2011

Reid, D., Millar, C. , Roy, S. , and Asenov, A. (2011) Statistical enhancement of the evaluation of combined RDD- and LER-induced V_T variability: lessons from 10⁵ sample simulations. IEEE Transactions on Electron Devices, 58 (8). 2257 -2265. ISSN 0018-9383 (doi:10.1109/TED.2011.2147317)

2010

Reid, D., Millar, C. , Roy, S. , and Asenov, A. (2010) Understanding LER-Induced MOSFET V_{T} Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples. IEEE Transactions on Electron Devices, 57 (11). pp. 2801-2807. ISSN 0018-9383 (doi:10.1109/TED.2010.2067731)

Reid, D., Millar, C. , Roy, S. , and Asenov, A. (2010) Understanding LER-Induced MOSFET VT Variability—Part II: Reconstructing the Distribution. IEEE Transactions on Electron Devices, 57 (11). pp. 2808-2813. ISSN 0018-9383 (doi:10.1109/TED.2010.2067732)

Asenov, A., Cheng, B. , Dideban, D., Kovac, U. , Moezi, N., Millar, C. , Roy, G. , Brown, A. , and Roy, S. (2010) Modeling and simulation of transistor and circuit variability and Reliability. In: Custom Integrated Circuit Conference (CICC), 19-22 September 2010, San Jose, CA, USA.

Asenov, A., Reid, D. , Millar, C. , Roy, S. , Roy, G. , Sinnott, R. , Stewart, G. , and Stewart, G. (2010) Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. Series: Lecture notes in computer science: large-scale scientific computing, 5910 . Springer-Verlag, Berlin. ISBN 0302-9743

Asenov, P., Kamsani, N.A., Reid, D. , Millar, C. , Roy, S. , and Asenov, A. (2010) Combining Process and Statistical Variability in the Evaluation of the Effectiveness of Corners in Digital Circuit Parametric Yield Analysis. In: ESSDERC 2010, 13-17 September, Sevilla .

Asenov, P., Reid, D. , Millar, C. , Roy, S. , Liu, Z., Furber, S., and Asenov, A. (2010) Generic Aspects of Digital Circuit Behaviour In the Presence of Statistical Variability. In: VARI 2010.

Cheng, B., Dideban, D., Moezi, N., Millar, C. , Roy, G. , Wang, X. , Roy, S. , and Asenov, A. (2010) Capturing intrinsic parameter fluctuations using the PSP compact model. In: Proceedings of the Conference on Design, Automation and Test in Europe (DATE 2010), 8-12 March 2010, Dresden, Germany.

Cheng, B., Moezi, N., Dideban, D., Millar, C. , Roy, S. , and Asenov, A. (2010) Impact of Statistical Parameter set Selection on Accuracy of Statistical Compact Modelling. In: MOS-AK Workshop, 8-9 April 2010, Sapienza University, Rome, Italy.

Cheng, B.J., Dideban, D., Moezi, N., Millar, C. , Roy, G. , Wang, X. , Roy, S. , and Asenov, A. (2010) Statistical-variability compact-modeling strategies for BSIM4 and PSP. IEEE Design and Test of Computers, 27 (2). pp. 26-35. ISSN 0740-7475 (doi:10.1109/MDT.2010.53)

Dideban, D., Cheng, B. , Moezi, N., Kamsani, N.A., Millar, C. , Roy, S. , and Asenov, A. (2010) Impact of input slew rate on statistical timing and power dissipation variability in nanoCMOS. In: 11th International Conference on Ultimate Integration on Silicon, 17-19 Mar 2010, Glasgow, Scotland.

Kamsani, N.A., Cheng, B. , Millar, C. , Moezi, N., Wang, X. , Roy, S. , and Asenov, A. (2010) Impact of slew rate definition on the accuracy of nanoCMOS inverter timing simulations. In: 11th International Conference on Ultimate Integration on Silicon, 17-19 Mar 2010, Glasgow, Scotland.

Moore, I., Millar, C. , Roy, S. , and Asenov, A. (2010) Brownian noise in FET based nano-pore sensing a 3D simulation study. In: 14th International Workshop on Computational Electronics, 27-29 Oct 2010, Pisa, Italy.

Moore, I., Millar, C. , Roy, S. , and Asenov, A. (2010) Integrating drift diffusion and Brownian simulations for sensory applications. In: 11th International Conference on Ultimate Integration on Silicon, 17-19 Mar 2010, Glasgow, UK.

Sinnott, R.O., Stewart, G. , Asenov, A. , Millar, C. , Reid, D., Roy, G. , Roy, S. , Davenhall, C., Harbulot, B., and Jones, M. (2010) E-infrastructure support for nanoCMOS device and circuit simulations. In: Hamza, M.H. (ed.) Proceedings of the Conference on Parallel and Distributed Computing and Networks, Innsbruck, Austria, 16-18th February 2010. ACTA Press, Anaheim, USA. ISBN 9780889868342

2009

Davenhall, C., Harbulot, B., Jones, M., Stewart, G. , Sinnott, R.O. , Asenov, A. , Millar, C. , Roy, G. , and Reid, D. (2009) Data management of nanometre­ scale CMOS device simulations. In: 5th International Digital Curation Conference, 2-4 Dec 2009, London, UK.

Sinnott, R.O., Stewart, G. , Asenov, A. , Millar, C. , Reid, D., Roy, G. , Roy, S. , Davenhall, C., Harbulot, B., and Jones, M. (2009) Multi-level simulations to support nanoCMOS electronics research. In: 2009 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference DETC2009, August 30-September 2, 2009, San Diego, California, USA. American Society of Mechanical Engineers, New York, USA. ISBN 9780791838563

Cheng, B., Roy, S. , Brown, A.R. , Millar, C. , and Asenov, A. (2009) Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs. Solid-State Electronics, 53 (7). pp. 767-772. ISSN 0038-1101 (doi:10.1016/j.sse.2009.03.008)

Reid, D., Millar, C. , Roy, S. , Roy, G. , Sinnott, R.O., Stewart, G. , Stewart, G., and Asenov, A. (2009) Enabling cutting-edge semiconductor simulation through grid technology. Royal Society of London Philosophical Transactions A: Mathematical, Physical and Engineering Sciences, 367 (1897). pp. 2573-2584. ISSN 1364-503X (doi:10.1098/rsta.2009.0031)

Reid, D., Millar, C. , Roy, G. , Roy, S. , and Asenov, A. (2009) Analysis of threshold voltage distribution due to random dopants: a 100 000-sample 3-D simulation study. IEEE Transactions on Electron Devices, 56 (10). pp. 2255-2263. ISSN 0018-9383 (doi:10.1109/TED.2009.2027973)

Reid, D., Millar, C. , Roy, G. , Roy, S. , and Asenov, A. (2009) Efficient simulation of 6σ VT distribution due to random descrete dopants. In: 10th International Conference on Ultimate Integration of Silicon, 2009. ULIS 2009. , 18-20 Mar 2009, Aachen, Germany.

Reid, D., Millar, C. , Roy, G. , Roy, S. , and Asenov, A. (2009) Statistical enhancement of combined simulations of RDD and LER variability: what can simulation of a 10⁵ sample teach us? In: Proceedings of the 2009 IEEE International Electron Devices Meeting (IEDM), Baltimore, USA, 7-9 December 2009. IEEE Computer Society, pp. 657-660. ISBN 9781424456390

Reid, D., Millar, C. , Roy, G. , Roy, S. , and Asenov, A. (2009) Understanding LER-induced statistical variability: a 35,000 sample 3D simulation study. In: European Solid State Device Research Conference, 2009. ESSDERC '09 , 14-18 Sep 2009, Athens, Greece.

2008

Sinnott, R.O. et al. (2008) Scalable, security-oriented solutions for nanoCMOS electronics. In: UK e-Science All Hands Meeting , 8-11 Sept 2008, Edinburgh, UK.

Sinnott, R.O., Millar, C. , and Asenov, A. (2008) Supercomputing at work in the nanoCMOS electronics domain. ERCIM News, 74 . pp. 22-23. ISSN 0926-4981

Asenov, A. et al. (2008) Advanced simulation of statistical variability and reliability in nano CMOS transistors. In: IEDM 2008. IEEE International Electron Devices Meeting, 2008, 15-17 Dec 2008 , San Francisco, CA.

Cheng, B., Roy, S. , Brown, A.R. , Millar, C. , and Asenov, A. (2008) Statistical variations in 32nm thin-body SOI devices and SRAM cells. In: 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. IEEE, pp. 389-392. ISBN 9781424421855

Kovac, U., Reid, D. , Millar, C. , Roy, G. , Roy, S. , and Asenov, A. (2008) Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectronics Reliability, 48 (8-9). pp. 1572-1575. ISSN 0026-2714 (doi:10.1016/j.microrel.2008.06.027)

Millar, C., Madathil, R., Beckstein, O., Sansom, M. S. P., Roy, S. , and Asenov, A. (2008) Brownian simulation of charge transport in α-Haemolysin. Journal of Computational Electronics, 7 (1). pp. 28-33. ISSN 1569-8025 (doi:10.1007/s10825-008-0230-6)

Millar, C., Reid, D. , Roy, G. , Roy, S. , and Asenov, A. (2008) Accurate statistical description of random dopant-induced threshold voltage variability. IEEE Electron Device Letters, 29 (8). pp. 946-948. ISSN 0741-3106 (doi:10.1109/LED.2008.2001030)

Reid, D., Millar, C. , Roy, G. , Roy, S. , Sinnott, R.O. , Stewart, G., and Asenov, A. (2008) Prediction of random dopant induced threshold voltage fluctuations in NanoCMOS transistors. In: Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices, 9-11 Sept 2008, Hakone, Japan. IEEE Computer Society, Piscataway, N.J., USA, pp. 21-24. ISBN 9781424417537

Reid, D., Millar, C. , Roy, S. , Roy, G. , Sinnott, R. , Stewart, G., and Asenov, A. (2008) An accurate statistical analysis of random dopant induced variability in 140,00013nm MOSFETs. IEEE, pp. 79-80. ISBN 9781424420711

Sinnott, R.O. et al. (2008) Secure, performance-oriented data management for nanoCMOS electronics. In: Fourth IEEE International Conference on E-Science: 7-12 December 2008, Indiana, USA. IEEE Computer Society, Piscataway, N.J., USA, pp. 87-94.

Sinnott, R.O. et al. (2008) Integrating security solutions to support nanoCMOS electronics research. In: Proceedings of the 2008 International Symposium on Parallel and Distributed Processing with Applications: 10-12 December 2008, Sydney, NSW, Australia. IEEE Computer Society, Los Alamitos, USA, pp. 71-79. ISBN 9780769534718

Sinnott, R.O., Doherty, T. , Martin, D. , Millar, C. , Stewart, G. , and Watt, J. (2008) Supporting security-oriented, collaborative nanoCMOS electronics research. Lecture Notes in Computer Science, 5101 . pp. 96-105. ISSN 0302-9743 (doi:10.1007/978-3-540-69384-0_15)

2007

Sinnott, R.O., Asenov, A. , Brown, A. , Millar, C. , Roy, G. , Roy, S. , and Stewart, G. (2007) Grid infrastructures for the electronics domain: requirements and early prototypes from an EPSRC pilot project. In: Cox, S.J. (ed.) Proceedings of the UK e-Science All Hands Meeting 2007, Nottingham, UK, 10th-13th September 2007. National e-Science Centre, Edinburgh. ISBN 9780955398834

Han, L., Asenov, A. , Berry, D., Millar, C. , Roy, G. , Roy, S. , Sinnott, R.O. , and Stewart, G. (2007) Towards a grid-enabled simulation framework for nano-CMOS electronics. In: 3rd IEEE International Conference on e-Science and Grid Computing, 10-13 Dec 2007, Bangalore, India.

2006

Millar, C, Roy, S , and Asenov, A (2006) Simulation of Bio-Nano-CMOS devices. In: E-MRS IUMRS ICEM 2006, Nice, France.

Millar, C, Roy, S , Beckstein, O, Sansom, MSP, and Asenov, A (2006) Continuum versus particle simulation of model nano-pores. In: 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria.

2005

Millar, C, Asenov, A , Roy, S , and Brown, AR (2005) Simulating the bio-nano-CMOS interface. In: 5th IEEE conference on Nanotechnology, Nagoya, Japan.

2004

Millar, C, Asenov, A , Brown, AR , and Roy, S (2004) Tracking the propagation of individual ions through ion channels with nano-MOSFETs. In: International workshop on Computational Electronics, IWCE-10, West Lafayette, USA.

2003

Millar, C., Asenov, A. , and Roy, S. (2003) Brownian ionic channel simulation. Journal of Computational Electronics, 2 (2-4). pp. 257-262. ISSN 1569-8025 (doi:10.1023/B:JCEL.0000011434.84806.6d)

Millar, C, Asenov, A , and Roy, S (2003) Brownian dynamics based particle mesh simulation of ionic solutions and channels. In: Proceedings Modeling and Simulation of Microsystems 2003 - MSM 03, San Francisco, USA.

2002

Millar, C., Asenov, A. , and Watling, J.R. (2002) Excessive over-relaxation method for multigrid poisson solvers. Journal of Computational Electronics, 1 (3). pp. 341-345. ISSN 1569-8025 (doi:10.1023/A:1020791306305)

Forthcoming Publications

Reid, David, Millar, Campbell , Roy, Scott , and Asenov, Asen Understanding LER-induced MOSFET VT variability - part II: reconstructing the distribution. IEEE Transactions on Electron Devices, 57 (11). ISSN 0018-9383 (doi:10.1109/TED.2010.2067732)