Quantum Corrections in Drift-Diffusion: A Multiscale Approach. In: 2019 IEEE 14th Nanotechnology Materials and Devices Conference (NMDC), Stockholm, Sweden, 27-30 Oct 2019, ISBN 9781728126371 (doi: 10.1109/NMDC47361.2019.9084010)

Lee, Jaehyun, Lamarche, Michel and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) The First-Priniple Simulation Study on the Specific Grain Boundary Resistivity in Copper Interconnects. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169 (doi: 10.1109/NMDC.2018.8605907)

Lee, Jaehyun, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Sadi, Toufik, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Nedjalkov, Mihail and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) A Multi-Scale Simulation Study of the Strained Si Nanowire FETs. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169 (doi: 10.1109/NMDC.2018.8605884)

Mathew, Paven Thomas, Fang, Fengzhou, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Lee ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) First Principle Simulations of Current Flow in Inorganic Molecules: Polyoxometalates (POMs). In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041869)

McGhee, Joseph, Moran, David A. ORCID logoORCID: https://orcid.org/0000-0003-4085-7650 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Simulations of Surface Transfer Doping of Hydrogenated Diamond by MoO3 Metal Oxide. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041887)

Medina Bailon, Cristina, Sadi, Toufik, Sampedro, Carlos, Padilla, Jose Luis, Donetti, Luca, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator. In: Nikolov, Geno, Kolkovska, Natalia and Georgiev, Krassimir (eds.) Numerical Methods and Applications. Series: Lecture Notes in Computer Science, 11189 (11189). Springer, pp. 273-280. ISBN 9783030106911 (doi: 10.1007/978-3-030-10692-8_30)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. In: 12th International Conference on Large-Scale Scientific Computing, LSSC 2019, Sozopol, Bulgaria, 10-14 June 2019, pp. 429-437. (doi: 10.1007/978-3-030-41032-2_49)

2018

Lee, Jaehyun, Badami, Oves, Carrillo-Nunez, Hamilton, Berrada, Salim, Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Variability predictions for the next technology generations of n-type SixGe1-x nanowire MOSFETs. Micromachines, 9(12), 643. (doi: 10.3390/mi9120643)

Berrada, Salim, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Carrillo-Nunez, Hamilton, Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, Fikru, Lee, Jaehyun, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Medina Bailon, Cristina and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) NESS: new flexible Nano-Electronic Simulation Software. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 22-25. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551701)

Berrada, Salim, Lee, Jaehyun, Carrillo-Nunez, Hamilton, Medina Bailon, Cristina, Adamu-Lema, Fikru, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Quantum Transport Investigation of Threshold Voltage Variability in Sub-10 nm JunctionlessSi Nanowire FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 244-247. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551638)

Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Cheng, Binjie, Adamu-Lema, Fikru, Asenov, P., Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Wang, Xingsheng, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Millar, C., Pfaeffli, P. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Statistical Variability Simulation of Novel Capacitor-less Z2FET DRAM: From Transistor Circuit. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 258-261. ISBN 9781538667903 (doi: 10.1109/SISPAD.2018.8551710)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Interplay of RDF and Gate LER Induced Statistical Variability in Negative Capacitance FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 262-265. ISBN 9781538667903 (doi: 10.1109/SISPAD.2018.8551710)

Medina Bailon, Cristina, Sadi, Toufik, Nedjalkov, Mihail, Lee, Jaehyun, Berrada, Salim, Carrillo-Nunez, Hamilton, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Impact of the Effective Mass on the Mobility in Si Nanowire Transistors. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 297-300. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551630)

Medina Bailon, Cristina, Sampedro, Carlos, Padilla, Jose Luis, Godoy, Andres, Donetti, Luca, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen (2018) Impact of Strain on S/D tunneling in FinFETs: a MS-EMC study. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 301-304. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551707)

Chen, R. et al. (2018) Variability study of MWCNT local interconnects considering defects and contact resistances - Part I: pristine MWCNT. IEEE Transactions on Electron Devices, 65(11), pp. 4955-4962. (doi: 10.1109/TED.2018.2868421)

Chen, R. et al. (2018) Variability study of MWCNT local interconnects considering defects and contact resistances - Part II: impact of charge transfer doping. IEEE Transactions on Electron Devices, 65(11), pp. 4963-4970. (doi: 10.1109/TED.2018.2868424)

Liang, Jie, Lee, Jaehyun, Berrada, Salim, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Pandey, Reetu Raj, Chen, Rongmei, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Todri-Sanial, Aida (2018) Atomistic to circuit-level modeling of doped SWCNT for on-chip interconnects. IEEE Transactions on Nanotechnology, 17(6), pp. 1084-1088. (doi: 10.1109/TNANO.2018.2802320)

Carrillo-Nunez, Hamilton, Lee, Jaehyun, Berrada, Salim, Medina-Bailon, Cristina, Adamu-Lema, Fikru, Luisier, Mathieu, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2018) Random dopant-induced variability in Si-InAs nanowire tunnel FETs: a quantum transport simulation study. IEEE Electron Device Letters, 39(9), pp. 1473-1476. (doi: 10.1109/LED.2018.2859586)

Lee, J. et al. (2018) Understanding electromigration in Cu-CNT composite interconnects: a multiscale electrothermal simulation study. IEEE Transactions on Electron Devices, 65(9), pp. 3884-3892. (doi: 10.1109/TED.2018.2853550)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2018) Development of Hierarchical Simulation Framework for Design and Optimization of Molecular Based Flash Cell. In: 2018 76th Device Research Conference (DRC), Santa Barbara, CA, USA, 24-27 Jun 2018, ISBN 9781538630280 (doi: 10.1109/DRC.2018.8442234)

Uhlig, B. et al. (2018) Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects. In: 2018 IEEE International Interconnect Technology Conference (IITC), Santa Clara, CA, USA, 4-7 Jun 2018, pp. 16-18. ISBN 9781538643372 (doi: 10.1109/IITC.2018.8430411)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Random Discrete Dopant Induced Variability in Negative Capacitance Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117 (doi: 10.1109/ULIS.2018.8354732)

Medina Bailon, C., Sadi, T., Nedjalkov, M., Lee, J., Berrada, S., Carrillo-Nunez, H., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, S. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117 (doi: 10.1109/ULIS.2018.8354723)

Carrillo-Nuñez, Hamilton, Mirza, Muhamad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2018) Impact of randomly distributed dopants on Ω-gate junctionless silicon nanowire transistors. IEEE Transactions on Electron Devices, 65(5), pp. 1692-1698. (doi: 10.1109/TED.2018.2817919)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Dochioiu, Alexandru-Iusti, Adamu-Lema, Fikru, Berrada, Salim, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Variability Study of High Current Junctionless Silicon Nanowire Transistors. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350514)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Molecular Based Flash Cell for Low Power Flash Application: Optimization and Variability Evaluation. In: IEEE 12th Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 64-65. ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350505)

Uhlig, B. et al. (2018) Progress on Carbon Nanotube BEOL Interconnects. In: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), Dresden, Germany, 19-23 Mar 2018, pp. 937-942. ISBN 9783981926309 (doi: 10.23919/DATE.2018.8342144)

Liang, J., Lee, J., Berrada, S., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Azemard-Crestani, A. and Todri-Sanial, A. (2018) Atomistic to Circuit Level Modeling of Defective Doped SWCNTs with Contacts for On-Chip Interconnect Application. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 66-67. ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350506)

2017

Thirunavukkarasu, V. et al. (2017) Investigation of inversion, accumulation and junctionless mode bulk Germanium FinFETs. Superlattices and Microstructures, 111, pp. 649-655. (doi: 10.1016/j.spmi.2017.07.020)

Adamu-Lema, Fikru, Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Navarro, Carlos, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Cheng, Binjie, Wang, Xingsheng, Millar, Campbell, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Simulation Based DC and Dynamic Behaviour Characterization of Z2FET. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 317-320. (doi: 10.23919/SISPAD.2017.8085328)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Does a Nanowire Transistor Follow the Golden Ratio? A 2D Poisson-Schrödinger/3D Monte Carlo Simulation Study. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017, (doi: 10.23919/SISPAD.2017.8085263)

Duan, M. ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, F., Cheng, B., Navarro, C., Wang, X., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F., Millar, C. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) 2D-TCAD Simulation on Retention Time of Z2FET for DRAM Application. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 325-328. (doi: 10.23919/SISPAD.2017.8085330)

Lee, J. et al. (2017) The Impact of Vacancy Defects on CNT Interconnects: From Statistical Atomistic Study to Circuit Simulations. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 157-160. (doi: 10.23919/SISPAD.2017.8085288)

Lee, J. et al. (2017) Atoms-to-Circuits Simulation Investigation of CNT Interconnects for Next Generation CMOS Technology. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 153-156. (doi: 10.23919/SISPAD.2017.8085287)

Wang, Xingsheng, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Gerrer, Louis, Amoroso, Salvatore M. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) TCAD-based design technology co-optimization for variability in nanoscale SOI FinFETs. In: Deleonibus, Simon (ed.) Integrated Nanodevice and Nanosystem Fabrication. Series: Pan Stanford series on intelligent nanosystems. Pan Stanford: Singapore, pp. 215-252. ISBN 9789814774222

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Simulation study of vertically stacked lateral Si nanowires transistors for 5 nm CMOS applications. IEEE Journal of the Electron Devices Society, 5(6), pp. 466-472. (doi: 10.1109/JEDS.2017.2752465)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 (2017) Experimental and simulation study of 1D silicon nanowire transistors using heavily doped channels. IEEE Transactions on Nanotechnology, 16(5), pp. 727-735. (doi: 10.1109/TNANO.2017.2665691)

Berrada, Salim, Lee, Jaehyun, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Effect of the Quantum Mechanical Tunneling on the Leakage Current in Ultra-scaled Si Nanowire Transistors. 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017.

Medina-Bailon, C., Sadi, T., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Assessment of Gate Leakage Mechanism Utilizing Multi-Subband Ensemble Monte Carlo. In: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Athens, Greece, 03-05 Apr 2017, pp. 144-147. ISBN 9781509053148 (doi: 10.1109/ULIS.2017.7962585)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Sadi, Toufik, Wang, Yijiao, Adamu-Lema, Fikru, Wang, Xingsheng, Amoroso, Salvatore M., Towie, Ewan, Brown, Andrew and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Impact of quantum confinement on transport and the electrostatic driven performance of silicon nanowire transistors at the scaling limit. Solid-State Electronics, 129, pp. 73-80. (doi: 10.1016/j.sse.2016.12.015)

Lee, Jaehyun, Sadi, Toufik, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Todri-Sanial, Aida and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) A Hierarchical Model for CNT and Cu-CNT Composite Interconnects: From Density Functional Theory to Circuit-Level Simulations. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017. (Unpublished)

Adamu-Lema, Fikru, Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Berrada, Salim, Lee, Jaehyun, Al-Ameri, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Modelling and simulation of advanced semiconductor devices. ECS Transactions, 80(4), pp. 33-42. (doi: 10.1149/08004.0033ecst)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Position-Dependent Performance in 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Variability-Aware Simulations of 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Liang, J. et al. (2017) A Physics-based Investigation of Pt-salt Doped Carbon Nanotubes for Local Interconnects. In: 2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 02-06 Dec 2017, 35.5.1-35.5.4. ISBN 9781538635599 (doi: 10.1109/IEDM.2017.8268502)

Medina-Bailon, C., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Gamiz, F., Sadi, T., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Multi-subband Ensemble Monte Carlo Study of Tunneling Leakage mechanisms. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017, pp. 281-284. ISBN 9784863486102 (doi: 10.23919/SISPAD.2017.8085319)

Todri-Sanial, A. et al. (2017) A survey of carbon nanotube interconnects for energy efficient integrated circuits. IEEE Circuits and Systems Magazine, 17(2), pp. 47-62. (doi: 10.1109/MCAS.2017.2689538)

2016

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Lema, Adamu, Sadi, T., Towie, E., Riddet, C., Alexander, C. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Performance of Vertically Stacked Horizontal Si Nanowires Transistors: A 3D Monte Carlo / 2D Poisson Schrodinger Simulation Study. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521 (doi: 10.1109/NMDC.2016.7777117)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 (2016) Experimental and Simulation Study of a High Current 1D Silicon Nanowire Transistor Using Heavily Doped Channels. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521 (doi: 10.1109/NMDC.2016.7777084)

Sadi, Toufik, Towie, Ewan, Nedjalkov, Mihail, Riddet, Craig, Alexander, Craig, Wang, Liping, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Brown, Andrew, Millar, Campbell and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) One-Dimensional Multi-Subband Monte Carlo Simulation of Charge Transport in Si Nanowire Transistors. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 23-26. ISBN 9781509008186 (doi: 10.1109/SISPAD.2016.7605139)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Lema, Fikru-Adama, Sadi, Toufik, Wang, Xingsheng, Towie, Ewan, Riddet, Craig, Alexander, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Impact of Strain on the Performance of Si Nanowires Transistors at the Scaling Limit: A 3D Monte Carlo/2D Poisson Schrodinger Simulation Study. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 213-216. ISBN 9781509008186 (doi: 10.1109/SISPAD.2016.7605185)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Influence of Quantum Confinement Effects and Device Electrostatic Driven Performance in Ultra-Scaled SixGe1-x Nanowire Transistors. In: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016), Vienna, Austria, 25-27 Jan 2016, pp. 234-237. ISBN 9781467386104 (doi: 10.1109/ULIS.2016.7440096)

Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Wang, Y., Cheng, B., Wang, X., Asenov, P., Al-Ameri, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449 and Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2016) Nanowire Transistor Solutions for 5NM and Beyond. In: 2016 17th International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA, 15-16 Mar 2016, pp. 269-274. (doi: 10.1109/ISQED.2016.7479212)

2015

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Ali, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Wang, Y., Gerrer, L., Amoroso, S.M. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Influence of Quantum Confinement Effects over Device Performance in Circular and Elliptical Silicon Nanowire Transistors. In: 2015 International Workshop on Computational Electronics (IWCE), West Lafayette, IN, USA, 2-4 Sept 2015, (doi: 10.1109/IWCE.2015.7301960)

Donetti, Luca, Sampedro, Carlos, Gamiz, Francisco, Godoy, Andres, Garcıa-Ruız, Francisco J., Towie, Ewan, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore Maria, Riddet, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Multi-Subband Ensemble Monte Carlo Simulation of Si Nanowire MOSFETs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 353-356. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292332)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore M., Gerrer, Louis, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Interplay between quantum mechanical effects and a discrete trap position in ultrascaled FinFETs. In: SISPAD 2015: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 246-249. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292305)

Kivisaari, Pyry, Sadi, Toufik, Li, Jingrui, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Oksanen, Jani, Rinke, Patrick and Tulkki, Jukka (2015) Bipolar Monte Carlo Simulation of Hot Carriers In III-N LEDs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 393-396. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292342)

Wang, Y. et al. (2015) Simulation study of the impact of quantum confinement on the electrostatically driven oerformance of n-type nanowire transistors. IEEE Transactions on Electron Devices, 62(10), pp. 3229-3236. (doi: 10.1109/TED.2015.2470235)

Gerrer, L., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, S.M., Towie, E. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Comparison of Si <100> and <110> crystal orientation nanowire transistor reliability using Poisson–Schrödinger and classical simulations. Microelectronics Reliability, 55(9-10), pp. 1307-1312. (doi: 10.1016/j.microrel.2015.06.094)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore Maria, Ali, Talib Mahmood, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Christoph ORCID logoORCID: https://orcid.org/0000-0002-3493-2020, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Comparison between bulk and FDSOI POM flash cell: a multiscale simulation study. IEEE Transactions on Electron Devices, 62(2), pp. 680-684. (doi: 10.1109/TED.2014.2378378)

Al-Ameri, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Wang, Y., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F., Wang, X. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Correlation between Gate Length, Geometry and Electrostatic Driven Performance in Ultra-Scaled Silicon Nanowire Transistors. In: 10th IEEE Nanotechnology Materials and Devices Conference (NMDC), Anchorage, AK, USA, 13-16 Sep 2015, pp. 30-34. ISBN 9781467393621 (doi: 10.1109/NMDC.2015.7439240)

Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Multi-scale computational framework for evaluating of the performance of molecular based flash cells. Lecture Notes in Computer Science, 8962, pp. 196-203. (doi: 10.1007/978-3-319-15585-2_22)

Sadi, Toufik, Wang, Liping, Gerrer, Louis, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Self-consistent physical modeling of SiOx-based RRAM structures. In: International Workshop on Computational Electronics (IWCE), West Lafayette, IN, USA, 2-4 Sep 2015, pp. 1-4. ISBN 978069251523515 (doi: 10.1109/IWCE.2015.7301981)

2014

Amoroso, Salvatore Maria, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gerrer, Louis, Towie, Ewan, Wang, Xingsheng, Riddet, Craig, Brown, Andrew Robert and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) Inverse scaling trends for charge-trapping-induced degradation of FinFETs performance. IEEE Transactions on Electron Devices, 61(12), pp. 4014-4018. (doi: 10.1109/TED.2014.2363212)

Busche, C. et al. (2014) Design and fabrication of memory devices based on nanoscale polyoxometalate clusters. Nature, 515(7528), pp. 545-549. (doi: 10.1038/nature13951) (PMID:25409147)

Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) 3D Multi-Subband Ensemble Monte Carlo Simulator of FinFETs and nanowire transistors. In: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan, 9-11 Sep 2014,

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Markov, Stanislav, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Christoph ORCID logoORCID: https://orcid.org/0000-0002-3493-2020, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) Optimization and evaluation of variability in the programming window of a flash cell with molecular metal-oxide storage. IEEE Transactions on Electron Devices, 61(6), pp. 2019-2026. (doi: 10.1109/TED.2014.2315520)

Amoroso, Salvatore, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, Ewan, Riddet, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) Metamorphosis of a nanowire: a 3-D coupled mode space NEGF study. In: 2014 International Workshop on Computational Electronics (IWCE), Paris, France, 3-6 June 2014, pp. 1-4. (doi: 10.1109/IWCE.2014.6865854)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore M., Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Christoph ORCID logoORCID: https://orcid.org/0000-0002-3493-2020, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) FDSOI Molecular Flash Cell with Reduced Variability for Low Power Flash Applications. In: 44th European Solid-State Device Research Conference (ESSDERC), Venice, Italy, 22-26 Sep 2014, pp. 353-356. ISBN 9781479943760 (doi: 10.1109/ESSDERC.2014.6948833)

2013

Vilà-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Mitchell, Scott G., Markov, Stanislav, Busche, Christoph ORCID logoORCID: https://orcid.org/0000-0002-3493-2020, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 (2013) Towards polyoxometalate-cluster-based nano-electronics. Chemistry: A European Journal, 19(49), pp. 16502-16511. (doi: 10.1002/chem.201301631)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, E.A. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Impact of precisely positioned dopants on the performance of an ultimate silicon nanowire transistor: a full three-dimensional NEGF simulation study. IEEE Transactions on Electron Devices, 60(3), pp. 965-971. (doi: 10.1109/TED.2013.2238944)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Mohan, P.J., DeBrincat, D. and McGrady, J.E. (2013) Low-symmetry distortions in Extended Metal Atom Chains (EMACs): Origins and consequences for electron transport. Coordination Chemistry Reviews, 257(1), pp. 290-298. (doi: 10.1016/j.ccr.2012.05.025)

Georgiev, V. P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Markov, S., Vilà-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Cronin, L. ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 (2013) Molecular-Metal-Oxide-nanoelectronicS (M-MOS): Achieving the Molecular Limit. In: 16th International Workshop on Computational Electronics, Nara, Japan, 4-7 June 2013, ISBN 9783901578267

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Markov, Stanislav, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Cristoph, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage. In: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC), Bucharest, Romania, 16-20 Sep 2013, pp. 230-233. (doi: 10.1109/ESSDERC.2013.6818861)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, Ewan A. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Interaction Between Precisely Placed Dopants and Interface Roughness in Silicon Nanowire Transistors: Full 3-D NEGF Simulation Study. In: 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2013), Glasgow, Scotland, 3-5 Sep 2013, pp. 416-419. ISBN 9781467357333 (doi: 10.1109/SISPAD.2013.6650663)

2012

Mohan, P.J., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and McGrady, J.E. (2012) Periodic trends in electron transport through extended metal atom chains: comparison of Ru3(dpa)4(NCS)2 with its first-row analogues. Chemical Science, 3(4), pp. 1319-1329. (doi: 10.1039/C2SC01024K)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Sameera, W.M.C. and McGrady, J.E. (2012) Attenuation of conductance in cobalt extended metal atom chains. Journal of Physical Chemistry C, 116(38), pp. 20163-20172. (doi: 10.1021/jp304807w)

Mistry, V.S., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and McGrady, J.E. (2012) Electron transport through molecular wires based on a face-shared bioctahedral motif. Comptes Rendus Chimie, 15(2-3), pp. 176-183. (doi: 10.1016/j.crci.2011.11.001)

2011

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and McGrady, J.E. (2011) The influence of low-symmetry distortions on electron transport through metal atom chains: when is a molecular wire really broken? Journal of the American Chemical Society, 133(32), pp. 12590-12599. (doi: 10.1021/ja2028475)

2010

Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and McGrady, J.E. (2010) Efficient spin filtering through cobalt-based extended metal atom chains. Inorganic Chemistry, 49(12), (doi: 10.1021/ic100493t)

Velinova, M., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Todorova, T., Madjarova, G., Ivanova, A. and Tadjer, A. (2010) Boron–nitrogen- and boron-substituted anthracenes and -phenanthrenes as models for doped carbon-based materials. Journal of Molecular Structure: THEOCHEM, 955(1-3), pp. 97-108. (doi: 10.1016/j.theochem.2010.06.003)

2004

Dietz, F., Müllen, K., Baumgarten, M., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Tyutyulkov, N. (2004) Structure and properties of non-classical polymers. XIV. Heteronuclear 1-D polymers with 2-azaphenalenyl radicals. Chemical Physics Letters, 389(1-3), pp. 135-139. (doi: 10.1016/j.cplett.2004.03.058)

This list was generated on Sun Jun 15 09:07:03 2025 BST.
Number of items: 172.

Articles

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit, Kumar, Prateek, Ansari, Md. Hasan Raza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, Cesar Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Optimizing peptide detection using FET-based sensors: integrating non-linearities of surface functionalization. Solid-State Electronics, 229, 109161. (doi: 10.1016/j.sse.2025.109161)

Acharya, Pranav ORCID logoORCID: https://orcid.org/0000-0002-4701-5037 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Interface roughness in Resonant Tunnelling Diodes for physically unclonable functions. Solid-State Electronics, 228, 109131. (doi: 10.1016/j.sse.2025.109131)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ghosh, Ramesh ORCID logoORCID: https://orcid.org/0000-0001-9586-8061, JACOBS, JAKE, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Nanowire behavior under the influence of polyoxometalates: a comparative study of depletion and enhancement modes. Solid-State Electronics, 228, 109145. (doi: 10.1016/j.sse.2025.109145)

Patel, Jyoti, Satwik, Bathula, Bagga, Navjeet, Bais, Ishani, Arora, Chirag, Kumar, Vivek, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Dasgupta, S. (2025) Machine learning augmented TCAD assessment of corner radii in nanosheet FET. Solid-State Electronics, 227, 109114. (doi: 10.1016/j.sse.2025.109114)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ansari, Hasan Raaza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics. Solid-State Electronics, (doi: 10.1016/j.sse.2025.109159) (Early Online Publication)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Generative process variation modeling and analysis for advanced technology based on variational autoencoder. IEEE Transactions on Electron Devices, (Accepted for Publication)

Acharya, Pranav ORCID logoORCID: https://orcid.org/0000-0002-4701-5037, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Sengupta, Amretashis ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Maciazek, Patryk, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Analysis of random discrete dopants embedded nanowire resonant tunnelling diodes for generation of physically unclonable functions. IEEE Transactions on Nanotechnology, (doi: 10.1109/TNANO.2024.3504963) (Early Online Publication)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Liu, Bo ORCID logoORCID: https://orcid.org/0000-0002-3093-4571 (2024) Machine learning-assisted device circuit co-optimization: A case study on inverter. IEEE Transactions on Electron Devices, 71(12), pp. 7256-7262. (doi: 10.1109/TED.2024.3476231)

Martinez-Oliver, Cristina, Scherrer, Markus, Iadanza, Simone, Schmid, Heinz, Moselund, Kirsten and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Simulation and fabrication of monolithic III-V photodetectors on Si: the role of growth facets and localization of heterojunctions. IEEE Transactions on Electron Devices, (doi: 10.1109/TED.2024.3437333) (Early Online Publication)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Gao, Yingjia, Macdonald, Craig ORCID logoORCID: https://orcid.org/0000-0003-3143-279X, García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Combinations of analytical and machine learning methods in a single simulation framework for amphoteric molecules detection. IEEE Sensors Letters, 8(7), 1501004. (doi: 10.1109/LSENS.2024.3408101)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Steep-subthreshold bilayer tunnel field effect transistor based efficient pH sensing: performance characterisation and optimization. IEEE Sensors Letters, (doi: 10.1109/LSENS.2024.3419581) (Early Online Publication)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam, El Maiss, Janwa, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and García, César Pascual (2024) Discovery of amphoteric fingerprints of amino acids with field-effect transistors. IEEE Access, (doi: 10.1109/ACCESS.2024.3411168) (Early Online Publication)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Low-voltage feedback field effect transistor based ion-sensing: a novel and detailed investigation for energy-efficient pH sensor. IEEE Sensors Letters, 8(6), 2000604. (doi: 10.1109/LSENS.2024.3403052)

Shashank, Mishra, Liu, Fengyuan, Shakthivel, Dhayalan, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Molecular dynamics simulation based study to analyse the properties of entrapped water between gold and graphene 2D interface. Nanoscale Advances, 6(9), pp. 2371-2379. (doi: 10.1039/D3NA00878A) (PMID:38694470) (PMCID:PMC11059550)

Shukla, R. P. et al. (2024) Rational design of a planar junctionless field-effect transistor for sensing biomolecular interactions. Proceedings, 97(1), 121. (doi: 10.3390/proceedings2024097121)

Brugnolotto, Enrico, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Sousa, Marilyne and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Machine learning inspired nanowire classification method based on nanowire array scanning electron microscope images. Open Research Europe, 4, 43. (doi: 10.12688/openreseurope.16696.1)

Mishra, Shashank ORCID logoORCID: https://orcid.org/0000-0002-0538-7174, Nair, Nitheesh M. ORCID logoORCID: https://orcid.org/0000-0003-2249-6863, Khandelwal, Gaurav ORCID logoORCID: https://orcid.org/0000-0002-7698-4494, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Capacitive-triboelectric based hybrid sensor system for human-like tactile perception. IEEE Sensors Letters, 8(2), 5500404. (doi: 10.1109/LSENS.2024.3351692)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual García, César, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Charge dynamics of amino acids fingerprints and the effect of density on FinFET-based electrolyte-gated sensor. Solid-State Electronics, 210, 108789. (doi: 10.1016/j.sse.2023.108789)

Li, Weihao, Wolff, Niklas, Samuel, Arun Kumar, Wang, Yuanshen, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Kienle, Lorenz and Ganin, Alexey ORCID logoORCID: https://orcid.org/0000-0002-3754-5819 (2023) Unlocking high-performance supercapacitor behavior and sustained chemical stability of 2D metallic CrSe2 by optimal electrolyte selection. ChemElectroChem, 10(21), e202300428. (doi: 10.1002/celc.202300428)

Brugnolotto, Enrico, Schmid, Heinz, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne (2023) In-plane III-V nanowires on Si (1 1 0) with quantum wells by selective epitaxy in templates. Crystal Growth and Design, 23(11), pp. 8034-8042. (doi: 10.1021/acs.cgd.3c00806)

Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Xeni, Nikolas, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Convolutional machine learning method for accelerating non-equilibrium Green’s function simulations in nanosheet transistor. IEEE Transactions on Electron Devices, 70(10), pp. 5448-5453. (doi: 10.1109/TED.2023.3306319)

Dam Vedel, Christian, Gunst, Tue, Smidstrup, Søren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Shockley-Read-Hall recombination and trap levels in In 0.53Ga 0.47As point defects from first principles. Physical Review B, 108, 094113. (doi: 10.1103/PhysRevB.108.094113)

Medina Bailon, Cristina, Nedjalkov, Mihail, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2023) Comprehensive mobility study of silicon nanowire transistors using multi-subband models. Nano Express, 4, 025005. (doi: 10.1088/2632-959X/acdb8a)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Pascual Garcia, Cesar and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) A novel computational framework for simulations of bio-field effect transistors. ECS Transactions, 111(1), pp. 249-260. (doi: 10.1149/11101.0249ecst)

Brugnolotto, Enrico, Scherrer, Markus, Schmid, Heinz, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Sousa, Marilyne (2023) Growth of type I superlattice III-V heterostructure in horizontal nanowires enclosed in a silicon oxide template. Journal of Crystal Growth, 603, 127015. (doi: 10.1016/j.jcrysgro.2022.127015)

Dhar, Rakshita, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Garcia, Cesar Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Deriving a novel methodology for nano-BioFETs and analysing the effect of high-k oxides on the amino-acids sensing application. Solid-State Electronics, 200, 108525. (doi: 10.1016/j.sse.2022.108525)

Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2023) Hierarchical simulation of nanosheet field effect transistor: NESS flow. Solid-State Electronics, 199, 108489. (doi: 10.1016/j.sse.2022.108489)

Dam Vedel, Christian, Smidstrup, Søren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) First-principles investigation of polytypic defects in InP. Scientific Reports, 12, 19724. (doi: 10.1038/s41598-022-24239-w) (PMID:36385159) (PMCID:PMC9669039)

Guan, Yunhe, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Liang, Feng and Chen, Haifeng (2022) Impact of the Figures of Merit (FoMs) definitions on the variability in nanowire TFET: NEGF simulation study. IEEE Transactions on Electron Devices, 69(11), pp. 6394-6399. (doi: 10.1109/TED.2022.3204596)

Lapham, Paul and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Theoretically probing the relationship between barrier length and resistance in Al/AlOx/Al tunnel junctions. Solid-State Electronics, 197, 108442. (doi: 10.1016/j.sse.2022.108442)

Dhar, Rakshita, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual Garcia, Cesar and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Assessing the effect of scaling high-aspect-ratio ISFET with physical model interface for nano-biosensing application. Solid-State Electronics, 195, 108374. (doi: 10.1016/j.sse.2022.108374)

Gauhar, Ghulam Ali, Chenchety, Abhishek, Yenugula, Hashish, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Badami, Oves (2022) Study of gate current in advanced MOS architectures. Solid-State Electronics, 194, 108345. (doi: 10.1016/j.sse.2022.108345)

Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Maciazek, Patryk, Sengupta, Amretashis ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Statistical device simulations of III-V nanowire resonant tunneling diodes as physical unclonable functions source. Solid-State Electronics, 194, 108339. (doi: 10.1016/j.sse.2022.108339)

Shukla, Rajendra P., Bomer, J. G., Wijnperle, Daniel, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Singh, Aruna Chandra, Krishnamoorthy, Sivashankar, García, César Pascual, Pud, Sergii and Olthuis, Wouter (2022) Planar junctionless field-effect transistor for detecting biomolecular interactions. Sensors, 22(15), 5783. (doi: 10.3390/s22155783)

Tok, Kean H., Mehedi, Mehzabeen, Zhang, Jian F., Brown, James, Ye, Zengliang, Ji, Zhigang, Zhang, Weidong, Marsland, John S., Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) An integral methodology for predicting long-term RTN. IEEE Transactions on Electron Devices, 69(7), pp. 3869-3875. (doi: 10.1109/TED.2022.3176585)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Discovery of Amino Acid fingerprints transducing their amphoteric signatures by field-effect transistors. ChemRxiv, (doi: 10.26434/chemrxiv-2022-bm062-v2)

Lapham, Paul and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2022) Computational study of oxide stoichiometry and variability in the Al/AlOx/Al tunnel junction. Nanotechnology, 33(26), 265201. (doi: 10.1088/1361-6528/ac5f2e) (PMID:35303731)

Chen, R. et al. (2022) Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part I: CNFET transistor optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 432-439. (doi: 10.1109/TVLSI.2022.3146125)

Chen, R. et al. (2022) Carbon nanotube SRAM in 5-nm technology node design, optimization, and performance evaluation--part II: CNT interconnect optimization. IEEE Transactions on Very Large Scale Integration Systems, 30(4), pp. 440-448. (doi: 10.1109/TVLSI.2022.3146064)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) Stability and Vmin analysis of ferroelectric negative capacitance FinFET based SRAM in the presence of variability. Solid-State Electronics, 184, 108100. (doi: 10.1016/j.sse.2021.108100)

Medina-Bailon, Cristina, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dhar, Rakshita Pritam Singh, Todorova, Ilina, Lenoble, Damien, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Pascual García, César (2021) Comprehensive analytical modelling of an absolute pH sensor. Sensors, 21(15), 5190. (doi: 10.3390/s21155190)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) Simulation and modeling of novel electronic device architectures with NESS (Nano-Electronic Simulation Software): a modular nano TCAD simulation framework. Micromachines, 12(6), 680. (doi: 10.3390/mi12060680)

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Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Nano-electronic simulation software (NESS): a novel open-source TCAD simulation environment. Journal of Microelectronic Manufacturing, 3(4), 20030407. (doi: 10.33079/jomm.20030407)

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Book Sections

Adamu-Lema, F., Monzio Compagnoni, C., Badami, O., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: a simulation study. In: Grasser, Tibor (ed.) Noise in Nanoscale Semiconductor Devices. Springer: Cham, pp. 441-466. ISBN 9783030374990 (doi: 10.1007/978-3-030-37500-3_13)

Medina Bailon, Cristina, Sadi, Toufik, Sampedro, Carlos, Padilla, Jose Luis, Donetti, Luca, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator. In: Nikolov, Geno, Kolkovska, Natalia and Georgiev, Krassimir (eds.) Numerical Methods and Applications. Series: Lecture Notes in Computer Science, 11189 (11189). Springer, pp. 273-280. ISBN 9783030106911 (doi: 10.1007/978-3-030-10692-8_30)

Wang, Xingsheng, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Gerrer, Louis, Amoroso, Salvatore M. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) TCAD-based design technology co-optimization for variability in nanoscale SOI FinFETs. In: Deleonibus, Simon (ed.) Integrated Nanodevice and Nanosystem Fabrication. Series: Pan Stanford series on intelligent nanosystems. Pan Stanford: Singapore, pp. 215-252. ISBN 9789814774222

Conference or Workshop Item

Xeni, Nikolas, Ghannam, Rami ORCID logoORCID: https://orcid.org/0000-0001-6910-9280, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru, Badami, Oves and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) The Use of TCAD Simulations in Semiconductor Devices Teaching. Transnational Engineering Education Using Technology Workshop (TREET 2020), Glasgow, UK, 31 Jul 2020. ISBN 9781728188515 (doi: 10.1109/TREET50959.2020.9189752)

Xeni, Nikolas, Ghannam, Rami ORCID logoORCID: https://orcid.org/0000-0001-6910-9280, Udama, Fikru, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Semiconductor Device Visualization using TCAD Software: Case Study for Biomedical Applications. IEEE UKCAS 2019, London, UK, 06 Dec 2019. (Accepted for Publication)

Berrada, Salim, Lee, Jaehyun, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Effect of the Quantum Mechanical Tunneling on the Leakage Current in Ultra-scaled Si Nanowire Transistors. 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017.

Lee, Jaehyun, Sadi, Toufik, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Todri-Sanial, Aida and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) A Hierarchical Model for CNT and Cu-CNT Composite Interconnects: From Density Functional Theory to Circuit-Level Simulations. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017. (Unpublished)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Position-Dependent Performance in 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Variability-Aware Simulations of 5 nm Vertically Stacked Lateral Si Nanowires Transistors. International Workshop on Computational Nanotechnology, Windermere, UK, 5-9 June 2017.

Conference Proceedings

Iadanza, S., Rihani, M., Martinez, C.O., Scherrer, M.A., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Schmid, H. and Moselund, K.E. (2025) Ultra-Low Temperature Characterization of Fully-Integrated III-V Photodetectors for Quantum Networks. In: 2024 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 07-11 December 2024, pp. 1-4. ISBN 9798350365436 (doi: 10.1109/iedm50854.2024.10873440)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733257)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Understanding the dynamic perturbative behaviour of Electrolyte-Gated FET Based Biosensors with Immobilised Nanoparticles. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733212)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Xeni, Nikolas, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2024) Predictive Simulation of Nanosheet Transistors including the Impact of Access Resistance. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 25-27 Sept 2024, (Accepted for Publication)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 5-8. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628880)

Jacobs, Jake, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Atomistic modeling of [W18O54(SeO3)2]4- polyoxometalates (POM) molecules in the presence of counter-cations. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 141-145. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628858)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Sensitivity and Reliability Assessment of a Strained Silicon Junctionless FinFET-based Hydrogen Gas Sensor. In: 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 08-10 May 2024, ISBN 9798350361292 (doi: 10.1109/laedc61552.2024.10555835)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Pascual García, César and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for Memory and Sensing Applications. In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), Paestum, Italy, 22-25 October 2023, pp. 617-620. ISBN 9798350335460 (doi: 10.1109/nmdc57951.2023.10343913)

Gandhi, Navneet, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Kondekar, P. N., Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2023) Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. In: 2023 IEEE SENSORS, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10324885)

Mishra, Shashank ORCID logoORCID: https://orcid.org/0000-0002-0538-7174, John, Dina Anna, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Rai, Beena and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Human-Inspired Stretch and Joint-Bend Sensing System Based on Flexible Sensors. In: IEEE Sensors 2023, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10325250)

Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Green’s Function Simulations. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 169-172. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319587)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Electrolyte-Gated FET-based Sensing of Immobilized Amphoteric Molecules Including the Variability in Affinity of the Reactive Sites. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 377-380. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319578)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Novel Detection Methodology of Milk-Oligopeptides Fingerprints using Ion-Sensitive BioFET. In: 2023 IEEE BioSensors Conference (BioSensors), London, UK, 30 July - 1 August 2023, ISBN 9798350346046 (doi: 10.1109/BioSensors58001.2023.10281172)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Xeni, Nikolas, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2022) Density Gradient Based Quantum-Corrected 3D Drift-Diffusion Simulator for Nanoscale MOSFETs. In: 2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), Vancouver, Canada, 12-15 Dec 2021, ISBN 9781665418928 (doi: 10.1109/NMDC50713.2021.9677480)

Dhar, Rakshita Pritam Singh, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Medina-Bailon, Cristina, Garcia, Cesar Pascual and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) TCAD Simulations of High-Aspect-Ratio Nano-biosensor for Label-Free Sensing Application. In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455 (doi: 10.1109/EuroSOI-ULIS53016.2021.9560701)

Vedel, Christian Dam, Brugnolotto, Enrico, Smidstrup, Soren and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Impact of Different Types of Planar Defects on Current Transport in Indium Phosphide (InP). In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Caen, France, 1-3 Sep 2021, ISBN 9781665437455 (doi: 10.1109/EuroSOI-ULIS53016.2021.9560698)

Martinez-Oliver, Cristina, Moselund, Kirsten E. and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2021) Evaluation of Material Profiles for III-V Nanowire Photodetectors. In: 2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), 13-17 Sep 2021, pp. 39-40. ISBN 9781665412766 (doi: 10.1109/NUSOD52207.2021.9541533)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina Bailon, Cristina, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Xeni, Nikolas, Abourrig, Yassine, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2021) TCAD Simulation of Novel Semiconductor Devices. In: International Conference on ASIC (ASICON) 2021, Kunming, China, 26-29 October 2021, ISBN 9781665438674 (doi: 10.1109/ASICON52560.2021.9620465)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Sengupta, A. ORCID logoORCID: https://orcid.org/0000-0003-1125-6389, Maciazek, P., Badami, O., Medina-Bailon, C., Dutta, T. ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Simulation of Gated GaAs-AlGaAs Resonant Tunneling Diodes for Tunable Terahertz Communication Applications. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 241-244. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241677)

Lapham, P., Badami, Ov., Medina-Bailon, C., Adamu-Lema, F., Dutta, T. ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Nagy, D. ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) A Combined First Principles and Kinetic Monte Carlo study of Polyoxometalate based Molecular Memory Devices. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 273-276. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241606)

McGhee, Joseph and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2020) First Principle Simulations of Electronic and Optical Properties of a Hydrogen Terminated Diamond Doped by a Molybdenum Oxide Molecule. In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 31-34. ISBN 9784863487635 (doi: 10.23919/SISPAD49475.2020.9241630)

Medina Bailon, Cristina, Badami, Oves, Carrillo-Nunez, Hamilton, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Nagy, Daniel ORCID logoORCID: https://orcid.org/0000-0003-0854-6596, Adamu-Lema, Fikru, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS). In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 293-296. ISBN 9781728173542 (doi: 10.23919/SISPAD49475.2020.9241594)

McGhee, Joseph and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2020) Electronic and Optical Properties of Hydrogen-Terminated Diamond Doped by Molybdenum Oxide: A Density Functional Theory Study. In: 2020 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), Turin, Italy, 14-18 Sep 2020, ISBN 9781728160863 (doi: 10.1109/NUSOD49422.2020.9217662)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2020) Vmin Prediction for Negative Capacitance MOSFET based SRAM. In: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 01-30 Sep 2020, ISBN 9781728187655 (doi: 10.1109/EUROSOI-ULIS49407.2020.9365282)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Ding, Jie and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Physical Insights into the Transport Properties of RRAMs Based on Transition Metal Oxides. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870391)

Thirunavukkarasu, V. et al. (2019) Efficient Coupled-mode space based Non-Equilibrium Green’s Function Approach for Modeling Quantum Transport and Variability in Vertically Stacked SiNW FETs. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870400)

Medina-Bailon, Cristina, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Klüpfel, Sylvain, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Scaling-aware TCAD Parameter Extraction Methodology for Mobility Prediction in Tri-gate Nanowire Transistors. In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy, 4-6 Sept. 2019, ISBN 9781728109404 (doi: 10.1109/SISPAD.2019.8870556)

Carrillo-Nunez, Hamilton, Wang, Chen, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Young, Robert and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Simulation of Si Nanowire Quantum-Dot Devices for Authentication. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041864)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Medina-Bailon, Cristina, Carrillo-Nunez, Hamilton, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Schrödinger Equation Based Quantum Corrections in Drift-Diffusion: A Multiscale Approach. In: 2019 IEEE 14th Nanotechnology Materials and Devices Conference (NMDC), Stockholm, Sweden, 27-30 Oct 2019, ISBN 9781728126371 (doi: 10.1109/NMDC47361.2019.9084010)

Lee, Jaehyun, Lamarche, Michel and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) The First-Priniple Simulation Study on the Specific Grain Boundary Resistivity in Copper Interconnects. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169 (doi: 10.1109/NMDC.2018.8605907)

Lee, Jaehyun, Medina-Bailon, Cristina, Berrada, Salim, Carrillo-Nunez, Hamilton, Sadi, Toufik, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Nedjalkov, Mihail and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) A Multi-Scale Simulation Study of the Strained Si Nanowire FETs. In: 2018 IEEE 13th Nanotechnology Materials & Devices Conference (NMDC 2018), Portland, OR, USA, 14-17 Oct 2018, ISBN 9781538610169 (doi: 10.1109/NMDC.2018.8605884)

Mathew, Paven Thomas, Fang, Fengzhou, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Lee ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) First Principle Simulations of Current Flow in Inorganic Molecules: Polyoxometalates (POMs). In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041869)

McGhee, Joseph, Moran, David A. ORCID logoORCID: https://orcid.org/0000-0003-4085-7650 and Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2019) Simulations of Surface Transfer Doping of Hydrogenated Diamond by MoO3 Metal Oxide. In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, 01-03 Apr 2019, ISBN 9781728116587 (doi: 10.1109/EUROSOI-ULIS45800.2019.9041887)

Sadi, Toufik, Badami, Oves, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2019) Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. In: 12th International Conference on Large-Scale Scientific Computing, LSSC 2019, Sozopol, Bulgaria, 10-14 June 2019, pp. 429-437. (doi: 10.1007/978-3-030-41032-2_49)

Berrada, Salim, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Carrillo-Nunez, Hamilton, Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, Fikru, Lee, Jaehyun, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Medina Bailon, Cristina and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) NESS: new flexible Nano-Electronic Simulation Software. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 22-25. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551701)

Berrada, Salim, Lee, Jaehyun, Carrillo-Nunez, Hamilton, Medina Bailon, Cristina, Adamu-Lema, Fikru, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Quantum Transport Investigation of Threshold Voltage Variability in Sub-10 nm JunctionlessSi Nanowire FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 244-247. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551638)

Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Cheng, Binjie, Adamu-Lema, Fikru, Asenov, P., Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Wang, Xingsheng, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Millar, C., Pfaeffli, P. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Statistical Variability Simulation of Novel Capacitor-less Z2FET DRAM: From Transistor Circuit. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 258-261. ISBN 9781538667903 (doi: 10.1109/SISPAD.2018.8551710)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Interplay of RDF and Gate LER Induced Statistical Variability in Negative Capacitance FETs. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA, 24-26 Sept. 2018, pp. 262-265. ISBN 9781538667903 (doi: 10.1109/SISPAD.2018.8551710)

Medina Bailon, Cristina, Sadi, Toufik, Nedjalkov, Mihail, Lee, Jaehyun, Berrada, Salim, Carrillo-Nunez, Hamilton, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, Siegfried and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Impact of the Effective Mass on the Mobility in Si Nanowire Transistors. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 297-300. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551630)

Medina Bailon, Cristina, Sampedro, Carlos, Padilla, Jose Luis, Godoy, Andres, Donetti, Luca, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, Francisco and Asenov, Asen (2018) Impact of Strain on S/D tunneling in FinFETs: a MS-EMC study. In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, TX, 24-26 Sept 2018, pp. 301-304. ISBN 9781538667910 (doi: 10.1109/SISPAD.2018.8551707)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2018) Development of Hierarchical Simulation Framework for Design and Optimization of Molecular Based Flash Cell. In: 2018 76th Device Research Conference (DRC), Santa Barbara, CA, USA, 24-27 Jun 2018, ISBN 9781538630280 (doi: 10.1109/DRC.2018.8442234)

Uhlig, B. et al. (2018) Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects. In: 2018 IEEE International Interconnect Technology Conference (IITC), Santa Clara, CA, USA, 4-7 Jun 2018, pp. 16-18. ISBN 9781538643372 (doi: 10.1109/IITC.2018.8430411)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Random Discrete Dopant Induced Variability in Negative Capacitance Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117 (doi: 10.1109/ULIS.2018.8354732)

Medina Bailon, C., Sadi, T., Nedjalkov, M., Lee, J., Berrada, S., Carrillo-Nunez, H., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Selberherr, S. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Study of the 1D Scattering Mechanisms' Impact on the Mobility in Si Nanowire Transistors. In: 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain, 19-21 Mar 2018, ISBN 9781538648117 (doi: 10.1109/ULIS.2018.8354723)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Dochioiu, Alexandru-Iusti, Adamu-Lema, Fikru, Berrada, Salim, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Paul, Douglas ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Variability Study of High Current Junctionless Silicon Nanowire Transistors. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350514)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2018) Molecular Based Flash Cell for Low Power Flash Application: Optimization and Variability Evaluation. In: IEEE 12th Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 64-65. ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350505)

Uhlig, B. et al. (2018) Progress on Carbon Nanotube BEOL Interconnects. In: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), Dresden, Germany, 19-23 Mar 2018, pp. 937-942. ISBN 9783981926309 (doi: 10.23919/DATE.2018.8342144)

Liang, J., Lee, J., Berrada, S., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Azemard-Crestani, A. and Todri-Sanial, A. (2018) Atomistic to Circuit Level Modeling of Defective Doped SWCNTs with Contacts for On-Chip Interconnect Application. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, pp. 66-67. ISBN 9781538627723 (doi: 10.1109/NMDC.2017.8350506)

Adamu-Lema, Fikru, Duan, Meng ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Navarro, Carlos, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Cheng, Binjie, Wang, Xingsheng, Millar, Campbell, Gamiz, Francisco and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Simulation Based DC and Dynamic Behaviour Characterization of Z2FET. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 317-320. (doi: 10.23919/SISPAD.2017.8085328)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Does a Nanowire Transistor Follow the Golden Ratio? A 2D Poisson-Schrödinger/3D Monte Carlo Simulation Study. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017, (doi: 10.23919/SISPAD.2017.8085263)

Duan, M. ORCID logoORCID: https://orcid.org/0000-0002-0205-9423, Adamu-Lema, F., Cheng, B., Navarro, C., Wang, X., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F., Millar, C. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) 2D-TCAD Simulation on Retention Time of Z2FET for DRAM Application. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 325-328. (doi: 10.23919/SISPAD.2017.8085330)

Lee, J. et al. (2017) The Impact of Vacancy Defects on CNT Interconnects: From Statistical Atomistic Study to Circuit Simulations. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 157-160. (doi: 10.23919/SISPAD.2017.8085288)

Lee, J. et al. (2017) Atoms-to-Circuits Simulation Investigation of CNT Interconnects for Next Generation CMOS Technology. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, pp. 153-156. (doi: 10.23919/SISPAD.2017.8085287)

Medina-Bailon, C., Sadi, T., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Gamiz, F. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Assessment of Gate Leakage Mechanism Utilizing Multi-Subband Ensemble Monte Carlo. In: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Athens, Greece, 03-05 Apr 2017, pp. 144-147. ISBN 9781509053148 (doi: 10.1109/ULIS.2017.7962585)

Liang, J. et al. (2017) A Physics-based Investigation of Pt-salt Doped Carbon Nanotubes for Local Interconnects. In: 2017 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 02-06 Dec 2017, 35.5.1-35.5.4. ISBN 9781538635599 (doi: 10.1109/IEDM.2017.8268502)

Medina-Bailon, C., Sampedro, C., Padilla, J.L., Godoy, A., Donetti, L., Gamiz, F., Sadi, T., Georgiev, V. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2017) Multi-subband Ensemble Monte Carlo Study of Tunneling Leakage mechanisms. In: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan, 7-9 Sept 2017, pp. 281-284. ISBN 9784863486102 (doi: 10.23919/SISPAD.2017.8085319)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Lema, Adamu, Sadi, T., Towie, E., Riddet, C., Alexander, C. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Performance of Vertically Stacked Horizontal Si Nanowires Transistors: A 3D Monte Carlo / 2D Poisson Schrodinger Simulation Study. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521 (doi: 10.1109/NMDC.2016.7777117)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Mirza, Muhammad M. ORCID logoORCID: https://orcid.org/0000-0002-1789-224X, Dochioiu, Alexandru-Iustin, Lema, Fikru-Adamu, Amoroso, Salvatore M., Towie, Ewan, Riddet, Craig, MacLaren, Donald A. ORCID logoORCID: https://orcid.org/0000-0003-0641-686X, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 (2016) Experimental and Simulation Study of a High Current 1D Silicon Nanowire Transistor Using Heavily Doped Channels. In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC), Toulouse, France, 9-12 Oct 2016, ISBN 9781509043521 (doi: 10.1109/NMDC.2016.7777084)

Sadi, Toufik, Towie, Ewan, Nedjalkov, Mihail, Riddet, Craig, Alexander, Craig, Wang, Liping, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Brown, Andrew, Millar, Campbell and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) One-Dimensional Multi-Subband Monte Carlo Simulation of Charge Transport in Si Nanowire Transistors. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 23-26. ISBN 9781509008186 (doi: 10.1109/SISPAD.2016.7605139)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Lema, Fikru-Adama, Sadi, Toufik, Wang, Xingsheng, Towie, Ewan, Riddet, Craig, Alexander, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Impact of Strain on the Performance of Si Nanowires Transistors at the Scaling Limit: A 3D Monte Carlo/2D Poisson Schrodinger Simulation Study. In: SISPAD 2016: International Conference on Simulation of Semiconductor Processes and Devices, Nuremberg, Germany, 6-8 Sept 2016, pp. 213-216. ISBN 9781509008186 (doi: 10.1109/SISPAD.2016.7605185)

Al-Ameri, Talib ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2016) Influence of Quantum Confinement Effects and Device Electrostatic Driven Performance in Ultra-Scaled SixGe1-x Nanowire Transistors. In: 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016), Vienna, Austria, 25-27 Jan 2016, pp. 234-237. ISBN 9781467386104 (doi: 10.1109/ULIS.2016.7440096)

Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Wang, Y., Cheng, B., Wang, X., Asenov, P., Al-Ameri, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449 and Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2016) Nanowire Transistor Solutions for 5NM and Beyond. In: 2016 17th International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA, 15-16 Mar 2016, pp. 269-274. (doi: 10.1109/ISQED.2016.7479212)

Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Ali, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Wang, Y., Gerrer, L., Amoroso, S.M. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Influence of Quantum Confinement Effects over Device Performance in Circular and Elliptical Silicon Nanowire Transistors. In: 2015 International Workshop on Computational Electronics (IWCE), West Lafayette, IN, USA, 2-4 Sept 2015, (doi: 10.1109/IWCE.2015.7301960)

Donetti, Luca, Sampedro, Carlos, Gamiz, Francisco, Godoy, Andres, Garcıa-Ruız, Francisco J., Towie, Ewan, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore Maria, Riddet, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Multi-Subband Ensemble Monte Carlo Simulation of Si Nanowire MOSFETs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 353-356. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292332)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore M., Gerrer, Louis, Adamu-Lema, Fikru and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Interplay between quantum mechanical effects and a discrete trap position in ultrascaled FinFETs. In: SISPAD 2015: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 246-249. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292305)

Kivisaari, Pyry, Sadi, Toufik, Li, Jingrui, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Oksanen, Jani, Rinke, Patrick and Tulkki, Jukka (2015) Bipolar Monte Carlo Simulation of Hot Carriers In III-N LEDs. In: SISPAD: International Conference on Semiconductor Process and Device Simulations, Washington, DC, USA, 9-11 Sept 2015, pp. 393-396. ISBN 9781467378581 (doi: 10.1109/SISPAD.2015.7292342)

Al-Ameri, T. ORCID logoORCID: https://orcid.org/0000-0002-0666-2449, Wang, Y., Georgiev, V.P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Adamu-Lema, F., Wang, X. and Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Correlation between Gate Length, Geometry and Electrostatic Driven Performance in Ultra-Scaled Silicon Nanowire Transistors. In: 10th IEEE Nanotechnology Materials and Devices Conference (NMDC), Anchorage, AK, USA, 13-16 Sep 2015, pp. 30-34. ISBN 9781467393621 (doi: 10.1109/NMDC.2015.7439240)

Sadi, Toufik, Wang, Liping, Gerrer, Louis, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2015) Self-consistent physical modeling of SiOx-based RRAM structures. In: International Workshop on Computational Electronics (IWCE), West Lafayette, IN, USA, 2-4 Sep 2015, pp. 1-4. ISBN 978069251523515 (doi: 10.1109/IWCE.2015.7301981)

Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) 3D Multi-Subband Ensemble Monte Carlo Simulator of FinFETs and nanowire transistors. In: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan, 9-11 Sep 2014,

Amoroso, Salvatore, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, Ewan, Riddet, Craig and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) Metamorphosis of a nanowire: a 3-D coupled mode space NEGF study. In: 2014 International Workshop on Computational Electronics (IWCE), Paris, France, 3-6 June 2014, pp. 1-4. (doi: 10.1109/IWCE.2014.6865854)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Amoroso, Salvatore M., Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Christoph ORCID logoORCID: https://orcid.org/0000-0002-3493-2020, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2014) FDSOI Molecular Flash Cell with Reduced Variability for Low Power Flash Applications. In: 44th European Solid-State Device Research Conference (ESSDERC), Venice, Italy, 22-26 Sep 2014, pp. 353-356. ISBN 9781479943760 (doi: 10.1109/ESSDERC.2014.6948833)

Georgiev, V. P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Markov, S., Vilà-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, A. ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Cronin, L. ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 (2013) Molecular-Metal-Oxide-nanoelectronicS (M-MOS): Achieving the Molecular Limit. In: 16th International Workshop on Computational Electronics, Nara, Japan, 4-7 June 2013, ISBN 9783901578267

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Markov, Stanislav, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Busche, Cristoph, Cronin, Leroy ORCID logoORCID: https://orcid.org/0000-0001-8035-5757 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage. In: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC), Bucharest, Romania, 16-20 Sep 2013, pp. 230-233. (doi: 10.1109/ESSDERC.2013.6818861)

Georgiev, Vihar P. ORCID logoORCID: https://orcid.org/0000-0001-6473-2508, Towie, Ewan A. and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2013) Interaction Between Precisely Placed Dopants and Interface Roughness in Silicon Nanowire Transistors: Full 3-D NEGF Simulation Study. In: 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2013), Glasgow, Scotland, 3-5 Sep 2013, pp. 416-419. ISBN 9781467357333 (doi: 10.1109/SISPAD.2013.6650663)

This list was generated on Sun Jun 15 09:07:03 2025 BST.

Grants

On going projects: 

EPSRC

  • 2021 - 2025 Enabling Cryogenic Chip Design and the Scaling of Quantum Computers (Innovate UK) - £3,500,00 (Co-Investigator)

Past projects: 

HORIZON 2020  EU platform

 

  • Revolutionary Embedded Memory for the Internet of Things Devices and Energy Reduction  (REMINDER)

EPSRC

OTHER

  • 2024 - University of Glasgow: EPSRC Impact Acceleration Account project (PDK Development for Cryogenic Electronics) in collaboration with STMicroelectronics - £49,500
  • 2024 - University of Glasgow:Horizon Europe Network Seed Funding Scheme - £1,500
  • 2021 - University of Glasgow: EPSRC Impact Acceleration Account project (PDK Development for Cryogenic Electronics) in collaboration with SemiWise Ltd. - £40,000
  • 2020 - University of Glasgow: EPSRC Impact Acceleration Account project (Semiconductor Device Variability Driven Encryption Technology for IoT applications) in collaboration with SemiWise Ltd. - £70,610 
  • 2019 - University of Glasgow: EPSRC Impact Acceleration Account (Nano-Electronic Simulation Software (NESS) - creating the first open source TCAD platform in the world) - £35, 719
  • 2019 - University of Glasgow: EPSRC Impact Acceleration Account (attending industry event) - £2,500
  • 2018 - University of Glasgow Rewards for Excellence - £10,000
  • 2016 - Glasgow Research Partnership in Engineering (GRPE) - £2,800
  • 2015 - Glasgow Research Partnership in Engineering (GRPE) - £3,000
  • 2015 - Principal’s Early Career Mobility Fund - £2,000

Supervision

Current PhD students:

1st Supervisor:

  1. Nicholas Smoliak: Machine Learning and numerical simulations of biosensors (Ph.D., 2024 -to date)
  2. Yingjia Gao: Development of novel numerical and machine learning methods for simulation of nanoelectronic device (Ph.D., 2023 -to date)
  3. Patryk Maciazek: Modelling and Simulations of Avalanche Characteristics in SPAD Devices (Ph.D., 2023 -to date; Industrial funded PhD project by STMicroelectronics). 
  4. Pranav Acharya: Quantum mechanical simulation of superconducting qubits (Ph.D., 2021 -to date)
  5. Varun Bheemireddy:  Device Modeling of nanoscale neuromorphic circuits and systems(Ph.D., 2021 -to date)
  6. Liansheng Liu: Modelling and Simulations of ultra-scaled nanowire transistors (Ph.D., 2019-to date)
  7. Nikolas Xeni: Modelling and Simulations of Digital Fingerprints Based on Quantum Technology (Ph.D., 2019-to date)

2nd Supervisor:

  1. Weihao Li: 2D materials for energy applications (Ph.D., 2022-to date)
  2. Isha Mani: Next generation diamond electronic devices (Ph.D., 2018-to date)
  3. Angus Bruce: Germanium-Tin Single Photon Detectors for the Short Wave Infrared (Ph.D., 2020-to date)

Past PhD students:

Past Undergraduate and Master students:

  • Alhaitham Mohammed Masaaod Alkalbani (Master student - MSc. 2024)
  • Carlson Cheng (Master student - MSc. 2024)
  • Zimo Zhan (Master student - MSc. 2024)
  • Alzahraa Mohammad (Undergraduate student - BEng., 2024)
  • Haichen Ma (Undergraduate student - BEng., 2024)
  • Danila Tulyakov (Undergraduate student - BEng., 2024)
  • Mohammed AlKhalidi (Undergraduate student - BEng., 2023)
  • Tan Yixin (Master student - MSc. 2023)
  • Leipeng Bu (Master student - MSc. 2023)
  • Heichen Ma (Master student - MSc. 2023)
  • Reshmi Aravidan Nair (Master student - MSc. 2023)
  • Yuxin Wang (Master student - MSc. 2023)
  • Yuanxian Yang (Master student - MSc. 2023)
  • Mustafa Zariwala (Master student - MSc. 2023)
  • Feiyao Zhu (Master student - MSc. 2023)
  • Zijie Liu (Master student - MSc. 2022)
  • Dong Cheng (Master student - MSc. 2022)
  • Zijie Luie (Master student - MSc. 2022)
  • Yuxuan Xie (Master student - MSc. 2022)
  • Pengchang Zhang (Master student - MSc. 2022)
  • Zeyu Wang (Master student - MSc. 2022)
  • Junwen Yao (Master student - MSc. 2022)
  • Patryk Maciazek (Master student - MSc. 2021)
  • Sifan Zuo (Master student - MSc. 2021)
  • Mohid Handa (Master student - MSc. 2021)
  • Zhe Wen (Master student - MSc. 2021)
  • Guodong Wu (Master student - MSc. 2021)
  • Zijia Fang (Master student - MSc. 2021)
  • Daiwei Ruan (Master student - MSc. 2020)
  • Jingzhi Huang (Master student - MSc. 2020)
  • Yike Hu (Master student - MSc. 2020)
  • Tongzhou Liu (Master student - MSc. 2020)
  • Aidan Porteus (Master student - MSc. 2020)
  • Yujie Zhang (Master student - PDE MSc. 2020)
  • Serban-George Buliga (Undergraduate student - BEng., 2020)
  • Andrew Bryce (Master student - MSc. 2019)
  • Yuntao Fan (Master student - MSc. 2019)
  • Aleena Zubair (Master student - MSc. 2019)
  • Hongzheng Cai (Master student - MSc. 2019)
  • Jingzhi Huang (Master student - MSc. 2019)
  • Nadezda Dimitrova (Undergraduate student - BEng., 2018 - 2019)
  • Patryk Maciazek (Undergraduate student - BEng., 2018 - 2019)
  • Andrew Bryse (Master student - MSc. 2018)
  • Qinyi Zhao (Master student - MSc. 2018)
  • Cong Fu (Undergraduate student - BEng., 2017 - 2018)
  • Isha Mani (Undergraduate student - BEng., 2017 - 2018)
  • Qixian Zhao (Master student - MEng. 2017)
  • Serban-George Buliga (Undergraduate student - BEng., 2016 - 2017)
  • Michael Baxter (Undergraduate student - BEng., summer 2017 )
  • Jack Smith (PhD student  summer 2017)
  • Alexandru-Iustin Dochioiu (Undergraduate student - BEng., 2015-2017)
  • Aleksandar Angelov (Undergraduate student) - Summer 2016

Teaching

Current courses 

  • Analogue Electronics 2 (ENG2004)
  • Team Design Project 3 (ENG 3049)
  • Real Time Computer Systems 3 (ENG3043)

Past courses 

  • Materials 1 (ENG 1033) - Course Convenor
  • Engineering Mathematics 1 (ENG 1063)

Research datasets

Jump to: 2017
Number of items: 1.

2017

Georgiev, V. , Mirza, M. M. A. , Dochioiu, A.-I., Lema, F.-A., Amoroso, S., Towie, E., Riddet, C., MacLaren, D. , Asenov, A. and Paul, D. (2017) Experimental and simulation study of 1D silicon nanowire transistors using heavily doped channels. [Data Collection]

This list was generated on Sun Jun 15 09:07:04 2025 BST.

Additional information

PhD Opportunities:

For prospective PhD students, the detailed application process is available at: 

https://www.gla.ac.uk/schools/engineering/phdopportunities/

or 

https://www.gla.ac.uk/postgraduate/research/electronicsnanoscale/#tab=apply

Fellowship Opportunities:

 Information about the various fellowship, the application procedure and closing dates, can be found via the following links:

Please contact me if you are interested in applying for the Research Fellowships.

Online presentations: