Scanning Electron Microscope
An Oxford Instruments Energy 250 energy dispersive spectrometer system (EDS) is attached to the SEM and allows for the examination of the chemical composition of materials. The system is equipped with a silicon-drift energy dispersive x-ray detector and is capable of extremely high rates of data acquisition. It can be used for point analysis (qualitative or quantitative) of very small areas of interest (down to one micrometer in diameter). It can also be used to assemble element distribution maps and line scans to show the spatial distribution of elements within a sample.
Environmental Scanning Electron Microscope
Manufacturer: Philips/FEI
Model: XL30 ESEM
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Specifications: Tungsten electron gun Standard SE and BSE detectors Large sample chamber PC controlled microscope and data acquisition Image transfer via USB pen drive Accelerating voltage 1kV – 30kV High vacuum mode “Low vacuum” mode ESEM mode Magnification 10x – 40,000x Resolution of 3.5nm at 30kV in high vacuum mode |
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Accessories:
Polaron SC7640 auto/manual high resolution sputter coater with a Gold/Palladium target.
Location & Contact
SEM Location: A3-32 of the Joseph Black Building
For further info on the SEM please contact Mr Jim Gallagher.