Comparison of Data with Multiple Degrees of Freedom for EMC Applications - Professor Alistair Duffy, De Montfort University

Published: 13 February 2017

Date: Wednesday, 22nd February 2017, 12:00-13:00 Venue: Room 644, James Watt South Building

Professor Alistair Duffy, De Montfort University , will be visiting the School of Engineering. As part of his visit he will deliver a seminar entitled, "Comparison of Data with Multiple Degrees of Freedom for EMC Applications". Abstract and biography are given below.

Date & Time: 12:00, Wednesday, 22nd February
Venue: Room 644, James Watt South Building


Abstract

EMC data is increasingly multi-dimensional with, for example, ready access to simulation technology producing surface or volumetric analysis on modest computing platforms.  This means that a method to compare results of model iterations is now essential in EMC analysis.  This paper looks at a technique that can objectively quantify differences in this multi-dimensional data based on the Feature Selective Validation (FSV) method.  The talk provides an overview of the FSV method and then demonstrates how this can be applied to multi-dimensional data, with verification of performance based on image quality assessment.

Biography

Alistair Duffy is Professor of Electromagnetics and Head of Research and Innovation in the Faculty of Technology at De Montfort University, Leicester, UK. He received the Bachelor's degree in electrical and electronic engineering and the M.Eng. degree from University College, Cardiff, UK, in 1988 and 1989, respectively. After receiving the Master's degree, he joined the research group of professors Christopoulos and Benson at Nottingham University. There he worked on experimental validation of numerical modeling and received his Ph.D. in 1993. Dr. Duffy completed his professional education in 2004 with an MBA from Open University, UK. He is widely published, with over 200 technical papers and articles, mostly on his research interests of validation of computational electromagnetics; physical layer components, particularly communications cabling, and electromagnetic compatibility testing.

Dr. Duffy has contributed to many successful conferences through refereeing functions or organizing committee responsibilities. He currently serves on the Board of Directors of the International Wire and Cable Symposium, which attracts approximately 1,000 delegates annually. He also serves on the Board of Directors of the EMC Society, taking up the role of Vice President for Conferences for the 2017 and 2018 sessions. He is an Associate Editor for the IEEE Transactions on EMC and an Associate Editor of the ACES Journal. Other professional activities include standards body work in the UK (British Standards Institute) and in the IEEE, where he is currently Chair of the EMC Society's Standards Development and Education Committee (SDECom). He is also the Society's Global EMC Symposium Coordinator. From 2008 to 2009 he served the IEEE EMC Society as a Distinguished Lecturer. In 2015, Dr. Duffy was elected to the grade of IEEE Fellow for the development of validation methods in computational electromagnetics.

Dr. Duffy was a Series Editor for undergraduate textbooks published by Butterworth-Heinemann (now part of Elsevier) and SciTech Publishing (now part of the IET) on EMC. He has supervised 20 Ph.D. students during his career.

First published: 13 February 2017