James Kelly
Research title: Development of multi-physical on-wafer test capabilities
Publications
2024
Wang, J., Ofiare, A., Li, Q., Kelly, J., Wasige, E. and Li, C. (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)
2023
Cheng, H., Wang, J., Kelly, J. and Li, C. (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.
Kelly, J., Wang, J., Cheng, H., Ofiare, A. and Li, C. (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Conference or Workshop Item
Cheng, H., Wang, J., Kelly, J. and Li, C. (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.
Kelly, J., Wang, J., Cheng, H., Ofiare, A. and Li, C. (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Wang, J., Li, Q., Kelly, J. and Li, C. (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)
Conference Proceedings
Wang, J., Ofiare, A., Li, Q., Kelly, J., Wasige, E. and Li, C. (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)