Scanning Electron Microscope
An Oxford Instruments Energy 250 energy dispersive spectrometer system (EDS) is attached to the SEM and allows for the examination of the chemical composition of materials. The system is equipped with a silicon-drift energy dispersive x-ray detector and is capable of extremely high rates of data acquisition. It can be used for point analysis (qualitative or quantitative) of very small areas of interest (down to one micrometer in diameter). It can also be used to assemble element distribution maps and line scans to show the spatial distribution of elements within a sample.
Environmental Scanning Electron Microscope
Model: XL30 ESEM
Tungsten electron gun
Standard SE and BSE detectors
Large sample chamber
PC controlled microscope and data acquisition
Image transfer via USB pen drive
Accelerating voltage 1kV – 30kV
High vacuum mode
“Low vacuum” mode
Magnification 10x – 40,000x
Resolution of 3.5nm at 30kV in high vacuum mode
Polaron SC7640 auto/manual high resolution sputter coater with a Gold/Palladium target.
Location & Contact
SEM Location: A3-32 of the Joseph Black Building
For further info on the SEM please contact Mr Jim Gallagher.