Mr Ankit Dixit

  • Research Associate (Electronic & Nanoscale Engineering)

telephone: 07442131863
email: Ankit.Dixit@glasgow.ac.uk

1/2, 22 Waterside Place, Glasgow, G50QD

Import to contacts

ORCID iDhttps://orcid.org/0000-0002-6653-6460

Publications

List by: Type | Date

Jump to: 2025 | 2024 | 2023 | 2022
Number of items: 19.

2025

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond. Solid-State Electronics, 229, 109172. (doi: 10.1016/j.sse.2025.109172)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ansari, Hasan Raaza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics. Solid-State Electronics, 229, 109159. (doi: 10.1016/j.sse.2025.109159)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ghosh, Ramesh ORCID logoORCID: https://orcid.org/0000-0001-9586-8061, JACOBS, JAKE, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Nanowire behavior under the influence of polyoxometalates: a comparative study of depletion and enhancement modes. Solid-State Electronics, 228, 109145. (doi: 10.1016/j.sse.2025.109145)

Patel, Jyoti, Satwik, Bathula, Bagga, Navjeet, Bais, Ishani, Arora, Chirag, Kumar, Vivek, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Dasgupta, S. (2025) Machine learning augmented TCAD assessment of corner radii in nanosheet FET. Solid-State Electronics, 227, 109114. (doi: 10.1016/j.sse.2025.109114)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Generative process variation modeling and analysis for advanced technology based on variational autoencoder. IEEE Transactions on Electron Devices, 72(7), 3889 -3895. (doi: 10.1109/TED.2025.3570675)

2024

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733257)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Understanding the dynamic perturbative behaviour of Electrolyte-Gated FET Based Biosensors with Immobilised Nanoparticles. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733212)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Liu, Bo ORCID logoORCID: https://orcid.org/0000-0002-3093-4571 (2024) Machine learning-assisted device circuit co-optimization: A case study on inverter. IEEE Transactions on Electron Devices, 71(12), pp. 7256-7262. (doi: 10.1109/TED.2024.3476231)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Xeni, Nikolas, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2024) Predictive Simulation of Nanosheet Transistors including the Impact of Access Resistance. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 25-27 Sept 2024, (Accepted for Publication)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 5-8. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628880)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Steep-subthreshold bilayer tunnel field effect transistor based efficient pH sensing: performance characterisation and optimization. IEEE Sensors Letters, (doi: 10.1109/LSENS.2024.3419581) (Early Online Publication)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Sensitivity and Reliability Assessment of a Strained Silicon Junctionless FinFET-based Hydrogen Gas Sensor. In: 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 08-10 May 2024, ISBN 9798350361292 (doi: 10.1109/laedc61552.2024.10555835)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Low-voltage feedback field effect transistor based ion-sensing: a novel and detailed investigation for energy-efficient pH sensor. IEEE Sensors Letters, 8(6), 2000604. (doi: 10.1109/LSENS.2024.3403052)

2023

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Pascual García, César and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for Memory and Sensing Applications. In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), Paestum, Italy, 22-25 October 2023, pp. 617-620. ISBN 9798350335460 (doi: 10.1109/nmdc57951.2023.10343913)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual García, César, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Charge dynamics of amino acids fingerprints and the effect of density on FinFET-based electrolyte-gated sensor. Solid-State Electronics, 210, 108789. (doi: 10.1016/j.sse.2023.108789)

Gandhi, Navneet, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Kondekar, P. N., Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2023) Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. In: 2023 IEEE SENSORS, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10324885)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Electrolyte-Gated FET-based Sensing of Immobilized Amphoteric Molecules Including the Variability in Affinity of the Reactive Sites. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 377-380. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319578)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Novel Detection Methodology of Milk-Oligopeptides Fingerprints using Ion-Sensitive BioFET. In: 2023 IEEE BioSensors Conference (BioSensors), London, UK, 30 July - 1 August 2023, ISBN 9798350346046 (doi: 10.1109/BioSensors58001.2023.10281172)

2022

Santra, Toushik, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Sarkhel, Saheli and Bagga, Navjeet (2022) Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. Microelectronics Journal, 130, 105617. (doi: 10.1016/j.mejo.2022.105617)

This list was generated on Fri Jul 11 19:55:10 2025 BST.
Jump to: Articles | Conference Proceedings
Number of items: 19.

Articles

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond. Solid-State Electronics, 229, 109172. (doi: 10.1016/j.sse.2025.109172)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ansari, Hasan Raaza, Bagga, Navjeet, Gandhi, Navneet, Kondekar, P.N., García, César Pascual and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics. Solid-State Electronics, 229, 109159. (doi: 10.1016/j.sse.2025.109159)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Ghosh, Ramesh ORCID logoORCID: https://orcid.org/0000-0001-9586-8061, JACOBS, JAKE, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Vila-Nadal, Laia ORCID logoORCID: https://orcid.org/0000-0002-7718-7227, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366, Paul, Douglas J. ORCID logoORCID: https://orcid.org/0000-0001-7402-8530 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Nanowire behavior under the influence of polyoxometalates: a comparative study of depletion and enhancement modes. Solid-State Electronics, 228, 109145. (doi: 10.1016/j.sse.2025.109145)

Patel, Jyoti, Satwik, Bathula, Bagga, Navjeet, Bais, Ishani, Arora, Chirag, Kumar, Vivek, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Dasgupta, S. (2025) Machine learning augmented TCAD assessment of corner radii in nanosheet FET. Solid-State Electronics, 227, 109114. (doi: 10.1016/j.sse.2025.109114)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2025) Generative process variation modeling and analysis for advanced technology based on variational autoencoder. IEEE Transactions on Electron Devices, 72(7), 3889 -3895. (doi: 10.1109/TED.2025.3570675)

Xue, Liyuan ORCID logoORCID: https://orcid.org/0000-0001-5849-9391, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Liu, Bo ORCID logoORCID: https://orcid.org/0000-0002-3093-4571 (2024) Machine learning-assisted device circuit co-optimization: A case study on inverter. IEEE Transactions on Electron Devices, 71(12), pp. 7256-7262. (doi: 10.1109/TED.2024.3476231)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Steep-subthreshold bilayer tunnel field effect transistor based efficient pH sensing: performance characterisation and optimization. IEEE Sensors Letters, (doi: 10.1109/LSENS.2024.3419581) (Early Online Publication)

Kumar, Prateek, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Bagga, Navjeet, Dasgupta, S. and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Low-voltage feedback field effect transistor based ion-sensing: a novel and detailed investigation for energy-efficient pH sensor. IEEE Sensors Letters, 8(6), 2000604. (doi: 10.1109/LSENS.2024.3403052)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Pascual García, César, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Charge dynamics of amino acids fingerprints and the effect of density on FinFET-based electrolyte-gated sensor. Solid-State Electronics, 210, 108789. (doi: 10.1016/j.sse.2023.108789)

Santra, Toushik, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Sarkhel, Saheli and Bagga, Navjeet (2022) Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. Microelectronics Journal, 130, 105617. (doi: 10.1016/j.mejo.2022.105617)

Conference Proceedings

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Revealing the Noise Dependent Sensitivity of a Junctionless FinFET-Based Hydrogen Sensor with Ferroelectric Gate Stack. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733257)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Understanding the dynamic perturbative behaviour of Electrolyte-Gated FET Based Biosensors with Immobilised Nanoparticles. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 24-27 September 2024, ISBN 9798331516352 (doi: 10.1109/SISPAD62626.2024.10733212)

Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Adamu-Lema, Fikru, Xeni, Nikolas, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 (2024) Predictive Simulation of Nanosheet Transistors including the Impact of Access Resistance. In: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2024), San Jose, CA, USA, 25-27 Sept 2024, (Accepted for Publication)

Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Xeni, Nikolas, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Topaloglu, Ismail ORCID logoORCID: https://orcid.org/0000-0002-9599-5228, Aleksandrov, Preslav ORCID logoORCID: https://orcid.org/0009-0009-5198-9983, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2024) Unravelling the Impact of Random Dopant Fluctuations on Si-Based 3nm NSFET: A NEGF Analysis. In: IEEE 24th International Conference on Nanotechnology (NANO), Gijon, Spain, 08-11 Jul 2024, pp. 5-8. ISBN 9798350386240 (doi: 10.1109/NANO61778.2024.10628880)

Gandhi, Navneet, Rathore, Sunil, Jaisawal, Rajeewa Kumar, Kondekar, P. N., Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2024) Sensitivity and Reliability Assessment of a Strained Silicon Junctionless FinFET-based Hydrogen Gas Sensor. In: 2024 IEEE Latin American Electron Devices Conference (LAEDC), Guatemala City, Guatemala, 08-10 May 2024, ISBN 9798350361292 (doi: 10.1109/laedc61552.2024.10555835)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dutta, Tapas ORCID logoORCID: https://orcid.org/0000-0003-1917-314X, Pascual García, César and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Insights into the Ultra-Steep Subthreshold Slope Gate-all-around Feedback-FET for Memory and Sensing Applications. In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), Paestum, Italy, 22-25 October 2023, pp. 617-620. ISBN 9798350335460 (doi: 10.1109/nmdc57951.2023.10343913)

Gandhi, Navneet, Jaisawal, Rajeewa Kumar, Rathore, Sunil, Kondekar, P. N., Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 and Bagga, Navjeet (2023) Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. In: 2023 IEEE SENSORS, Vienna, Austria, 29 Oct - 01 Nov 2023, ISBN 9798350303872 (doi: 10.1109/SENSORS56945.2023.10324885)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Asenov, Asen ORCID logoORCID: https://orcid.org/0000-0002-9567-6366 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Electrolyte-Gated FET-based Sensing of Immobilized Amphoteric Molecules Including the Variability in Affinity of the Reactive Sites. In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 27-29 September 2023, pp. 377-380. ISBN 9784863488038 (doi: 10.23919/SISPAD57422.2023.10319578)

Kumar, Naveen ORCID logoORCID: https://orcid.org/0000-0002-4765-1789, García, César Pascual, Dixit, Ankit ORCID logoORCID: https://orcid.org/0000-0002-6653-6460, Rezaei, Ali ORCID logoORCID: https://orcid.org/0000-0001-9150-9520 and Georgiev, Vihar ORCID logoORCID: https://orcid.org/0000-0001-6473-2508 (2023) Novel Detection Methodology of Milk-Oligopeptides Fingerprints using Ion-Sensitive BioFET. In: 2023 IEEE BioSensors Conference (BioSensors), London, UK, 30 July - 1 August 2023, ISBN 9798350346046 (doi: 10.1109/BioSensors58001.2023.10281172)

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