Dr Meng Duan

  • Research Associate (Electronic and Nanoscale Engineering)

Publications

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Jump to: 2017
Number of items: 1.

2017

Duan, M., Zhang, J. F., Ji, Z., Zhang, W. D., Kaczer, B. and Asenov, A. (2017) Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs. IEEE Transactions on Electron Devices, 64(6), pp. 2478-2484. (doi:10.1109/TED.2017.2691008)

This list was generated on Wed Jun 21 13:26:54 2017 BST.
Jump to: Articles
Number of items: 1.

Articles

Duan, M., Zhang, J. F., Ji, Z., Zhang, W. D., Kaczer, B. and Asenov, A. (2017) Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs. IEEE Transactions on Electron Devices, 64(6), pp. 2478-2484. (doi:10.1109/TED.2017.2691008)

This list was generated on Wed Jun 21 13:26:54 2017 BST.