Dr Salim Berrada

  • Research Associate (Electronic and Nanoscale Engineering)

Publications

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Jump to: 2017
Number of items: 3.

2017

Berrada, S., Lee, J., Georgiev, V. and Asenov, A. (2017) Effect of the Quantum Mechanical Tunneling on the Leakage Current in Ultra-scaled Si Nanowire Transistors. 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017. (Accepted for Publication)

Liang, J., Lee, J., Berrada, S., Georgiev, V. , Asenov, A., Azemard-Crestani, A. and Todri-Sanial, A. (2017) Atomistic to Circuit Level Modeling of Defective Doped SWCNTs with Contacts for On-Chip Interconnect Application. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, (Accepted for Publication)

Lee, J. et al. (2017) The Impact of Vacancy Defects on CNT Interconnects: From Statistical Atomistic Study to Circuit Simulations. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, (Accepted for Publication)

This list was generated on Wed Nov 22 14:53:48 2017 GMT.
Number of items: 3.

Conference or Workshop Item

Berrada, S., Lee, J., Georgiev, V. and Asenov, A. (2017) Effect of the Quantum Mechanical Tunneling on the Leakage Current in Ultra-scaled Si Nanowire Transistors. 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017. (Accepted for Publication)

Conference Proceedings

Liang, J., Lee, J., Berrada, S., Georgiev, V. , Asenov, A., Azemard-Crestani, A. and Todri-Sanial, A. (2017) Atomistic to Circuit Level Modeling of Defective Doped SWCNTs with Contacts for On-Chip Interconnect Application. In: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), Singapore, 2-4 Oct 2017, (Accepted for Publication)

Lee, J. et al. (2017) The Impact of Vacancy Defects on CNT Interconnects: From Statistical Atomistic Study to Circuit Simulations. In: SISPAD 2017: International Conference on Simulation of Semiconductor Processes and Devices, Kamakura, Japan, 7-9 Sept 2017, (Accepted for Publication)

This list was generated on Wed Nov 22 14:53:48 2017 GMT.