2012

Burt, D.P., Dobson, P.S., Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S., Weaver, J.M.R., and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37 (7). pp. 1247-1249. ISSN 0146-9592 (doi:10.1364/OL.37.001247)

Denholme, S.J., Dobson, P.S., Weaver, J.M.R., MacLaren, I., and Gregory, D.H. (2012) Growth and characterisation of titanium sulphide nanostructures by surface-assisted vapour transport methods; from trisulphide ribbons to disulphide nanosheets. International Journal of Nanotechnology, 9 (1-2). pp. 23-38. ISSN 1475-7435 (doi:10.1504/IJNT.2012.044828)

Liu, Z., Chen, X., Zhang, Y., Weaver, J., and Roberts, C.J (2012) An optical leveling technique for parallel near-field photolithography system. Applied Physics Letters, 101 (17). p. 173112. ISSN 0003-6951 (doi:10.1063/1.4764912)

Paul, D. et al. (2012) Si/SiGe nanoscale engineered thermoelectric materials for energy harvesting. In: 12th IEEE Conference on Nanotechnology, 20-23 Aug 2012, Birmingham, UK.

Paul, D. et al. (2012) Si/SiGe thermoelectric generators. ECS Transactions, 50 (9). pp. 959-963. ISSN 1938-5862

Zhang, Y., Dobson, P.S., Weaver, J.M.R., Rossi, S., Alomari, M., Kohn, E., Bychikhin, S., and Pogany, D. (2012) Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope. In: 12th IEEE Conference on Nanotechnology, 20-23 Aug 2012, Birmingham, UK.

2011

ul-Haq, E., Liu, Z., Zhang, Y., Alang Ahmad, S.A., Wong, L.S., Hobbs, J., Leggett, G., Micklefield, J., Roberts, C., and Weaver, J. (2011) The Snomipede: a parallel platform for scanning near-field photolithography. Journal of Materials Research, 26 (24). pp. 2997-3008. ISSN 0884-2914 (doi:10.1557/jmr.2011.370)

Basith, M., McVitie, S., McGrouther, D., Chapman, J.N., and Weaver, J. (2011) Direct comparison of domain wall behavior in permalloy nanowires patterned by electron beam lithography and focused ion beam milling. Journal of Applied Physics, 110 (8). 083904. ISSN 0021-8979 (doi:10.1063/1.3642966)

Zhang, Y., Dobson, P., and Weaver, J. (2011) Batch fabricated dual cantilever resistive probe for scanning thermal microscopy. Microelectronic Engineering, 88 (8). pp. 2435-2438. ISSN 0167-9317 (doi:10.1016/j.mee.2011.02.040)

2010

Denholme, S.J., Gallagher, J.B., Dobson, P.S., Weaver, J.M.R., and Gregory, D.H. (2010) New surface-directed vapour transport methods for the controlled growth of nickel sulfide nanomaterials. Israel Journal of Chemistry, 50 (4). pp. 515-523. ISSN 0021-2148 (doi:10.1002/ijch.201000061)

The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .

Edgeworth, J.P., Burt, D.P., Dobson, P.S, Weaver, J.M.R., and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21 (10). ISSN 0957-4484 (doi:10.1088/0957-4484/21/10/105605)

Zhang, Y., Docherty, K.E., and Weaver, J. (2010) Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy. Microelectronic Engineering, 87 (5-8). pp. 1229-1232. ISSN 0167-9317 (doi:10.1016/j.mee.2009.11.140)

ul Haq, E. et al. (2010) Parallel Scanning Near-Field Photolithography: The Snomipede. Nano Letters, 10 (11). pp. 4375-4380. ISSN 1530-6984 (doi:10.1021/nl1018782)

2009

Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V., and Dobson, P.S. (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113 (34). pp. 15133-15139. ISSN 1932-7447 (doi:10.1021/jp902117g)

Docherty, K., Lister, K.A., Romijn, J., and Weaver, J.M.R. (2009) High robustness of correlation-based alignment with Penrose patterns to marker damage in electron beam lithography. Microelectronic Engineering, 86 (4-6). pp. 532-534. ISSN 0167-9317 (doi:10.1016/j.mee.2008.11.037)

2008

Kong, X., McVitie, S., Chapman, J.N., Weaver, J.M.R., O'Donnell, D.O., and Johnston, A.B. (2008) Magnetization processes in single-layer and laminated CoFe films patterned into multiscale elements with write-head-like geometries. Journal of Applied Physics, 104 . 013925. ISSN 0021-8979 (doi:10.1063/1.2952068 )

Burt, D. P., Dobson, P. S., Donaldson, L., and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85 (3). pp. 625-630. ISSN 0167-9317 (doi:10.1016/j.mee.2007.11.010)

Docherty, K.E., Thoms, S., Dobson, P., and Weaver, J.M.R. (2008) Improvements to the alignment process in a commercial vector scan electron beam lithography tool. Microelectronic Engineering, 85 (5-6). pp. 761-763. ISSN 0167-9317 (doi:10.1016/j.mee.2008.01.081)

Kong, X., Krasa, D., Zhou, H. P., Williams, W., McVitie, S., Weaver, J. M. R., and Wilkinson, C. D. W. (2008) Very high resolution etching of magnetic nanostructures in organic gases. Microelectronic Engineering, 85 (5-6). pp. 988-991. ISSN 0167-9317 (doi:10.1016/j.mee.2007.12.006 )

O'Shea, K.J., McVitie, S., Chapman, J.N., and Weaver, J.M.R. (2008) Direct observation of changes to domain wall structures in magnetic nanowires of varying width. Applied Physics Letters, 93 (20). p. 202505. ISSN 0003-6951 (doi:10.1063/1.3023048 )

2007

Aubry, R, Jacquet, JC, Weaver, J, Durand, O, Dobson, P, Mills, G, di Forte-Poisson, MA, Cassette, S, and Delage, SL (2007) SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices. IEEE Transactions on Electron Devices, 54 . pp. 385-390. (doi:10.1109/TED.2006.890380)

Burt, D.P., Dobson, P.S., Weaver, J.M.R., Wilson, N.R., Unwin, P.R., and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, 28-31 Oct 2007, Atlanta, GA.

2006

Dobson, PS, Weaver, JMR, Burt, DP, Holder, MN, Wilson, NR, Unwin, PR, and Macpherson, JV (2006) Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces. Physical Chemistry Chemical Physics, 8 . pp. 3909-3914. (doi:10.1039/b605828k)

Macintyre, D.S., Young, I., Glidle, A., Cao, X., Weaver, J.M.R., and Thoms, S. (2006) High resolution e-beam lithography using a thin titanium layer to promote resist adhesion. Microelectronic Engineering, 83 (4-9). pp. 1128-1131. ISSN 0167-9317 (doi:10.1016/j.mee.2006.01.103)

2005

Burt, DP, Wilson, NR, Weaver, JMR, Dobson, PS, and Macpherson, JV (2005) Nanowire probes for high resolution combined scanning electrochemical Microscopy - Atomic force Microscopy. Nano Letters, 5 . pp. 639-643. (doi:10.1021/nl050018d)

Dobson, PS, Mills, G, and Weaver, JMR (2005) Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers. Review of Scientific Instruments, 76 . (doi:10.1063/1.1899463)

Dobson, PS, Weaver, JMR, Holder, MN, Unwin, PR, and Macpherson, JV (2005) Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes. Analytical Chemistry, 77 . pp. 424-434. (doi:10.1021/ac048930e)

Steinmann, P, and Weaver, JMR (2005) Nanometer-scale gaps between metallic electrodes fabricated using a statistical alignment technique. Applied Physics Letters, 86 . (doi:10.1063/1.1862342)

2004

Lister, K.A., Thoms, S., Macintyre, D.S., Wilkinson, C.D.W., Weaver, J.M.R., and Casey, B.G. (2004) Direct imprint of sub-10 nm features into metal using diamond and SiC stamps. Journal of Vacuum Science and Technology Part B: Microelectronics and Nanometer Structures, 22 (6). pp. 3257-3259. ISSN 1071-1023 (doi:10.1116/1.1825010)

Lister, KA, Casey, BG, Dobson, PS, Thoms, S, Macintyre, DS, Wilkinson, CDW, and Weaver, JMR (2004) Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond. Microelectronic Engineering, 73-4 . pp. 319-322. (doi:10.1016/j.mee.2004.02.060)

Steinmann, P., and Weaver, J.M.R. (2004) Fabrication of sub-5 nm gaps between metallic electrodes using conventional lithographic techniques. Journal of Vacuum Science and Technology Part B: Microelectronics and Nanometer Structures, 22 (6). pp. 3178-3181. ISSN 1071-1023 (doi:10.1116/1.1808712)

2003

Steinmann, P., Lister, K.A., and Weaver, J.M.R. (2003) Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope. Journal of Vacuum Science and Technology Part B: Microelectronics and Nanometer Structures, 21 (5). pp. 2138-2141. ISSN 1071-1023 (doi:10.1116/1.1612931)

2002

Johannessen, EA, Weaver, JMR, Bourova, L, Svoboda, P, Cobbold, PH, and Cooper, JM (2002) Micromachined nanocalorimetric sensor for ultra-low-volume cell-based assays. Analytical Chemistry, 74 . pp. 2190-2197. (doi:10.1021/ac011028b)

Johannessen, EA, Weaver, JMR, Cobbold, PH, and Cooper, JM (2002) Heat conduction nanocalorimeter for pl-scale single cell measurements. Applied Physics Letters, 80 . pp. 2029-2031. (doi:10.1063/1.1457532)

2001

Chong, B.K., Zhou, H., Mills, G., Donaldson, L., and Weaver, J.M.R. (2001) Scanning Hall probe microscopy on an atomic force microscope tip. Journal of Vacuum Science and Technology Part A: Vacuum Surfaces and Films, 19 . pp. 1769-1772.