Mr Cameron Millar

  • Mechanical Technician (School of Engineering Administration)

email: Cameron.Millar@glasgow.ac.uk

School of Engineering, Rankine Building, Glasgow G12 8LT

Publications

List by: Type | Date

Jump to: 2015 | 2008 | 2006
Number of items: 5.

2015

Adamu-Lema, F., Wang, X., Amoroso, S.M., Gerrer, L., Millar, C. and Asenov, A. (2015) Comprehensive 'Atomistic' Simulation of Statistical Variability and Reliability in 14 nm Generation FinFETs. In: 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington D.C.,USA, 09-11 Sep 2015, pp. 157-160. ISBN 9781467378598

Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Lorenz, J. and Asenov, A. (2015) Hierarchical Variability-Aware Compact Models of 20nm Bulk CMOS. In: 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington D.C.,USA, 09-11 Sep 2015, pp. 325-328. ISBN 9781467378598

2008

Harbulot, B., Berry, D., Davenhall, C., Jones, M., Millar, C., Roy, G., Sinnott, R.O., Stewart, G. and Asenov, A. (2008) A resource-oriented data management architecture for nanoCMOS electronics. In: UK e-Science All Hands Meeting, Edinburgh, UK, 8-11 Sept 2008,

Reid, D., Millar, C., Roy, G., Roy, S., Sinnott, R.O., Stewart, G. and Asenov, A. (2008) An accurate statistical analysis of random dopant induced variability in 140,000 13nm MOSFET. In: Proceedings of the IEEE Silicon Nanoelectronics Workshop, 15-16 June 2008, Honolulu, Hawaii. IEEE Computer Society: Piscataway, N.J., USA. ISBN 9781424420711 (doi:10.1109/SNW.2008.5418478)

2006

Sinnott, R.O. et al. (2006) Meeting the design challenges of nano-CMOS electronics: an introduction to an upcoming EPSRC pilot project. In: Cox, S.J. (ed.) Proceedings of the UK e-Science All Hands Meeting 2006 : Nottingham, UK, 18th-21st September. National e-Science Centre: Edinburgh. ISBN 9780955398810

This list was generated on Fri Sep 17 23:52:18 2021 BST.
Number of items: 5.

Book Sections

Reid, D., Millar, C., Roy, G., Roy, S., Sinnott, R.O., Stewart, G. and Asenov, A. (2008) An accurate statistical analysis of random dopant induced variability in 140,000 13nm MOSFET. In: Proceedings of the IEEE Silicon Nanoelectronics Workshop, 15-16 June 2008, Honolulu, Hawaii. IEEE Computer Society: Piscataway, N.J., USA. ISBN 9781424420711 (doi:10.1109/SNW.2008.5418478)

Sinnott, R.O. et al. (2006) Meeting the design challenges of nano-CMOS electronics: an introduction to an upcoming EPSRC pilot project. In: Cox, S.J. (ed.) Proceedings of the UK e-Science All Hands Meeting 2006 : Nottingham, UK, 18th-21st September. National e-Science Centre: Edinburgh. ISBN 9780955398810

Conference Proceedings

Adamu-Lema, F., Wang, X., Amoroso, S.M., Gerrer, L., Millar, C. and Asenov, A. (2015) Comprehensive 'Atomistic' Simulation of Statistical Variability and Reliability in 14 nm Generation FinFETs. In: 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington D.C.,USA, 09-11 Sep 2015, pp. 157-160. ISBN 9781467378598

Wang, X., Reid, D., Wang, L., Burenkov, A., Millar, C., Lorenz, J. and Asenov, A. (2015) Hierarchical Variability-Aware Compact Models of 20nm Bulk CMOS. In: 20th International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington D.C.,USA, 09-11 Sep 2015, pp. 325-328. ISBN 9781467378598

Harbulot, B., Berry, D., Davenhall, C., Jones, M., Millar, C., Roy, G., Sinnott, R.O., Stewart, G. and Asenov, A. (2008) A resource-oriented data management architecture for nanoCMOS electronics. In: UK e-Science All Hands Meeting, Edinburgh, UK, 8-11 Sept 2008,

This list was generated on Fri Sep 17 23:52:18 2021 BST.