Nano and Atomic Scale Imaging 1 PHYS5041

  • Academic Session: 2017-18
  • School: School of Physics and Astronomy
  • Credits: 10
  • Level: Level 5 (SCQF level 11)
  • Typically Offered: Semester 1
  • Available to Visiting Students: Yes
  • Available to Erasmus Students: Yes

Short Description

This course covers the underlying physical principles required to understand widely applied

techniques for the characterisation of materials that depend critically upon structural features at the

nanometre and atomic length scales. The techniques covered include Scanning Electron

Microscopy (SEM), Atomic Force Microscopy (AFM), Scanning Tunnelling Microscopy (STM) and

Transmission Electron Microscopy (TEM). The physics governing these techniques is taught along

with an emphasis on practical knowledge.

Timetable

Weekly lectures and practical sessions

Requirements of Entry

None

Excluded Courses

None

Co-requisites

None

Assessment

1) Continuous assessment from the students writing up formal records of the 7 set practical exercises (70%)

2) End of course oral examination to test knowledge (30%)

Course Aims

To provide students with an opportunity to develop knowledge and understanding of

the key physical principles underpinning widely used techniques for imaging materials at the

nanometre and atomic length scales.

Intended Learning Outcomes of Course

By the end of this course students will be able to:

 

1) Describe the nature of electron interactions with bulk and thin samples and explain how the

emitted and scattered radiation is used for imaging and diffraction in both the SEM and the TEM

2) describe the function of the key components of an SEM and explain the mechanisms of contrast

formation and how they are used to perform conventional imaging

3) describe the function of the key components of a TEM and explain how they are used in the

complete column to perform conventional imaging and diffraction

4) explain the mechanisms of contrast formation for TEM images, including diffraction and phase

contrast and explain the role of aberrations and defocus in controlling the contrast transfer function

5) describe the main features of electron diffraction as applied in the TEM, and its uses in

determining the orientation, lattice parameters and symmetry of crystals

6) describe the basics of chemical spectroscopy in the TEM

7) describe the function of the key components of an AFM and an STM and explain how they are

used to perform conventional imaging of films and surfaces

8) describe the basis of the functionalised imaging modes of AFM and STM instruments to produce

images mapping magnetic, electric and mechanical properties of films and surfaces

Minimum Requirement for Award of Credits

None