GEMS (prev. ISAAC) offers a range of high quality measurement, characterisation, and analytical services, using a variety of sophisticated scanning electron microscopy (SEM) and Raman spectroscopy techniques. SEM imaging can be carried out in high or low vacuum, as well as in environmental mode for ‘wet’ samples. Preparation services are available for both inorganic samples (i.e., rocks, soils, devices) and biological specimens. Because GEMS also has access to the knowledge and expertise of the University of Glasgow, data can be interpreted and reported with greater in-depth analysis, when required. For more complex projects, GEMS will collaborate with other University centres to access complementary metrology instruments and techniques.

Scanning Electron Microscopy

In a SEM, electrons interact with a sample's atoms to produce scattered electrons, X-rays and visible light.

Raman Spectroscopy

The Raman microscope is complementary to the SEM's techniques.

header-Sample Preparation

GEMS has excellent facilities and equipment for the preparation of samples for SEM analysis.

Data Interpretation and Reporting

Upon request, GEMS will provide an interpretation of the results from its analysis and issue a final report. Experts from across the University will be consulted, as appropriate, where they can add value.

Instrumentation Training

GEMS will train customers in the use of its SEM’s and Raman.

Complementary Facilities

GES maintains a range of digital microscopes for transmitted and reflected light microscopy and optical cathodoluminescence (CL). The Kelvin Nanocharacterisation Centre (KNC) in the School of Physics and Astronomy, with transmission electron microscopes (TEM’s) and focused ion beam (FIB) milling capabilities, is complementary to GEMS, and the two centres will engage in joint projects.