ESDC Facilities

Antenna Measurement Systems

  • 0.5 GHz-16 GHz anechoic chamber (NSI Spherical Scanning System) 
  • R&S ATS800B Antenna test system up to 50 GHz 
  • Near field planar antenna scanning system (75 GHz-325 GHz) 
  • Reference antennas and accessories

On-wafer Spectrum/Power/S-parameter Measurement Systems 

  • 10 MHz-110 GHz on-wafer VNA system (automated) 
  • 140 GHz-220 GHz and 220 GHz-325 GHz on-wafer VNA systems (manual) 
  • 750 GHz-1.1 THz on-wafer VNA system (manual)
  • VDI Erickson PM5 Power Meter and transition waveguides 
  • Keysight’s N9030B (3Hz-50 GHz and up to 325 with external mixers) 
  • Wiltron signal synthesisers (65 GHz) 
  • Keysight PSG signal generator (20 GHz) 

Other Measurement Systems 

  • 750 GHz-1.1 THz material characterisation kit (MCK) 
  • Keysight B1500 Semiconductor device analyser for DC & Pulsed IV/CV measurement (on-wafer) 
  • Keysight B1505 Semiconductor device analyser for DC & Pulsed IV/CV measurement (on-wafer) 
  • Lakeshore temperature-controlled manual probe station (DC-40 GHz GSG probes, 77K-675K, fixed magnetic fields)  

Simulation and Analysis Capabilities

  • Olympus BX-51 and Zeiss Discovery V12 microscopes.
  • 50 GHz spectrum analyser, 8.5 GHz network analyser, 8 GHz bit error-rate tester and 20 GHz analog signal generator.
  • A full range of other tests/measurement instruments including oscilloscopes, logic analysers, source measurement units and signal generators.
  • High-performance computing facilities for design and simulation, including a 384 core Clustervision parallel computer.
  • Design/simulation software including Cadence, Lumerical, Tempest, Agilent ADS and Synopsys