James Kelly

Research title: Development of multi-physical on-wafer test capabilities

Publications

List by: Type | Date

Jump to: 2024 | 2023
Number of items: 8.

2024

Cheng, Huihua, Wang, Jing, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Ofiare, Afesomeh, Thoms, Stephen ORCID logoORCID: https://orcid.org/0000-0001-7820-6023 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) HEMT with ultra-low contact resistance for millimeter wave and sub-terahertz applications: design, fabrication and characterization. IEEE Transactions on Electron Devices, (Accepted for Publication)

Ofiare, Afesomeh, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, wang, jing, CHENG, Huihua and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) Accurate Broadband On-Wafer Noise Parameter Measurement with Dedicated 2 GHz – 50 GHz Passive Source Tuner: Measurement Uncertainty Contributions. In: ARMMS: RF and Microwave Society Conference, Cambridge, 18-19 November 2024,

Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wang, Jing, Ofiare, Afesomeh, Ridler, Nick and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) Evaluation of On-Wafer Noise Parameter Measurement Techniques at Cryogenic Temperatures. In: 104th ARFTG Microwave Measurement Symposium, Sheraton Puerto Rico Resort & Casino, San Juan, 19-22 Jan 2025, (Accepted for Publication)

Wang, Jing, Ofiare, Afesomeh, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wasige, Edward ORCID logoORCID: https://orcid.org/0000-0001-5014-342X and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)

2023

Cheng, Huihua, Wang, Jing, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.

Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wang, Jing, Cheng, Huihua, Ofiare, Afesomeh and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)

Wang, Jing, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023.

Wang, Jing, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)

This list was generated on Sun Jun 15 11:33:23 2025 BST.
Jump to: Articles | Conference or Workshop Item | Conference Proceedings
Number of items: 8.

Articles

Cheng, Huihua, Wang, Jing, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Ofiare, Afesomeh, Thoms, Stephen ORCID logoORCID: https://orcid.org/0000-0001-7820-6023 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) HEMT with ultra-low contact resistance for millimeter wave and sub-terahertz applications: design, fabrication and characterization. IEEE Transactions on Electron Devices, (Accepted for Publication)

Conference or Workshop Item

Cheng, Huihua, Wang, Jing, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Recent Development of THz InP HEMTs at the University of Glasgow. IET Colloquium on mmWave and Terahertz Engineering, Glasgow, 2 November 2023.

Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wang, Jing, Cheng, Huihua, Ofiare, Afesomeh and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Temperature Dependent Hall Parameter Measurements of Heterogeneous InGaAs/InP Ultrafast Transistors. ARMMS: RF and Microwave Society Conference (November 2023), Cambourne, UK, 6-7 November 2023. (Accepted for Publication)

Wang, Jing, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Investigation of Noise Performance of AlGaN/GaN HEMTs. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023.

Wang, Jing, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138 and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2023) Noise Performance and RF Performance of AlGaN/GaN HEMTs on Diamond Substrate. UK Semiconductors 2023, Sheffield, UK, 12-13 Jul 2023. (Accepted for Publication)

Conference Proceedings

Ofiare, Afesomeh, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, wang, jing, CHENG, Huihua and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) Accurate Broadband On-Wafer Noise Parameter Measurement with Dedicated 2 GHz – 50 GHz Passive Source Tuner: Measurement Uncertainty Contributions. In: ARMMS: RF and Microwave Society Conference, Cambridge, 18-19 November 2024,

Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wang, Jing, Ofiare, Afesomeh, Ridler, Nick and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) Evaluation of On-Wafer Noise Parameter Measurement Techniques at Cryogenic Temperatures. In: 104th ARFTG Microwave Measurement Symposium, Sheraton Puerto Rico Resort & Casino, San Juan, 19-22 Jan 2025, (Accepted for Publication)

Wang, Jing, Ofiare, Afesomeh, Li, Qingxia, Kelly, James ORCID logoORCID: https://orcid.org/0009-0000-9913-8138, Wasige, Edward ORCID logoORCID: https://orcid.org/0000-0001-5014-342X and Li, Chong ORCID logoORCID: https://orcid.org/0000-0001-5654-0039 (2024) On-wafer Characterisation of Noise Parameters of GaN HEMTs between 77 K and 400 K. In: 103rd ARFTG Microwave Measurement Conference, Washington DC, USA, 21 June 2024, (Accepted for Publication)

This list was generated on Sun Jun 15 11:33:23 2025 BST.

Supervisors