Centre for Advanced Electronics

Join us for an IEEE Distinguished Microwave Lecture from Keysight Fellow Joel Dunsmore, who leads the development of major RF instrumentation equipment since the inception of modern network anaylzer.

Modern Vector Network Analyzers (VNAs) have evolved significantly in both hardware and software capabilities, enabling a wide range of RF component measurements critical for 6G testing. This talk, delivered by Joel Dunsmore, a Keysight R&D Fellow and IEEE MTT-S Distinguished Microwave Lecturer, explores:

• The evolution of VNAs from basic power meters to sophisticated instruments capable of precise S-parameter, noise figure, TOI, modulation/distortion, and active device characterization.
• The unique ability of VNAs to perform vector error correction at the DUT interface, compensating for source/load mismatch and cable loss.
• The importance of calibration, which allows correction for non-ideal VNA behavior and yields accurate S-parameter measurements.
• Applications in non-linear testing, including differential devices and mixers, as well as modulated and spectrum measurements.

Zoom link will be provided closer to the date.

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Abstract

Modern Vector Network Analyzers (VNAs) have evolved significantly in both hardware and software capabilities, enabling a wide range of RF component measurements critical for 6G testing. This talk, delivered by Joel Dunsmore, a Keysight R&D Fellow and IEEE MTT-S Distinguished Microwave Lecturer, explores:

• The evolution of VNAs from basic power meters to sophisticated instruments capable of precise S-parameter, noise figure, TOI, modulation/distortion, and active device characterization.
• The unique ability of VNAs to perform vector error correction at the DUT interface, compensating for source/load mismatch and cable loss.
• The importance of calibration, which allows correction for non-ideal VNA behavior and yields accurate S-parameter measurements.
• Applications in non-linear testing, including differential devices and mixers, as well as modulated and spectrum measurements.

About the Speaker

Joel Dunsmore received the B.S.E.E. and M.S.E.E. degrees from Oregon State University, Corvallis, OR, USA, in 1982 and 1983, respectively, and the Ph.D. degree from Leeds University, Leeds, U.K., in 2004.,He was with Agilent Technologies (formerly Hewlett-Packard), Sonoma County, CA, USA. In 2008, he became an Agilent Research and Development Fellow, where he was involved in the Component Test Division. He was a Principal Contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and microwave circuit designs in these products. Recently, he has was involved in nonlinear test, including differential devices and mixer measurements. He has received 36 patents and authored the “Handbook of Microwave Component Measurements, 2nd Edition (John Wiley, 2020)”, and has the YouTube Channel @DrJoelVNA, email at jdunsmore@gmail.com

First published: 10 February 2021