Dr David Burt
- Affiliate (School of Engineering)
email:
David.Burt@glasgow.ac.uk
R207 Level 2, Eng -Micro & Nanotechnology, 76 Oakfield Avenue, Glasgow G12 8LP
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email:
David.Burt@glasgow.ac.uk
R207 Level 2, Eng -Micro & Nanotechnology, 76 Oakfield Avenue, Glasgow G12 8LP
Paul, J. et al. (2023) Scalable and CMOS-Compatible Superconducting Qubit Fabrication Process for Quantum Computing Applications. Superconducting Qubits and Algorithms Conference (SQA), Munich, Germany, 29 Aug - 01 Sep 2023.
Dyer, S., Griffin, P. F., Arnold, A. S., Mirando, F., Burt, D. P., Riis, E. and McGilligan, J. P. (2022) Micro-machined deep silicon atomic vapor cells. Journal of Applied Physics, 132, 134401. (doi: 10.1063/5.0114762)
Burt, D.P., Dobson, P.S. , Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. , Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)
The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .
Edgeworth, J.P., Burt, D.P., Dobson, P.S. , Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)
Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)
Burt, D. P., Dobson, P. S. , Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)
Burt, D.P., Dobson, P.S. , Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)
Dyer, S., Griffin, P. F., Arnold, A. S., Mirando, F., Burt, D. P., Riis, E. and McGilligan, J. P. (2022) Micro-machined deep silicon atomic vapor cells. Journal of Applied Physics, 132, 134401. (doi: 10.1063/5.0114762)
Burt, D.P., Dobson, P.S. , Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. , Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)
Edgeworth, J.P., Burt, D.P., Dobson, P.S. , Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)
Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)
Burt, D. P., Dobson, P. S. , Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)
Paul, J. et al. (2023) Scalable and CMOS-Compatible Superconducting Qubit Fabrication Process for Quantum Computing Applications. Superconducting Qubits and Algorithms Conference (SQA), Munich, Germany, 29 Aug - 01 Sep 2023.
Burt, D.P., Dobson, P.S. , Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)
The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .