Dr David Burt

  • Affiliate (School of Engineering)

email: David.Burt@glasgow.ac.uk

R207 Level 2, Eng -Micro & Nanotechnology, 76 Oakfield Avenue, Glasgow G12 8LP

Import to contacts

Publications

List by: Type | Date

Jump to: 2024 | 2023 | 2022 | 2012 | 2010 | 2009 | 2008 | 2007
Number of items: 9.

2024

Paul, J. et al. (2024) Development of Superconducting Qubit and Circuit-Components for Advanced Quantum Technologies. Seminar at the National Physical Laboratory, London, UK, 01 Feb 2024.

2023

Paul, J. et al. (2023) Scalable and CMOS-Compatible Superconducting Qubit Fabrication Process for Quantum Computing Applications. Superconducting Qubits and Algorithms Conference (SQA), Munich, Germany, 29 Aug - 01 Sep 2023.

2022

Dyer, S., Griffin, P. F., Arnold, A. S., Mirando, F., Burt, D. P., Riis, E. and McGilligan, J. P. (2022) Micro-machined deep silicon atomic vapor cells. Journal of Applied Physics, 132, 134401. (doi: 10.1063/5.0114762)

2012

Burt, D.P., Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. ORCID logoORCID: https://orcid.org/0000-0001-7820-6023, Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)

2010

The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .

Edgeworth, J.P., Burt, D.P., Dobson, P.S ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)

2009

Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298 (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)

2008

Burt, D. P., Dobson, P. S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)

2007

Burt, D.P., Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)

This list was generated on Sun Jun 15 13:23:52 2025 BST.
Number of items: 9.

Articles

Dyer, S., Griffin, P. F., Arnold, A. S., Mirando, F., Burt, D. P., Riis, E. and McGilligan, J. P. (2022) Micro-machined deep silicon atomic vapor cells. Journal of Applied Physics, 132, 134401. (doi: 10.1063/5.0114762)

Burt, D.P., Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. ORCID logoORCID: https://orcid.org/0000-0001-7820-6023, Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)

Edgeworth, J.P., Burt, D.P., Dobson, P.S ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)

Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298 (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)

Burt, D. P., Dobson, P. S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)

Conference or Workshop Item

Paul, J. et al. (2024) Development of Superconducting Qubit and Circuit-Components for Advanced Quantum Technologies. Seminar at the National Physical Laboratory, London, UK, 01 Feb 2024.

Paul, J. et al. (2023) Scalable and CMOS-Compatible Superconducting Qubit Fabrication Process for Quantum Computing Applications. Superconducting Qubits and Algorithms Conference (SQA), Munich, Germany, 29 Aug - 01 Sep 2023.

Conference Proceedings

Burt, D.P., Dobson, P.S. ORCID logoORCID: https://orcid.org/0000-0001-5137-8298, Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)

Patents

The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .

This list was generated on Sun Jun 15 13:23:52 2025 BST.