Jing Wang
Research title: Compact low-loss integrated circuits for frequencies above 300 GHz
Publications
2024
Wang, J., Ofiare, A., Li, Q., Kelly, J., Wasige, E. and Li, C. (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)
2023
Wang, J., Ofiare, A., CHENG, H., Wasige, E. and Li, C. (2023) Benchmarking a High Electron Mobility Transistor Using an Active Load-Pull System at 120 GHz -170 GHz. 102nd ARFTG Microwave Measurement Symposium, San Antonio, TX, USA, 21-24 Jan 2024. (Accepted for Publication)
Li, C. , Ofiare, A., Wang, J., Cheng, H., Al-Khalidi, A. and Wasige, E. (2023) Case Studies on Millimetre-wave and Terahertz On-chip Circuit Test Cluster for 6G Communications and Beyond programme at the University of Glasgow. Automated RF & Microwave Measurement Society (ARMMS) 2023 Autumn, Cambourne, UK, 06-07 Nov 2023.
Cheng, H., Wang, J., Kelly, J. and Li, C. (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.
Kelly, J., Wang, J., Cheng, H., Ofiare, A. and Li, C. (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
2022
Wang, J., Xue, L.-Y., Liu, B. and Li, C. (2022) Design of Terahertz InP pHEMT Using Machine Learning Assisted Global Optimization Techniques. In: European Microwave Week 2021, London, UK, 02-07 Apr 2022, pp. 67-70. ISBN 9781665447225 (doi: 10.23919/EuMIC50153.2022.9784068)
Conference or Workshop Item
Wang, J., Ofiare, A., CHENG, H., Wasige, E. and Li, C. (2023) Benchmarking a High Electron Mobility Transistor Using an Active Load-Pull System at 120 GHz -170 GHz. 102nd ARFTG Microwave Measurement Symposium, San Antonio, TX, USA, 21-24 Jan 2024. (Accepted for Publication)
Li, C. , Ofiare, A., Wang, J., Cheng, H., Al-Khalidi, A. and Wasige, E. (2023) Case Studies on Millimetre-wave and Terahertz On-chip Circuit Test Cluster for 6G Communications and Beyond programme at the University of Glasgow. Automated RF & Microwave Measurement Society (ARMMS) 2023 Autumn, Cambourne, UK, 06-07 Nov 2023.
Cheng, H., Wang, J., Kelly, J. and Li, C. (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.
Kelly, J., Wang, J., Cheng, H., Ofiare, A. and Li, C. (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Conference Proceedings
Wang, J., Ofiare, A., Li, Q., Kelly, J., Wasige, E. and Li, C. (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)
Wang, J., Xue, L.-Y., Liu, B. and Li, C. (2022) Design of Terahertz InP pHEMT Using Machine Learning Assisted Global Optimization Techniques. In: European Microwave Week 2021, London, UK, 02-07 Apr 2022, pp. 67-70. ISBN 9781665447225 (doi: 10.23919/EuMIC50153.2022.9784068)