Professor Alan Craven

  • Honorary Senior Research Fellow (School of Physics & Astronomy)

telephone: 01413305892
email: Alan.Craven@glasgow.ac.uk

Publications

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Jump to: 2019 | 2018 | 2017 | 2016 | 2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1993
Number of items: 98.

2019

MacLaren, I. , Cummings, R. B., Gordon, F., Frutos-Myro, E., McFadzean, S., Brown, A. P. and Craven, A. J. (2019) Performing EELS at higher energy losses at both 80 and 200 kV. In: Advances in Imaging and Electron Physics. Elsevier. (doi:10.1016/bs.aiep.2019.02.001) (In Press)

2018

Craven, A. J., Sala, B., Bobynko, J. and MacLaren, I. (2018) Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards. Ultramicroscopy, 186, pp. 66-81. (doi: 10.1016/j.ultramic.2017.12.011)

MacLaren, I. , Annand, K. J., Black, C. and Craven, A. J. (2018) EELS at very high energy losses. Microscopy, 67(suppl1), i78-i85. (doi: 10.1093/jmicro/dfx036) (PMID:29036593)

2017

Craven, A. J., Sawada, H., McFadzean, S. and MacLaren, I. (2017) Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling. Ultramicroscopy, 180, pp. 66-80. (doi: 10.1016/j.ultramic.2017.03.017) (PMID:28377214)

2016

Al-Afeef, A., Bobynko, J., Cockshott, W. P., Craven, A. J., Zuazo, I., Barges, P. and MacLaren, I. (2016) Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing. Ultramicroscopy, 170, pp. 96-106. (doi: 10.1016/j.ultramic.2016.08.004) (PMID:27566049)

Craven, A. J., Bobynko, J., Sala, B. and MacLaren, I. (2016) Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections. Ultramicroscopy, 170, pp. 113-127. (doi: 10.1016/j.ultramic.2016.08.012) (PMID:27569850)

Salih, J.M., Wang, L., Ramasse, Q.M., Jones, L., Barthel, J., Reaney, I.M., Craven, A.J. and MacLaren, I. (2016) Maghemite-like regions at crossing of two antiphase boundaries in doped BiFeO3. Materials Science and Technology, 32(3), pp. 242-247. (doi: 10.1179/1743284715Y.0000000115)

2015

MacLaren, I. , Wang, L., McGrouther, D. , Craven, A. J., McVitie, S. , Schierholz, R., Kovács, A., Barthel, J. and Dunin-Borkowski, R. E. (2015) On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material. Ultramicroscopy, 154, pp. 57-63. 25837677. (doi: 10.1016/j.ultramic.2015.03.016)

Bobynko, J., MacLaren, I. and Craven, A. J. (2015) Spectrum imaging of complex nanostructures using DualEELS: I. digital extraction replicas. Ultramicroscopy, 149, pp. 9-20. (doi: 10.1016/j.ultramic.2014.10.014)

Al-Afeef, A., Cockshott, W.P., Barges, P., Zuazo, I., Bobynko, J., Craven, A.J. and MacLaren, I. (2015) Linear chemically sensitive electron tomography using DualEELS and compressed sensing. In: Microscopy and Microanalysis MM2015, Portland, Oregon, 2-6 Aug 2015,

2014

Bobynko, J., Craven, A. J., McGrouther, D. , MacLaren, I. and Paul, G. (2014) Nanocharacterisation of precipitates in austenite high manganese steels with advanced techniques: HRSTEM and DualEELS mapping. Journal of Physics: Conference Series, 522(1), 012031. (doi: 10.1088/1742-6596/522/1/012031)

MacLaren, I. , Wang, L., Craven, A. J., Ramasse, Q. M., Schaffer, B., Kalantari, K. and Reaney, I. M. (2014) The atomic structure and chemistry of Fe-rich steps on antiphase boundaries in Ti-doped Bi0.9Nd0.15FeO3. APL Materials, 2(066106), (doi: 10.1063/1.4884684)

2013

MacLaren, I. , Wang, L.Q., Schaffer, B., Ramasse, Q.M., Craven, A.J., Selbach, S.M., Spaldin, N.A., Miao, S., Kalantari, K. and Reaney, I.M. (2013) Novel nanorod precipitate formation in neodymium and titanium codoped bismuth ferrite. Advanced Functional Materials, 23(6), pp. 683-689. (doi: 10.1002/adfm.201201835)

Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A. and Dunin-Borkowski, R.E. (2013) Characterization of Fe-N nanocrystals and nitrogen–containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy. Journal of Applied Physics, 114(3), 033530. (doi: 10.1063/1.4816049)

MacLaren, I. et al. (2013) Local stabilisation of polar order at charged antiphase boundaries in antiferroelectric (Bi0.85Nd0.15)(Ti0.1Fe0.9)O3. APL Materials, 1(2), 021102. (doi: 10.1063/1.4818002)

2012

Robb, P.D., Finnie, M. and Craven, A.J. (2012) Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy. Micron, 43(10), pp. 1068-1072. (doi: 10.1016/j.micron.2012.04.018)

Robb, P.D., Finnie, M. and Craven, A. (2012) Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulations. Ultramicroscopy, 118, pp. 53-60. (doi: 10.1016/j.ultramic.2012.05.001)

Reaney, I. M., MacLaren, I. , Wang, L., Schaffer, B., Craven, A., Kalantari, K., Sterianou, I., Miao, S., Karimi, S. and Sinclair, D. C. (2012) Defect chemistry of Ti-doped antiferroelectric Bi0.85Nd0.15FeO3. Applied Physics Letters, 100(18), p. 182902. (doi: 10.1063/1.4705431)

Robb, P., Finnie, M., Longo, P. and Craven, A. (2012) Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging. Ultramicroscopy, 114, pp. 11-19. (doi: 10.1016/j.ultramic.2011.10.015)

Wang, L. Q., Schaffer, B., MacLaren, I. , Miao, S., Craven, A.J. and Reaney, I.M. (2012) Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO3 ceramics co-doped with Nd and Ti. Journal of Physics: Conference Series, 371, 012034. (doi: 10.1088/1742-6596/371/1/012034)

2011

Tizei, L.H.G., Craven, A., Zagonel, L.F., Tence, M., Stephan, O., Chiaramonte, T., Cotta, M.A. and Ugarte, D. (2011) Enhanced Eshelby twist on thin wurtzite InP nanowires and measurement of local crystal rotation. Physical Review Letters, 107(19), p. 195503. (doi: 10.1103/PhysRevLett.107.195503)

Craven, A., Schaffer, B. and Sarahan, M. (2011) Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack. Microelectronic Engineering, 88(7), pp. 1488-1491. (doi: 10.1016/j.mee.2011.03.084)

Wang, L., Schaffer, B., Craven, A.J., MacLaren, I. , Miao, S. and Reaney, I.M. (2011) Atomic scale structural and chemical quantification of non-stoichiometric defects in Ti and Bi doped BiFeO3. Microscopy and Microanalysis, 17(S2), pp. 1896-1897. (doi: 10.1017/S143192761101035X)

McGilvery, C., McComb, D.W., De Gendt, S., Payzant, E.A., MacKenzie, M. and Craven, A.J. (2011) Characterization of hafnia powder prepared from an oxychloride Sol-Gel. Journal of the American Ceramic Society, 94(3), pp. 886-894. (doi: 10.1111/j.1551-2916.2010.04153.x)[Book Review]

Mendis, B.G. and Craven, A. (2011) Characterising the surface and interior chemistry of core-shell nanoparticles using scanning transmission electron microscopy. Ultramicroscopy, 111(3), pp. 212-226. (doi: 10.1016/j.ultramic.2010.11.002)

2010

Eustace, D.A., McComb, D.W. and Craven, A.J. (2010) Probing magnetic order in EELS of chromite spinels using both multiple scattering (FEFF8.2) and DFT (WIEN2k). Micron, 41(6), pp. 547-553. (doi: 10.1016/j.micron.2010.04.013)

Mendis, B.G., MacKenzie, M. and Craven, A.J. (2010) A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), pp. 105-117. (doi: 10.1016/j.ultramic.2009.09.013)

Longo, P., Holland, M.C., Paterson, G.W. , Craven, A.J. and Thayne, I.G. (2010) An EELS sub-nanometer investigation of the dielectric gate stack for the realization of InGaAs based MOSFET devices. Journal of Physics: Conference Series, 241, 012034. (doi: 10.1088/1742-6596/241/1/012034)

Longo, P., Jansen, W., Merckling, C., Penaud, J., Caymax, M., Thayne, I. and Craven, A. (2010) A TEM Nanoanalytical Investigation of Pd/Ge Ohmic Contacts for the Miniaturization and Optimization of n-InGaAs MOSFET Devices. In: Electron Microscopy and Analysis Group Conference, Sheffield, England, 8-11 September 2009, 012037. (doi:10.1088/1742-6596/241/1/012037)

2009

MacLaren, I., Ras, T., MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2009) Texture, twinning and metastable "tetragonal" phase in ultrathin films of HfO2 on a Si substrate. Journal of the Electrochemical Society, 156(8), G103-G108. (doi: 10.1149/1.3141705)

Hill, R.J.W. et al. (2009) Deep sub-micron and self-aligned flatband III–V MOSFETs. In: Device Research Conference, 2009 (DRC 2009), University Park, PA, USA, 22-24 Jun 2009, pp. 251-252. (doi:10.1109/DRC.2009.5354900)

Holland, M., Longo, P., Paterson, G.W. , Reid, W., Long, A., Stanley, C.R., Craven, A.J., Thayne, I.G. and Gregory, R. (2009) Characteristics of Gd-GaO grown by MBE. Microelectronic Engineering, 86(3), pp. 244-248. (doi: 10.1016/j.mee.2008.01.043)

Longo, P., Craven, A.J., Holland, M.C., Moran, D.A.J. and Thayne, I.G. (2009) A nanoanalytical investigation of high-k dielectric gate stacks for GaAs based MOSFET devices. Microelectronic Engineering, 86(3), pp. 214-217. (doi: 10.1016/j.mee.2008.08.013)

Longo, P., Paterson, G.W. , Holland, M.C., Thayne, I.G. and Craven, A.J. (2009) A nanoanalytical investigation of the Ga2O3/GaGdO dielectric gate stack for InGaAs based MOSFET devices. Microelectronic Engineering, 86(7-9), pp. 1568-1570. (doi: 10.1016/j.mee.2009.03.131)

2008

Robb, P.D. and Craven, A.J. (2008) Column ratio mapping: a processing technique for atomic resolution high angle annular dark field(HAADF) images. Ultramicroscopy, 109(1), pp. 61-69. (doi: 10.1016/j.ultramic.2008.08.001)

Paterson, G.W. , Longo, P., Wilson, J.A., Craven, A.J., Long, A.R., Thayne, I.G., Passlack, M. and Droopad, R. (2008) Gallium oxide and gadolinium gallium oxide insulators on Si δ-doped GaAs/AlGaAs heterostructures. Journal of Applied Physics, 104(10), p. 103719. (doi: 10.1063/1.3029661)

Scott, J. , Thomas, P.J., MacKenzie, M., McFadzean, S., Wilbrink, J., Craven, A.J. and Nicholson, W.A.P. (2008) Near-simultaneous dual energy range EELS spectrum imaging. Ultramicroscopy, 108(12), pp. 1586-1594. (doi: 10.1016/j.ultramic.2008.05.006)

Harkins, P., MacKenzie, M., Craven, A.J. and McComb, D.W. (2008) Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate. Micron, 39(6), pp. 709-716. (doi: 10.1016/j.micron.2007.10.016)

Craven, A.J., MacKenzie, M., Cerezo, A., Godfrey, T. and Clifton, P.H. (2008) Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel. Materials Science and Technology, 24(6), 641-650(10).

Docherty, F.T. , MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., McFadzean, S. and McGilvery, C.M. (2008) A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon. Microelectronic Engineering, 85(1), pp. 61-64. (doi: 10.1016/j.mee.2007.03.001)

Eustace, D.A., Cheah, W.L., McComb, D.W., Docherty, F.T. and Craven, A.J. (2008) Modelling paramagnetism in EELS: a study of magnetic order. Journal of Physics: Conference Series, 126(1), 012039.

Kalna, K. et al. (2008) III-V MOSFETs for digital applications with silicon co-integration. In: 7th International Conference on Advanced Semiconductor Devices and Microsystems, Smolenice, Slovakia, 12-16 October 2008, pp. 39-46. ISBN 9781424423255 (doi:10.1109/ASDAM.2008.4743354)

Longo, P., Craven, A.J., Scott, J. , Holland, M. and Thayne, I.G. (2008) Elemental profiling of III-V MOSFET high-k dielectric gate stacks using EELS spectrum imaging. In: Cullis, A.G. and Midgley, P.A. (eds.) Microscopy of Semiconducting Materials 2007. Series: Springer Proceedings in Physics (120). Springer-Verlag: Berlin, Germany, pp. 317-320. ISBN 9781402086144

Longo, P., Scott, J. , Craven, A.J., Hill, R.J.W. and Thayne, I.G. (2008) EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V MOSFET devices. Journal of Physics: Conference Series, 126(1), 012053. (doi: 10.1088/1742-6596/126/1/012053)

McGilvery, C.M., McFadzean, S., MacKenzie, M., Docherty, F.T. , Craven, A.J., McComb, D.W. and De Gendt, S. (2008) Nucleation, crystallisation and phase segregation in HfO2 and HfSiO. In: Cullis, A.G. and Midgley, P.A. (eds.) Microscopy of Semiconducting Materials: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK. Series: Springer proceedings in physics, 5 (120). Springer Netherlands, pp. 325-328. ISBN 9781402086144 (doi:10.1007/978-1-4020-8615-1_71)

2007

Holland, M., Stanley, C.R., Reid, W., Thayne, I. , Paterson, G.W. , Long, A.R., Longo, P., Scott, J. , Craven, A.J. and Gregory, R. (2007) GdGaO: a gate dielectric for GaAs metal-oxide-semiconductor field-effect transistors. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 25(3), pp. 1024-1028. (doi: 10.1116/1.2738480)

Li, Y., Wilson, J.A., Craven, A.J., Mitchell, P.S., Crowther, D.N. and Baker, T.N. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging part 1 - processing parameters, mechanical properties and microstructure. Materials Science and Technology, 23(5), 509-518(10).

Wilson, J.A., Craven, A.J., Li, Y. and Baker, T.N. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging part 2 - chemical characterisation of dispersion strengthening precipitates. Materials Science and Technology, 23(5), 519-527(9).

MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., Docherty, F.T. , McGilvery, C.M. and McFadzean, S. (2007) Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation. Electrochemical and Solid State Letters, 10(6), G33-G35. (doi: 10.1149/1.2718399)

Li, Y., Wilson, J., Craven, A., Mitchell, P., Crowther, D. and Baker, T. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging - Part 1 - Processing parameters, mechanical properties and microstructure. Materials Science and Technology, 23, pp. 509-518. (doi: 10.1179/174328407X166687)

Moran, D.A.J. et al. (2007) High Performance Enhancement Mode III-V MOSFETs. IBM Workshop on Advanced Oxides, Zurich, Switzerland, June 2007.

Pey, K., Tung, C., Ranjan, R., Lo, V., MacKenzie, M. and Craven, A. (2007) Nano-characterisation of dielectric breakdown in the various advanced gate stack MOSFETs. International Journal of Nanotechnology, 4, pp. 347-376.

Thayne, I.G. et al. (2007) Recent Progress in III-V MOSFETs. In: UK Condensed Matter and Material Physics Conference, Leicester, UK, April 2007,

Wilson, J., Craven, A., Li, Y. and Baker, T. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging - Part 2 - Chemical characterisation of dispersion strengthening precipitates. Materials Science and Technology, 23, pp. 519-527. (doi: 10.1179/174328407X161330)

2006

Scott, J. , Docherty, F.T., MacKenzie, M., Smith, W., Miller, B., Collins, C.L. and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26(1), pp. 223-226. (doi: 10.1088/1742-6596/26/1/053)

Thomas, P., Scott, J. , MacKenzie, M., McFadzean, S., Wilbrink, J. and Craven, A. (2006) Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch. Microscopy and Microanalysis, 12(S02), pp. 1362-1363. (doi: 10.1017/S1431927606065512)

Docherty, F.T. , MacKenzie, M., Pennicard, D., Craven, A.J. and McComb, D.W. (2006) Understanding and preventing beam damage effects in partially processed high-k gate stacks. Journal of Physics: Conference Series, 26(1), pp. 231-234. (doi: 10.1088/1742-6596/26/1/055)

Eustace, D.A., Docherty, F.T. , McComb, D.W. and Craven, A.J. (2006) ELNES as a probe of magnetic order in mixed oxides. Journal of Physics: Conference Series, 26(1), pp. 165-168. (doi: 10.1088/1742-6596/26/1/039)

MacKenzie, M., Craven, A. and Collins, C. (2006) Nanoanalysis of very fine VN precipitates in steel. Scripta Materialia, 54, pp. 1-5. (doi: 10.1016/j.scriptamat.2005.09.018)

MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2006) Interfacial reactions in a HfO2/TiN/poly-Si gate stack. Applied Physics Letters, 88, (doi: 10.1063/1.2201891)

2005

Craven, A.J., MacKenzie, M., McComb, D.W. and Docherty, F.T. (2005) Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy. Microelectronic Engineering, 80, pp. 90-97. (doi: 10.1016/j.mee.2005.04.048)

2004

Baker, T.,N.,, Li, Y., Wilson, J.A., Craven, A.J. and Crowther, D.N. (2004) Evolution of precipitates, in particular cruciform and cuboid particles, during simulated direct charging of thin slab cast vanadium microalloyed steels. Materials Science and Technology, 20(6), pp. 720-730. (doi: 10.1179/026708304225016743)

Craven, A.J. (2004) Perspectives in nanoanalysis. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003, pp. 285-290.

Harkins, P., McComb, D.W., MacKenzie, M. and Craven, A.J. (2004) ELNES of titanate perovskites - a probe of structure and bonding. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3 -5 Sept 2003, pp. 119-122.

Li, Y., Wilson, J.A., Crowther, D.N., Mitchell, P.S., Craven, A.J. and Baker, T.N. (2004) The effects of vanadium, niobium, titanium and zirconium on the microstructure and mechanical properties of thin slab cast steels. ISIJ International, 44(6), pp. 1093-1102.

MacKenzie, M., Craven, A.J. and Mccomb, D.W. (2004) Understanding gate oxide materials: ELNES of Hf and Zr compounds. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3 - 5 September 2003, pp. 79-82.

MacKenzie, M., Craven, A.J., Mccomb, D.W., Hamilton, D.A. and McFadzean, S. (2004) Spectrum imaging of high-k dielectric stacks. In: Institute of Physics Electron Microscopy and Analysis Group Conference, Oxford, UK, 3 -5 Sep 2003, pp. 299-302.

McComb, D.W., Craven, A.J., Hamilton, D.A. and MacKenzie, M. (2004) Probing local coordination environments in high-k materials for gate stack applications. Applied Physics Letters, 84(22), pp. 4523-4525. (doi: 10.1063/1.1758303)

2003

McComb, D.W., Craven, A.J., Chioncel, L., Lichtenstein, A.I. and Docherty, F.T. (2003) Effect of short-range magnetic ordering on electron energy-loss spectra in spinels. Physical Review B, 68(22), 224420. (doi: 10.1103/PhysRevB.68.224420)

Paxton, A.T., Craven, A.J., Gregg, J.M. and McComb, D.W. (2003) Bandstructure approach to near edge structure. Journal of Microscopy, 210(1), 35 -44. (doi: 10.1046/j.1365-2818.2003.01182.x?journalCode=jmi&volume=210&issue=1)

Craven, A. (2003) Hair follicle sensitivity to growth regulation by prolactin. Experimental Dermatology, 12(2), pp. 227-228.

Craven, A. (2003) Prolactin receptor gene expression in murine skin during pregnancy, lactation and weaning. Experimental Dermatology, 12(2), pp. 228-229.

Craven, A.J., MacKenzie, M. and Mccomb, D.W. (2003) Application of spectrum imaging to the study of high-k dielectric stacks. In: Proceedings of the Institute of Physics conference., Cambridge University, 31 March - 3 April 2003, pp. 393-396.

Wilson, J.A. and Craven, A.J. (2003) Improving the analysis of small precipitates in HSLA steels using a plasma cleaner and ELNES. Ultramicroscopy, 94(3-4), 197 -207. (doi: 10.1016/S0304-3991(02)00265-6)

2002

Ostanin, S.,, Salamatov, E., Craven, A.J., McComb, D.W. and Vlachos, D. (2002) Theory of the phases and atomistic structure of yttria-doped zirconia. Physical Review B, 66(13), p. 132105. (doi: 10.1103/PhysRevB.66.132105)

Ostanin, S., Craven, A.J., McComb, D.W., Vlachos, D., Alavi, A., Paxton, A.T. and Finnis, M.W. (2002) Electron energy-loss near-edge shape as a probe to investigate the stabilization of yttria-stabilized zirconia. Physical Review B, 65(22), 224109 -9. (doi: 10.1103/PhysRevB.65.224109)

Craven, A. (2002) Regulation of prolactin receptor expression in ovine skin in relation to circulating prolactin and wool follicle growth status. Journal of Endocrinology, 172(3), pp. 605-614.

Craven, A.J., Wilson, J.A. and Nicholson, W.A.P. (2002) A fast beam switch for controlling the intensity in electron energy loss spectrometry. Ultramicroscopy, 92(3-4), 165 -180. (doi: 10.1016/S0304-3991(02)00130-4)

MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35, pp. 779-787.

MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy of interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35(8), 779 -787. (doi: 10.1088/0022-3727/35/8/309)

2001

Scott, A.J., Brydson, R., MacKenzie, M. and Craven, A.J. (2001) Theoretical investigation of the ELNES of transition metal carbides for the extraction of structural and bonding information. Physical Review B, 63(24), p. 245105. (doi: 10.1103/PhysRevB.63.245105)

Docherty, F.T. , Craven, A.J., McComb, D.W. and Skakle, J. (2001) ELNES investigations of the oxygen K-edge in spinels. Ultramicroscopy, 86(3-4), 273 -288. (doi: 10.1016/S0304-3991(00)00119-4)

Craven, A. (2001) Prolactin signaling influences the timing mechanism of the hair follicle: Analysis of hair growth cycles in prolactin receptor knockout mice. Endocrinology, 142(6), pp. 2533-2539.

Li, Y., Crowther, D.N., Wilson, J.A., Craven, A.J. and Baker, T.N. (2001) Precipitation in vanadium and vanadium-titanium microalloyed steels. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 183-186. ISBN 9780750308120

MacKenzie, M., Weatherly, G.C., McComb, D.W., Perovic, A. and Craven, A.J. (2001) Interfacial reaction products in Al-based metal-matrix composites. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 283-286. ISBN 9780750308120

Maclean, E.D.W., Craven, A.J. and McComb, D.W. (2001) Valence losses at interfaces in aluminium alloys. In: Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 259-262. ISBN 9780750308120

Nartowski, A.M., Parkin, I.P., MacKenzie, M. and Craven, A.J. (2001) Solid state metathesis: synthesis of metal carbides from metal oxides. Journal of Materials Chemistry, 11(12), 3116 -3119. (doi: 10.1039/b105352n)

Vlachos, D., Craven, A.J. and McComb, D.W. (2001) The influence of dopant concentration on the oxygen K-edge ELNES and XANES in yttria-stabilized zirconia. Journal of Physics: Condensed Matter, 13(48), 10799 -10809. (doi: 10.1088/0953-8984/13/48/306)

Wilson, J.A., Craven, A.J., Li, Y. and Baker, T.N. (2001) Nanoanalysis of dispersion strengthening particles in thin slab cast vanadium microalloyed steels. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 187-190. ISBN 9780750308120

2000

Ostanin, S., Craven, A.J., McComb, D.W., Vlachos, D., Alavi, A., Finnis, M.W. and Paxton, A.T. (2000) Effect of relaxation on the oxygen K-edge electron energy-loss near-edge structure in yttria-stabilized zirconia. Physical Review B, 62(22), 14728 -14735. (doi: 10.1103/PhysRevB.62.14728)

Paxton, A.T., van Schilfgaarde, M., MacKenzie, M. and Craven, A.J. (2000) The near-edge structure in energy-loss spectroscopy: many-electron and magnetic effects in transition metal nitrides and carbides. Journal of Physics: Condensed Matter, 12(5), 729 -750. (doi: 10.1088/0953-8984/12/5/319)

Craven, A.J., He, K., Garvie, L.A.J. and Baker, T.N. (2000) Complex heterogeneous precipitation in titanium-niobium microalloyed Al-killed HSLA steels - I. (Ti,Nb)(C,N) particles. Acta Materialia, 48(15), 3857 -3868. (doi: 10.1016/S1359-6454(00)00194-4)

Craven, A.J., He, K., Garvie, L.A.J. and Baker, T.N. (2000) Complex heterogeneous precipitation in titanium-niobium microalloyed Al-killed HSLA steels - II. Non-titanium based particles. Acta Materialia, 48(15), 3869 -3878. (doi: 10.1016/S1359-6454(00)00193-2)

Garvie, L.A.J., Rez, P., Alvarez, J.R., Buseck, P.R., Craven, A.J. and Brydson, R. (2000) Bonding in alpha-quartz (SiO2): A view of the unoccupied states. American Mineralogist, 85(5-6), 732 -738.

MacKenzie, M. and Craven, A.J. (2000) Quantifying the oxidation of AlN using electron energy loss spectroscopy. Journal of Physics D: Applied Physics, 33(14), 1647 -1655. (doi: 10.1088/0022-3727/33/14/303)

1999

Docherty, F.T. , Craven, A.J. and McComb, D.W. (1999) ELNES investigations of the structure and electronic properties of chromium spinels. In: Institute of Physics; Electron Microscopy and Analysis Group, Sheffield, August 1999, 203 -206. ISBN 0750305770

MacKenzie, M. and Craven, A.J. (1999) ELNES investigation of the oxidation of AIN. In: Institute of Physics; Electron Microscopy and Analysis Group, Sheffield, August 1999, 215 -218. ISBN 0750305770

1993

Craven, A.J., McVitie, S. and Chapman, J.N. (1993) Instrumentation, techniques, and applications of electron microscopy in the solid state physics group at Glasgow university. Microscopy Research and Technique, 24(4), pp. 316-332. (doi: 10.1002/jemt.1070240405) (PMID:8513173)

This list was generated on Thu Apr 2 23:42:22 2020 BST.
Number of items: 98.

Articles

Craven, A. J., Sala, B., Bobynko, J. and MacLaren, I. (2018) Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards. Ultramicroscopy, 186, pp. 66-81. (doi: 10.1016/j.ultramic.2017.12.011)

MacLaren, I. , Annand, K. J., Black, C. and Craven, A. J. (2018) EELS at very high energy losses. Microscopy, 67(suppl1), i78-i85. (doi: 10.1093/jmicro/dfx036) (PMID:29036593)

Craven, A. J., Sawada, H., McFadzean, S. and MacLaren, I. (2017) Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling. Ultramicroscopy, 180, pp. 66-80. (doi: 10.1016/j.ultramic.2017.03.017) (PMID:28377214)

Al-Afeef, A., Bobynko, J., Cockshott, W. P., Craven, A. J., Zuazo, I., Barges, P. and MacLaren, I. (2016) Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing. Ultramicroscopy, 170, pp. 96-106. (doi: 10.1016/j.ultramic.2016.08.004) (PMID:27566049)

Craven, A. J., Bobynko, J., Sala, B. and MacLaren, I. (2016) Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections. Ultramicroscopy, 170, pp. 113-127. (doi: 10.1016/j.ultramic.2016.08.012) (PMID:27569850)

Salih, J.M., Wang, L., Ramasse, Q.M., Jones, L., Barthel, J., Reaney, I.M., Craven, A.J. and MacLaren, I. (2016) Maghemite-like regions at crossing of two antiphase boundaries in doped BiFeO3. Materials Science and Technology, 32(3), pp. 242-247. (doi: 10.1179/1743284715Y.0000000115)

MacLaren, I. , Wang, L., McGrouther, D. , Craven, A. J., McVitie, S. , Schierholz, R., Kovács, A., Barthel, J. and Dunin-Borkowski, R. E. (2015) On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material. Ultramicroscopy, 154, pp. 57-63. 25837677. (doi: 10.1016/j.ultramic.2015.03.016)

Bobynko, J., MacLaren, I. and Craven, A. J. (2015) Spectrum imaging of complex nanostructures using DualEELS: I. digital extraction replicas. Ultramicroscopy, 149, pp. 9-20. (doi: 10.1016/j.ultramic.2014.10.014)

Bobynko, J., Craven, A. J., McGrouther, D. , MacLaren, I. and Paul, G. (2014) Nanocharacterisation of precipitates in austenite high manganese steels with advanced techniques: HRSTEM and DualEELS mapping. Journal of Physics: Conference Series, 522(1), 012031. (doi: 10.1088/1742-6596/522/1/012031)

MacLaren, I. , Wang, L., Craven, A. J., Ramasse, Q. M., Schaffer, B., Kalantari, K. and Reaney, I. M. (2014) The atomic structure and chemistry of Fe-rich steps on antiphase boundaries in Ti-doped Bi0.9Nd0.15FeO3. APL Materials, 2(066106), (doi: 10.1063/1.4884684)

MacLaren, I. , Wang, L.Q., Schaffer, B., Ramasse, Q.M., Craven, A.J., Selbach, S.M., Spaldin, N.A., Miao, S., Kalantari, K. and Reaney, I.M. (2013) Novel nanorod precipitate formation in neodymium and titanium codoped bismuth ferrite. Advanced Functional Materials, 23(6), pp. 683-689. (doi: 10.1002/adfm.201201835)

Kovacs, A., Schaffer, B., Moreno, M.S., Jinschek, J.R., Craven, A., Dietl, T., Bonanni, A. and Dunin-Borkowski, R.E. (2013) Characterization of Fe-N nanocrystals and nitrogen–containing inclusions in (Ga,Fe)N thin films using transmission electron microscopy. Journal of Applied Physics, 114(3), 033530. (doi: 10.1063/1.4816049)

MacLaren, I. et al. (2013) Local stabilisation of polar order at charged antiphase boundaries in antiferroelectric (Bi0.85Nd0.15)(Ti0.1Fe0.9)O3. APL Materials, 1(2), 021102. (doi: 10.1063/1.4818002)

Robb, P.D., Finnie, M. and Craven, A.J. (2012) Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy. Micron, 43(10), pp. 1068-1072. (doi: 10.1016/j.micron.2012.04.018)

Robb, P.D., Finnie, M. and Craven, A. (2012) Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulations. Ultramicroscopy, 118, pp. 53-60. (doi: 10.1016/j.ultramic.2012.05.001)

Reaney, I. M., MacLaren, I. , Wang, L., Schaffer, B., Craven, A., Kalantari, K., Sterianou, I., Miao, S., Karimi, S. and Sinclair, D. C. (2012) Defect chemistry of Ti-doped antiferroelectric Bi0.85Nd0.15FeO3. Applied Physics Letters, 100(18), p. 182902. (doi: 10.1063/1.4705431)

Robb, P., Finnie, M., Longo, P. and Craven, A. (2012) Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging. Ultramicroscopy, 114, pp. 11-19. (doi: 10.1016/j.ultramic.2011.10.015)

Wang, L. Q., Schaffer, B., MacLaren, I. , Miao, S., Craven, A.J. and Reaney, I.M. (2012) Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO3 ceramics co-doped with Nd and Ti. Journal of Physics: Conference Series, 371, 012034. (doi: 10.1088/1742-6596/371/1/012034)

Tizei, L.H.G., Craven, A., Zagonel, L.F., Tence, M., Stephan, O., Chiaramonte, T., Cotta, M.A. and Ugarte, D. (2011) Enhanced Eshelby twist on thin wurtzite InP nanowires and measurement of local crystal rotation. Physical Review Letters, 107(19), p. 195503. (doi: 10.1103/PhysRevLett.107.195503)

Craven, A., Schaffer, B. and Sarahan, M. (2011) Nanoanalysis of a sub-nanometre reaction layer in a metal inserted high-k gate stack. Microelectronic Engineering, 88(7), pp. 1488-1491. (doi: 10.1016/j.mee.2011.03.084)

Wang, L., Schaffer, B., Craven, A.J., MacLaren, I. , Miao, S. and Reaney, I.M. (2011) Atomic scale structural and chemical quantification of non-stoichiometric defects in Ti and Bi doped BiFeO3. Microscopy and Microanalysis, 17(S2), pp. 1896-1897. (doi: 10.1017/S143192761101035X)

Mendis, B.G. and Craven, A. (2011) Characterising the surface and interior chemistry of core-shell nanoparticles using scanning transmission electron microscopy. Ultramicroscopy, 111(3), pp. 212-226. (doi: 10.1016/j.ultramic.2010.11.002)

Eustace, D.A., McComb, D.W. and Craven, A.J. (2010) Probing magnetic order in EELS of chromite spinels using both multiple scattering (FEFF8.2) and DFT (WIEN2k). Micron, 41(6), pp. 547-553. (doi: 10.1016/j.micron.2010.04.013)

Mendis, B.G., MacKenzie, M. and Craven, A.J. (2010) A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy. Ultramicroscopy, 110(2), pp. 105-117. (doi: 10.1016/j.ultramic.2009.09.013)

Longo, P., Holland, M.C., Paterson, G.W. , Craven, A.J. and Thayne, I.G. (2010) An EELS sub-nanometer investigation of the dielectric gate stack for the realization of InGaAs based MOSFET devices. Journal of Physics: Conference Series, 241, 012034. (doi: 10.1088/1742-6596/241/1/012034)

MacLaren, I., Ras, T., MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2009) Texture, twinning and metastable "tetragonal" phase in ultrathin films of HfO2 on a Si substrate. Journal of the Electrochemical Society, 156(8), G103-G108. (doi: 10.1149/1.3141705)

Holland, M., Longo, P., Paterson, G.W. , Reid, W., Long, A., Stanley, C.R., Craven, A.J., Thayne, I.G. and Gregory, R. (2009) Characteristics of Gd-GaO grown by MBE. Microelectronic Engineering, 86(3), pp. 244-248. (doi: 10.1016/j.mee.2008.01.043)

Longo, P., Craven, A.J., Holland, M.C., Moran, D.A.J. and Thayne, I.G. (2009) A nanoanalytical investigation of high-k dielectric gate stacks for GaAs based MOSFET devices. Microelectronic Engineering, 86(3), pp. 214-217. (doi: 10.1016/j.mee.2008.08.013)

Longo, P., Paterson, G.W. , Holland, M.C., Thayne, I.G. and Craven, A.J. (2009) A nanoanalytical investigation of the Ga2O3/GaGdO dielectric gate stack for InGaAs based MOSFET devices. Microelectronic Engineering, 86(7-9), pp. 1568-1570. (doi: 10.1016/j.mee.2009.03.131)

Robb, P.D. and Craven, A.J. (2008) Column ratio mapping: a processing technique for atomic resolution high angle annular dark field(HAADF) images. Ultramicroscopy, 109(1), pp. 61-69. (doi: 10.1016/j.ultramic.2008.08.001)

Paterson, G.W. , Longo, P., Wilson, J.A., Craven, A.J., Long, A.R., Thayne, I.G., Passlack, M. and Droopad, R. (2008) Gallium oxide and gadolinium gallium oxide insulators on Si δ-doped GaAs/AlGaAs heterostructures. Journal of Applied Physics, 104(10), p. 103719. (doi: 10.1063/1.3029661)

Scott, J. , Thomas, P.J., MacKenzie, M., McFadzean, S., Wilbrink, J., Craven, A.J. and Nicholson, W.A.P. (2008) Near-simultaneous dual energy range EELS spectrum imaging. Ultramicroscopy, 108(12), pp. 1586-1594. (doi: 10.1016/j.ultramic.2008.05.006)

Harkins, P., MacKenzie, M., Craven, A.J. and McComb, D.W. (2008) Quantitative electron energy-loss spectroscopy (EELS) analyses of lead zirconate titanate. Micron, 39(6), pp. 709-716. (doi: 10.1016/j.micron.2007.10.016)

Craven, A.J., MacKenzie, M., Cerezo, A., Godfrey, T. and Clifton, P.H. (2008) Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel. Materials Science and Technology, 24(6), 641-650(10).

Docherty, F.T. , MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., McFadzean, S. and McGilvery, C.M. (2008) A nanoanalytical investigation of elemental distributions in high-k dielectric gate stacks on silicon. Microelectronic Engineering, 85(1), pp. 61-64. (doi: 10.1016/j.mee.2007.03.001)

Eustace, D.A., Cheah, W.L., McComb, D.W., Docherty, F.T. and Craven, A.J. (2008) Modelling paramagnetism in EELS: a study of magnetic order. Journal of Physics: Conference Series, 126(1), 012039.

Longo, P., Scott, J. , Craven, A.J., Hill, R.J.W. and Thayne, I.G. (2008) EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V MOSFET devices. Journal of Physics: Conference Series, 126(1), 012053. (doi: 10.1088/1742-6596/126/1/012053)

Holland, M., Stanley, C.R., Reid, W., Thayne, I. , Paterson, G.W. , Long, A.R., Longo, P., Scott, J. , Craven, A.J. and Gregory, R. (2007) GdGaO: a gate dielectric for GaAs metal-oxide-semiconductor field-effect transistors. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 25(3), pp. 1024-1028. (doi: 10.1116/1.2738480)

Li, Y., Wilson, J.A., Craven, A.J., Mitchell, P.S., Crowther, D.N. and Baker, T.N. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging part 1 - processing parameters, mechanical properties and microstructure. Materials Science and Technology, 23(5), 509-518(10).

Wilson, J.A., Craven, A.J., Li, Y. and Baker, T.N. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging part 2 - chemical characterisation of dispersion strengthening precipitates. Materials Science and Technology, 23(5), 519-527(9).

MacKenzie, M., Craven, A.J., McComb, D.W., De Gendt, S., Docherty, F.T. , McGilvery, C.M. and McFadzean, S. (2007) Advanced nanoanalysis of a Hf-based high-k dielectric stack prior to activation. Electrochemical and Solid State Letters, 10(6), G33-G35. (doi: 10.1149/1.2718399)

Li, Y., Wilson, J., Craven, A., Mitchell, P., Crowther, D. and Baker, T. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging - Part 1 - Processing parameters, mechanical properties and microstructure. Materials Science and Technology, 23, pp. 509-518. (doi: 10.1179/174328407X166687)

Pey, K., Tung, C., Ranjan, R., Lo, V., MacKenzie, M. and Craven, A. (2007) Nano-characterisation of dielectric breakdown in the various advanced gate stack MOSFETs. International Journal of Nanotechnology, 4, pp. 347-376.

Wilson, J., Craven, A., Li, Y. and Baker, T. (2007) Dispersion strengthening in vanadium microalloyed steels processed by simulated thin slab casting and direct charging - Part 2 - Chemical characterisation of dispersion strengthening precipitates. Materials Science and Technology, 23, pp. 519-527. (doi: 10.1179/174328407X161330)

Scott, J. , Docherty, F.T., MacKenzie, M., Smith, W., Miller, B., Collins, C.L. and Craven, A.J. (2006) Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling. Journal of Physics: Conference Series, 26(1), pp. 223-226. (doi: 10.1088/1742-6596/26/1/053)

Thomas, P., Scott, J. , MacKenzie, M., McFadzean, S., Wilbrink, J. and Craven, A. (2006) Near-simultaneous core- and low-loss EELS spectrum-imaging in the STEM using a fast beam switch. Microscopy and Microanalysis, 12(S02), pp. 1362-1363. (doi: 10.1017/S1431927606065512)

Docherty, F.T. , MacKenzie, M., Pennicard, D., Craven, A.J. and McComb, D.W. (2006) Understanding and preventing beam damage effects in partially processed high-k gate stacks. Journal of Physics: Conference Series, 26(1), pp. 231-234. (doi: 10.1088/1742-6596/26/1/055)

Eustace, D.A., Docherty, F.T. , McComb, D.W. and Craven, A.J. (2006) ELNES as a probe of magnetic order in mixed oxides. Journal of Physics: Conference Series, 26(1), pp. 165-168. (doi: 10.1088/1742-6596/26/1/039)

MacKenzie, M., Craven, A. and Collins, C. (2006) Nanoanalysis of very fine VN precipitates in steel. Scripta Materialia, 54, pp. 1-5. (doi: 10.1016/j.scriptamat.2005.09.018)

MacKenzie, M., Craven, A.J., McComb, D.W. and De Gendt, S. (2006) Interfacial reactions in a HfO2/TiN/poly-Si gate stack. Applied Physics Letters, 88, (doi: 10.1063/1.2201891)

Craven, A.J., MacKenzie, M., McComb, D.W. and Docherty, F.T. (2005) Investigating physical and chemical changes in high-k gate stacks using nanoanalytical electron microscopy. Microelectronic Engineering, 80, pp. 90-97. (doi: 10.1016/j.mee.2005.04.048)

Baker, T.,N.,, Li, Y., Wilson, J.A., Craven, A.J. and Crowther, D.N. (2004) Evolution of precipitates, in particular cruciform and cuboid particles, during simulated direct charging of thin slab cast vanadium microalloyed steels. Materials Science and Technology, 20(6), pp. 720-730. (doi: 10.1179/026708304225016743)

Li, Y., Wilson, J.A., Crowther, D.N., Mitchell, P.S., Craven, A.J. and Baker, T.N. (2004) The effects of vanadium, niobium, titanium and zirconium on the microstructure and mechanical properties of thin slab cast steels. ISIJ International, 44(6), pp. 1093-1102.

McComb, D.W., Craven, A.J., Hamilton, D.A. and MacKenzie, M. (2004) Probing local coordination environments in high-k materials for gate stack applications. Applied Physics Letters, 84(22), pp. 4523-4525. (doi: 10.1063/1.1758303)

McComb, D.W., Craven, A.J., Chioncel, L., Lichtenstein, A.I. and Docherty, F.T. (2003) Effect of short-range magnetic ordering on electron energy-loss spectra in spinels. Physical Review B, 68(22), 224420. (doi: 10.1103/PhysRevB.68.224420)

Paxton, A.T., Craven, A.J., Gregg, J.M. and McComb, D.W. (2003) Bandstructure approach to near edge structure. Journal of Microscopy, 210(1), 35 -44. (doi: 10.1046/j.1365-2818.2003.01182.x?journalCode=jmi&volume=210&issue=1)

Craven, A. (2003) Hair follicle sensitivity to growth regulation by prolactin. Experimental Dermatology, 12(2), pp. 227-228.

Craven, A. (2003) Prolactin receptor gene expression in murine skin during pregnancy, lactation and weaning. Experimental Dermatology, 12(2), pp. 228-229.

Wilson, J.A. and Craven, A.J. (2003) Improving the analysis of small precipitates in HSLA steels using a plasma cleaner and ELNES. Ultramicroscopy, 94(3-4), 197 -207. (doi: 10.1016/S0304-3991(02)00265-6)

Ostanin, S.,, Salamatov, E., Craven, A.J., McComb, D.W. and Vlachos, D. (2002) Theory of the phases and atomistic structure of yttria-doped zirconia. Physical Review B, 66(13), p. 132105. (doi: 10.1103/PhysRevB.66.132105)

Ostanin, S., Craven, A.J., McComb, D.W., Vlachos, D., Alavi, A., Paxton, A.T. and Finnis, M.W. (2002) Electron energy-loss near-edge shape as a probe to investigate the stabilization of yttria-stabilized zirconia. Physical Review B, 65(22), 224109 -9. (doi: 10.1103/PhysRevB.65.224109)

Craven, A. (2002) Regulation of prolactin receptor expression in ovine skin in relation to circulating prolactin and wool follicle growth status. Journal of Endocrinology, 172(3), pp. 605-614.

Craven, A.J., Wilson, J.A. and Nicholson, W.A.P. (2002) A fast beam switch for controlling the intensity in electron energy loss spectrometry. Ultramicroscopy, 92(3-4), 165 -180. (doi: 10.1016/S0304-3991(02)00130-4)

MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35, pp. 779-787.

MacKenzie, M., Craven, A.J., Nicholson, W.A.P. and Hatto, P. (2002) Analytical electron microscopy of interface layers between Ti(6% Al, 4% V) and a CrN cathodic arc coating. Journal of Physics D: Applied Physics, 35(8), 779 -787. (doi: 10.1088/0022-3727/35/8/309)

Scott, A.J., Brydson, R., MacKenzie, M. and Craven, A.J. (2001) Theoretical investigation of the ELNES of transition metal carbides for the extraction of structural and bonding information. Physical Review B, 63(24), p. 245105. (doi: 10.1103/PhysRevB.63.245105)

Docherty, F.T. , Craven, A.J., McComb, D.W. and Skakle, J. (2001) ELNES investigations of the oxygen K-edge in spinels. Ultramicroscopy, 86(3-4), 273 -288. (doi: 10.1016/S0304-3991(00)00119-4)

Craven, A. (2001) Prolactin signaling influences the timing mechanism of the hair follicle: Analysis of hair growth cycles in prolactin receptor knockout mice. Endocrinology, 142(6), pp. 2533-2539.

Nartowski, A.M., Parkin, I.P., MacKenzie, M. and Craven, A.J. (2001) Solid state metathesis: synthesis of metal carbides from metal oxides. Journal of Materials Chemistry, 11(12), 3116 -3119. (doi: 10.1039/b105352n)

Vlachos, D., Craven, A.J. and McComb, D.W. (2001) The influence of dopant concentration on the oxygen K-edge ELNES and XANES in yttria-stabilized zirconia. Journal of Physics: Condensed Matter, 13(48), 10799 -10809. (doi: 10.1088/0953-8984/13/48/306)

Ostanin, S., Craven, A.J., McComb, D.W., Vlachos, D., Alavi, A., Finnis, M.W. and Paxton, A.T. (2000) Effect of relaxation on the oxygen K-edge electron energy-loss near-edge structure in yttria-stabilized zirconia. Physical Review B, 62(22), 14728 -14735. (doi: 10.1103/PhysRevB.62.14728)

Paxton, A.T., van Schilfgaarde, M., MacKenzie, M. and Craven, A.J. (2000) The near-edge structure in energy-loss spectroscopy: many-electron and magnetic effects in transition metal nitrides and carbides. Journal of Physics: Condensed Matter, 12(5), 729 -750. (doi: 10.1088/0953-8984/12/5/319)

Craven, A.J., He, K., Garvie, L.A.J. and Baker, T.N. (2000) Complex heterogeneous precipitation in titanium-niobium microalloyed Al-killed HSLA steels - I. (Ti,Nb)(C,N) particles. Acta Materialia, 48(15), 3857 -3868. (doi: 10.1016/S1359-6454(00)00194-4)

Craven, A.J., He, K., Garvie, L.A.J. and Baker, T.N. (2000) Complex heterogeneous precipitation in titanium-niobium microalloyed Al-killed HSLA steels - II. Non-titanium based particles. Acta Materialia, 48(15), 3869 -3878. (doi: 10.1016/S1359-6454(00)00193-2)

Garvie, L.A.J., Rez, P., Alvarez, J.R., Buseck, P.R., Craven, A.J. and Brydson, R. (2000) Bonding in alpha-quartz (SiO2): A view of the unoccupied states. American Mineralogist, 85(5-6), 732 -738.

MacKenzie, M. and Craven, A.J. (2000) Quantifying the oxidation of AlN using electron energy loss spectroscopy. Journal of Physics D: Applied Physics, 33(14), 1647 -1655. (doi: 10.1088/0022-3727/33/14/303)

Craven, A.J., McVitie, S. and Chapman, J.N. (1993) Instrumentation, techniques, and applications of electron microscopy in the solid state physics group at Glasgow university. Microscopy Research and Technique, 24(4), pp. 316-332. (doi: 10.1002/jemt.1070240405) (PMID:8513173)

Book Sections

MacLaren, I. , Cummings, R. B., Gordon, F., Frutos-Myro, E., McFadzean, S., Brown, A. P. and Craven, A. J. (2019) Performing EELS at higher energy losses at both 80 and 200 kV. In: Advances in Imaging and Electron Physics. Elsevier. (doi:10.1016/bs.aiep.2019.02.001) (In Press)

Longo, P., Craven, A.J., Scott, J. , Holland, M. and Thayne, I.G. (2008) Elemental profiling of III-V MOSFET high-k dielectric gate stacks using EELS spectrum imaging. In: Cullis, A.G. and Midgley, P.A. (eds.) Microscopy of Semiconducting Materials 2007. Series: Springer Proceedings in Physics (120). Springer-Verlag: Berlin, Germany, pp. 317-320. ISBN 9781402086144

McGilvery, C.M., McFadzean, S., MacKenzie, M., Docherty, F.T. , Craven, A.J., McComb, D.W. and De Gendt, S. (2008) Nucleation, crystallisation and phase segregation in HfO2 and HfSiO. In: Cullis, A.G. and Midgley, P.A. (eds.) Microscopy of Semiconducting Materials: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK. Series: Springer proceedings in physics, 5 (120). Springer Netherlands, pp. 325-328. ISBN 9781402086144 (doi:10.1007/978-1-4020-8615-1_71)

Li, Y., Crowther, D.N., Wilson, J.A., Craven, A.J. and Baker, T.N. (2001) Precipitation in vanadium and vanadium-titanium microalloyed steels. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 183-186. ISBN 9780750308120

MacKenzie, M., Weatherly, G.C., McComb, D.W., Perovic, A. and Craven, A.J. (2001) Interfacial reaction products in Al-based metal-matrix composites. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 283-286. ISBN 9780750308120

Maclean, E.D.W., Craven, A.J. and McComb, D.W. (2001) Valence losses at interfaces in aluminium alloys. In: Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 259-262. ISBN 9780750308120

Wilson, J.A., Craven, A.J., Li, Y. and Baker, T.N. (2001) Nanoanalysis of dispersion strengthening particles in thin slab cast vanadium microalloyed steels. In: Aindow, M. and Kiely, C.J. (eds.) Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September 2001. Series: Institute of Physics conference series (168). Institute of Physics: Bristol, pp. 187-190. ISBN 9780750308120

Book Reviews

McGilvery, C., McComb, D.W., De Gendt, S., Payzant, E.A., MacKenzie, M. and Craven, A.J. (2011) Characterization of hafnia powder prepared from an oxychloride Sol-Gel. Journal of the American Ceramic Society, 94(3), pp. 886-894. (doi: 10.1111/j.1551-2916.2010.04153.x)[Book Review]

Conference or Workshop Item

Moran, D.A.J. et al. (2007) High Performance Enhancement Mode III-V MOSFETs. IBM Workshop on Advanced Oxides, Zurich, Switzerland, June 2007.

Conference Proceedings

Al-Afeef, A., Cockshott, W.P., Barges, P., Zuazo, I., Bobynko, J., Craven, A.J. and MacLaren, I. (2015) Linear chemically sensitive electron tomography using DualEELS and compressed sensing. In: Microscopy and Microanalysis MM2015, Portland, Oregon, 2-6 Aug 2015,

Longo, P., Jansen, W., Merckling, C., Penaud, J., Caymax, M., Thayne, I. and Craven, A. (2010) A TEM Nanoanalytical Investigation of Pd/Ge Ohmic Contacts for the Miniaturization and Optimization of n-InGaAs MOSFET Devices. In: Electron Microscopy and Analysis Group Conference, Sheffield, England, 8-11 September 2009, 012037. (doi:10.1088/1742-6596/241/1/012037)

Hill, R.J.W. et al. (2009) Deep sub-micron and self-aligned flatband III–V MOSFETs. In: Device Research Conference, 2009 (DRC 2009), University Park, PA, USA, 22-24 Jun 2009, pp. 251-252. (doi:10.1109/DRC.2009.5354900)

Kalna, K. et al. (2008) III-V MOSFETs for digital applications with silicon co-integration. In: 7th International Conference on Advanced Semiconductor Devices and Microsystems, Smolenice, Slovakia, 12-16 October 2008, pp. 39-46. ISBN 9781424423255 (doi:10.1109/ASDAM.2008.4743354)

Thayne, I.G. et al. (2007) Recent Progress in III-V MOSFETs. In: UK Condensed Matter and Material Physics Conference, Leicester, UK, April 2007,

Craven, A.J. (2004) Perspectives in nanoanalysis. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003, pp. 285-290.

Harkins, P., McComb, D.W., MacKenzie, M. and Craven, A.J. (2004) ELNES of titanate perovskites - a probe of structure and bonding. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3 -5 Sept 2003, pp. 119-122.

MacKenzie, M., Craven, A.J. and Mccomb, D.W. (2004) Understanding gate oxide materials: ELNES of Hf and Zr compounds. In: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3 - 5 September 2003, pp. 79-82.

MacKenzie, M., Craven, A.J., Mccomb, D.W., Hamilton, D.A. and McFadzean, S. (2004) Spectrum imaging of high-k dielectric stacks. In: Institute of Physics Electron Microscopy and Analysis Group Conference, Oxford, UK, 3 -5 Sep 2003, pp. 299-302.

Craven, A.J., MacKenzie, M. and Mccomb, D.W. (2003) Application of spectrum imaging to the study of high-k dielectric stacks. In: Proceedings of the Institute of Physics conference., Cambridge University, 31 March - 3 April 2003, pp. 393-396.

Docherty, F.T. , Craven, A.J. and McComb, D.W. (1999) ELNES investigations of the structure and electronic properties of chromium spinels. In: Institute of Physics; Electron Microscopy and Analysis Group, Sheffield, August 1999, 203 -206. ISBN 0750305770

MacKenzie, M. and Craven, A.J. (1999) ELNES investigation of the oxidation of AIN. In: Institute of Physics; Electron Microscopy and Analysis Group, Sheffield, August 1999, 215 -218. ISBN 0750305770

This list was generated on Thu Apr 2 23:42:22 2020 BST.